Works matching DE "METAL-ferroelectric-insulator-semiconductor structures"
Results: 11
Solvent-Free Biginelli Reactions Catalyzed by Hierarchical Zeolite Utilizing a Ball Mill Technique: A Green Sustainable Process.
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- Catalysts (2073-4344), 2017, v. 7, n. 3, p. 84, doi. 10.3390/catal7030084
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Dielectric Permittivity, AC Conductivity and Electric Modulus Properties of Metal/Ferroelectric/Semiconductor (MFS) Structures.
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- Gazi University Journal of Science, 2013, v. 26, n. 3, p. 501
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STRUCTURAL AND ELECTRICAL PROPERTIES OF Pb<sub>1.1</sub>(Zr<sub>0.20</sub>Ti<sub>0.80</sub>)O<sub>3</sub> FILMS ON Si WITH ZnO BUFFER LAYERS FOR FERROELECTRIC FETs APPLICATIONS.
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- Journal of Ovonic Research, 2013, v. 9, n. 3, p. 81
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MFSFET two-bit 1T1C DRAM memory design and empirical data.
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- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 477, doi. 10.1049/el.2015.2874
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Electrical Properties of SbSI/Sb<sub>2</sub>S<sub>3</sub> Single and Double Heterostructures.
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- Acta Physica Polonica: A, 2013, v. 124, n. 5, p. 830, doi. 10.12693/APhysPolA.124.830
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Two-diode behavior in metal-ferroelectric-semiconductor structures with bismuth titanate interfacial layer.
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- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2017, v. 31, n. 27, p. -1, doi. 10.1142/S0217979217501971
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Ferroelectric characteristics of MFIS structure with P(VDF-TrFE)/BaTiO nanocomposite as ferroelectric layer.
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- Applied Physics A: Materials Science & Processing, 2014, v. 117, n. 3, p. 1535, doi. 10.1007/s00339-014-8590-1
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Mesoporous MFI Zeolite with a 2D Square Structure Directed by Surfactants with an Azobenzene Tail Group.
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- Chemistry - A European Journal, 2018, v. 24, n. 34, p. 8615, doi. 10.1002/chem.201800307
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Identification of a Stable Zn<sup>II</sup>-Oxyl Species Produced in an MFI Zeolite and Its Reversible Reactivity with O<sub>2</sub> at Room Temperature.
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- Angewandte Chemie, 2017, v. 129, n. 33, p. 9847, doi. 10.1002/ange.201702570
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Multi-Domain Negative Capacitance Effects in Metal-Ferroelectric-Insulator-Semiconductor/Metal Stacks: A Phase-field Simulation Based Study.
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- Scientific Reports, 2020, v. 10, n. 1, p. 1, doi. 10.1038/s41598-020-66313-1
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Modeling of metal-ferroelectric-insulator-semiconductor structure considering the effects of interface traps.
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- European Physical Journal - Applied Physics, 2015, v. 70, n. 3, p. 30101-p1, doi. 10.1051/epjap/2015140522
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- Article