Works matching DE "MICROELECTRONICS conferences"
2
- 2018
- Jain, F.;
- Broadbridge, C.;
- Tang, H.;
- Gherasimova, M.
- Proceeding
7
- Advanced Materials & Processes, 1998, v. 154, n. 4, p. 237
- Article
10
- Electronic Device Failure Analysis, 2018, v. 20, n. 4, p. 40
- Article
14
- Electronic Device Failure Analysis, 2010, v. 12, n. 1, p. 19
- Article