Works matching DE "METAL-semiconductor-metal structures"
1
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 5, p. 3855, doi. 10.1007/s10854-020-02926-6
- Khrypunov, G. S.;
- Nikitin, V. O.;
- Rezinkin, O. L.;
- Drozdov, A. N.;
- Meriuts, A. V.;
- Pirohov, O. V.;
- Khrypunov, M. G.;
- Kirichenko, M. V.;
- Danyliuk, A. R.
- Article
2
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 11, p. 7905, doi. 10.1007/s10854-017-6490-9
- Çetinkaya, H.;
- Altındal, Ş.;
- Orak, I.;
- Uslu, I.
- Article
3
- Crystal Research & Technology, 2023, v. 58, n. 5, p. 1, doi. 10.1002/crat.202200177
- Cao, Xiangzhi;
- Zhang, Jijun;
- Wang, Shulei;
- Xu, Zheren;
- Wang, Linjun
- Article
4
- Semiconductors, 2021, v. 55, n. 3, p. 341, doi. 10.1134/S1063782621030118
- Kalygina, V. M.;
- Tsymbalov, A. V.;
- Almaev, A. V.;
- Petrova, Yu. S.
- Article
5
- ESTEEM, 2018, v. 14, p. 1
- Abd Rahim, Alhan Farhanah;
- Baharom, Nur Zaimah;
- Radzali, Rosfariza;
- Mahmood, Ainorkhilah;
- Zahidi, Musa Mohamed;
- Jumidali, Muzafa
- Article
6
- Applied Sciences (2076-3417), 2020, v. 10, n. 15, p. 5117, doi. 10.3390/app10155117
- Ahmadi, Mohammad Taghi;
- Mousavi, Neda;
- Nguyen, Truong Khang;
- Rahimian Koloor, Seyed Saeid;
- Petrů, Michal
- Article
7
- European Physical Journal - Applied Physics, 2016, v. 76, n. 1, p. 10101-p1, doi. 10.1051/epjap/2016160240
- Afzal, Naveed;
- Devarajan, Mutharasu
- Article
8
- European Physical Journal - Applied Physics, 2013, v. 61, n. 3, p. 00, doi. 10.1051/epjap/2013120216
- Zerdali, Mokhtar;
- Bechiri, F.;
- Rahmoun, I.;
- Adnane, M.;
- Sahraoui, T.;
- Hamzaoui, S.
- Article
9
- Materials Transactions, 2021, v. 62, n. 7, p. 915, doi. 10.2320/matertrans.MT-M2020350
- Al-Khalli, Najeeb;
- Aly Aboud, Mohamed F.;
- Bagabas, Abdulaziz A.;
- Debbar, Nacer
- Article
10
- Nanoscale Research Letters, 2013, n. 4, p. 1, doi. 10.1186/1556-276X-8-165
- Samanta, Sudeshna;
- Das, Kaustuv;
- Raychaudhuri, Arup Kumar
- Article
11
- Technical Physics, 2014, v. 59, n. 7, p. 1036, doi. 10.1134/S1063784214070287
- Vostokov, N.;
- Korolev, S.;
- Shashkin, V.
- Article
12
- Scientific Reports, 2015, p. 8130, doi. 10.1038/srep08130
- Cao, Yufei;
- Cai, Kaiming;
- Hu, Pingan;
- Zhao, Lixia;
- Yan, Tengfei;
- Luo, Wengang;
- Zhang, Xinhui;
- Wu, Xiaoguang;
- Wang, Kaiyou;
- Zheng, Houzhi
- Article
13
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep05575
- Bhanu, Udai;
- Islam, Muhammad R.;
- Tetard, Laurene;
- Khondaker, Saiful I.
- Article
14
- Nanomaterials (2079-4991), 2017, v. 7, n. 7, p. 159, doi. 10.3390/nano7070159
- Yaxin Wang;
- Chao Yan;
- Lei Chen;
- Yongjun Zhang;
- Jinghai Yang
- Article
16
- Applied Physics A: Materials Science & Processing, 2013, v. 113, n. 2, p. 491, doi. 10.1007/s00339-013-7552-3
- Sharma, Mamta;
- Tripathi, S.
- Article
17
- Sensors (14248220), 2013, v. 13, n. 8, p. 9921, doi. 10.3390/s130809921
- Moore, James C.;
- Thompson, Cody V.
- Article
18
- Advanced Functional Materials, 2018, v. 28, n. 10, p. 1, doi. 10.1002/adfm.201705079
- Lee, Jong‐hoon;
- Jeong, Song Yi;
- Kim, Geunjin;
- Park, Byoungwook;
- Kim, Junghwan;
- Kee, Seyoung;
- Kim, Bongseong;
- Lee, Kwanghee
- Article
19
- Advanced Electronic Materials, 2020, v. 6, n. 2, p. N.PAG, doi. 10.1002/aelm.201900858
- Zhao, Lei;
- Fan, Zhen;
- Cheng, Shengliang;
- Hong, Lanqing;
- Li, Yongqiang;
- Tian, Guo;
- Chen, Deyang;
- Hou, Zhipeng;
- Qin, Minghui;
- Zeng, Min;
- Lu, Xubing;
- Zhou, Guofu;
- Gao, Xingsen;
- Liu, Jun‐Ming
- Article
20
- Coatings (2079-6412), 2022, v. 12, n. 7, p. N.PAG, doi. 10.3390/coatings12070874
- Liu, Hongmei;
- Zhang, Ruolong;
- Meng, Tianhua;
- Kang, Yongqiang;
- Hu, Weidong;
- Zhao, Guozhong
- Article
21
- Plasmonics, 2016, v. 11, n. 2, p. 441, doi. 10.1007/s11468-015-0066-4
- Sharaf, Rahman;
- Daneshmandi, Omidreza;
- Ghayour, Rahim;
- Alighanbari, Abbas
- Article
22
- Plasmonics, 2013, v. 8, n. 2, p. 239, doi. 10.1007/s11468-012-9381-1
- Hu, Haifeng;
- Zeng, Xie;
- Tong, Chong;
- Anderson, Wayne;
- Gan, Qiaoqiang;
- Deng, Jie;
- Jiang, Suhua
- Article
23
- Journal of Mass Spectrometry, 2017, v. 52, n. 1, p. 43, doi. 10.1002/jms.3898
- Silina, Yuliya E.;
- Herbeck‐Engel, Petra;
- Koch, Marcus
- Article
24
- Atomic Energy Science & Technology, 2025, v. 59, n. 1, p. 176, doi. 10.7538/yzk.2024.youxian.0189
- 王利斌;
- 张逸韵;
- 李海俊;
- 马志海;
- 席善学;
- 刘辉兰;
- 宋玉收;
- 周春芝
- Article
25
- Sensors & Materials, 2016, v. 28, n. 5, p. 561
- Chih-Ming Lin;
- Yi-Cheng Hsu;
- Shang-Chao Hung;
- Yin-Ming Li
- Article
26
- Modares Journal of Electrical Engineering, 2015, v. 14, n. 4, p. 15
- MOHAMMAD-ZAMANI, MOHAMMAD JAVAD;
- MORAVVEJ-FARSHI, MOHAMMAD KAZEM;
- NESHAT, MOHAMMAD
- Article
27
- Sensors (14248220), 2020, v. 20, n. 1, p. 129, doi. 10.3390/s20010129
- Fang, Mingzhi;
- Zhao, Weiguo;
- Li, Feifei;
- Zhu, Deliang;
- Han, Shun;
- Xu, Wangying;
- Liu, Wenjun;
- Cao, Peijiang;
- Fang, Ming;
- Lu, Youming
- Article
28
- Chemistry - A European Journal, 2015, v. 21, n. 45, p. 16017, doi. 10.1002/chem.201501538
- Saravanan, Adhimoorthy;
- Huang, Bohr ‐ Ran;
- Lin, Jun ‐ Cheng;
- Keiser, Gerd;
- Lin, I ‐ Nan
- Article
29
- Chemistry - A European Journal, 2014, v. 20, n. 50, p. 16732, doi. 10.1002/chem.201404325
- Li, Xin ‐ Hao;
- Cai, Yi ‐ Yu;
- Gong, Ling ‐ Hong;
- Fu, Wei;
- Wang, Kai ‐ Xue;
- Bao, Hong ‐ Liang;
- Wei, Xiao;
- Chen, Jie ‐ Sheng
- Article
30
- Scientific Reports, 2015, p. 14304, doi. 10.1038/srep14304
- Wu, Kai;
- Zhan, Yaohui;
- Zhang, Cheng;
- Wu, Shaolong;
- Li, Xiaofeng
- Article
31
- Scientific Reports, 2015, p. 13705, doi. 10.1038/srep13705
- Lee, Ching-Ting;
- Lin, Heng-Yu;
- Tseng, Chun-Yen
- Article
32
- Scientific Reports, 2015, p. 11374, doi. 10.1038/srep11374
- Jiao, Yang;
- Hellman, Anders;
- Fang, Yurui;
- Gao, Shiwu;
- Käll, Mikael
- Article
33
- Physica Status Solidi - Rapid Research Letters, 2013, v. 7, n. 9, p. 659, doi. 10.1002/pssr.201307160
- Ko, Yeong Hwan;
- Kim, Sunkook;
- Yu, Jae Su
- Article
34
- Advances in OptoElectronics, 2012, p. 1, doi. 10.1155/2012/782864
- Schwaiger, Stephan;
- Rottler, Andreas;
- Mendach, Stefan
- Article
35
- Journal of Engineering & Sustainable Development, 2018, v. 22, n. 4, p. 124, doi. 10.31272/jeasd.2018.4.10
- Naji, Mohammed Wesam;
- Ali, Ghusoon Mohsin;
- Hashem, Muneer Aboud
- Article
36
- JETP Letters, 2015, v. 101, n. 2, p. 113, doi. 10.1134/S0021364015020137
- Viglin, N.;
- Ustinov, V.;
- Tsvelikhovskaya, V.;
- Pavlov, T.
- Article
37
- JETP Letters, 2014, v. 99, n. 3, p. 129, doi. 10.1134/S0021364014030060
- Dmitruk, N.;
- Romanyuk, V.;
- Taborskaya, M.;
- Charnovych, S.;
- Kokenyesi, S.;
- Yurkovich, N.
- Article
38
- Physica Status Solidi. A: Applications & Materials Science, 2018, v. 215, n. 7, p. 1, doi. 10.1002/pssa.201700969
- Riederer, Felix;
- Grap, Thomas;
- Fischer, Sergej;
- Mueller, Marcel R.;
- Yamaoka, Daichi;
- Sun, Bin;
- Gupta, Charu;
- Kallis, Klaus T.;
- Knoch, Joachim
- Article
39
- Physica Status Solidi. A: Applications & Materials Science, 2016, v. 213, n. 9, p. 2425, doi. 10.1002/pssa.201533063
- Theys, Bertrand;
- Klinkert, Torben;
- Mollica, Fabien;
- Leite, Enrique;
- Donsanti, Frédérique;
- Jubault, Marie;
- Lincot, Daniel
- Article
40
- Physica Status Solidi. A: Applications & Materials Science, 2016, v. 213, n. 6, p. 1602, doi. 10.1002/pssa.201533047
- Article
41
- Physica Status Solidi. A: Applications & Materials Science, 2015, v. 212, n. 12, p. 2791, doi. 10.1002/pssa.201532222
- Dai, Loucheng;
- Liu, Jun;
- Han, Chao;
- Wang, Zhichong;
- Zhang, Yan;
- Hu, Zhiyu
- Article
42
- Semiconductors, 2018, v. 52, n. 16, p. 2149, doi. 10.1134/S1063782618160406
- Zinovyev, V. A.;
- Zinovieva, A. F.;
- Katsuba, A. V.;
- Smagina, Zh. V.;
- Dvurechenskii, A. V.;
- Borodavchenko, O. M.;
- Zhivulko, V. D.;
- Mudryi, A. V.
- Article
43
- Semiconductors, 2018, v. 52, n. 5, p. 579, doi. 10.1134/S1063782618050159
- Article
44
- Semiconductors, 2017, v. 51, n. 2, p. 249, doi. 10.1134/S1063782617020099
- Kuznetzov, P.;
- Averin, S.;
- Zhitov, V.;
- Zakharov, L.;
- Kotov, V.
- Article
45
- Journal of Electronic Materials, 2018, v. 47, n. 9, p. 5212, doi. 10.1007/s11664-018-6396-1
- Azadgar, Navid;
- Naderi, Nima;
- Eshraghi, Mohamad Javad
- Article
46
- Journal of Electronic Materials, 2017, v. 46, n. 4, p. 2548, doi. 10.1007/s11664-017-5346-7
- Kasani, H.;
- Khodabakhsh, R.;
- Taghi Ahmadi, M.;
- Rezaei Ochbelagh, D.;
- Ismail, Razali
- Article
47
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 713, doi. 10.1007/s11664-016-5041-0
- Article
48
- Journal of Electronic Materials, 2014, v. 43, n. 4, p. 833, doi. 10.1007/s11664-013-2955-7
- Brendel, M.;
- Knigge, A.;
- Brunner, F.;
- Einfeldt, S.;
- Knauer, A.;
- Kueller, V.;
- Zeimer, U.;
- Weyers, M.
- Article
49
- Optical & Quantum Electronics, 2018, v. 50, n. 10, p. 1, doi. 10.1007/s11082-018-1623-9
- Averin, S. V.;
- Kuznetzov, P. I.;
- Zhitov, V. A.;
- Zakharov, L. Yu;
- Kotov, V. M.
- Article
50
- Optical & Quantum Electronics, 2017, v. 49, n. 4, p. 1, doi. 10.1007/s11082-017-0983-x
- Seifouri, Mahmood;
- Sharaf, Rahman
- Article