Works matching DE "MERCURY cadmium tellurides"
1
- Angewandte Chemie, 2015, v. 127, n. 38, p. 11230, doi. 10.1002/ange.201503686
- Zhang, Qingnan;
- Li, Wan ‐ Lu;
- Xu, Cong ‐ Qiao;
- Chen, Mohua;
- Zhou, Mingfei;
- Li, Jun;
- Andrada, Diego M.;
- Frenking, Gernot
- Article
2
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 7, p. 4380, doi. 10.1007/s10854-015-2939-x
- Article
3
- Measurement Techniques, 2010, v. 53, n. 6, p. 615, doi. 10.1007/s11018-010-9550-6
- Burlakov, I.;
- Demin, A.;
- Levin, G.;
- Piskunov, N.;
- Zabotnov, S.;
- Kashuba, A.
- Article
4
- Applied Nanoscience, 2022, v. 12, n. 3, p. 403, doi. 10.1007/s13204-020-01636-z
- Izhnin, I. I.;
- Voitsekhovskii, A. V.;
- Nesmelov, S. N.;
- Dzyadukh, S. M.;
- Dvoretsky, S. A.;
- Mikhailov, N. N.;
- Sidorov, G. Y.;
- Yakushev, M. V.
- Article
5
- Journal of Defense Sciences / Savunma Bilmleri Dergisi, 2012, v. 11, n. 1, p. 41
- Article
6
- Opto-Electronics Review, 2024, v. 32, n. 1, p. 1, doi. 10.24425/opelre.2024.149182
- Majkowycz, Kinga;
- Kopytko, Małgorzata;
- Murawski, Krzysztof;
- Martyniuk, Piotr
- Article
7
- Opto-Electronics Review, 2023, v. 31, p. 1, doi. 10.24425/opelre.2023.144551
- Madejczyk, Paweł;
- Gawron, Waldemar;
- Sobieski, Jan;
- Martyniuk, Piotr;
- Rutkowski, Jarosław
- Article
8
- Lasers in Engineering (Old City Publishing), 2007, v. 17, n. 1/2, p. 101
- Li Xiu-Qiani;
- Xiang-Ai Cheng;
- Zhi-Guo Dou
- Article
9
- Optical & Quantum Electronics, 2023, v. 55, n. 13, p. 1, doi. 10.1007/s11082-023-05283-w
- Ali, Nouran M.;
- El-Batawy, Yasser M.
- Article
10
- Optical & Quantum Electronics, 2023, v. 55, n. 6, p. 1, doi. 10.1007/s11082-023-04760-6
- Ali, Nouran M.;
- El-Batawy, Yasser M.
- Article
11
- Optical & Quantum Electronics, 2017, v. 49, n. 3, p. 1, doi. 10.1007/s11082-017-0926-6
- Article
12
- Optical & Quantum Electronics, 2017, v. 49, n. 3, p. 1, doi. 10.1007/s11082-017-0923-9
- Jóźwikowski, Krzysztof;
- Jóźwikowska, Alina;
- Nietopiel, Michał
- Article
13
- Optical & Quantum Electronics, 2017, v. 49, n. 3, p. 1, doi. 10.1007/s11082-017-0941-7
- Jóźwikowska, Alina;
- Jóźwikowski, Krzysztof;
- Suligowski, Mariusz;
- Moszczyński, Paweł;
- Nietopiel, Michał
- Article
14
- Optics & Spectroscopy, 2016, v. 121, n. 3, p. 431, doi. 10.1134/S0030400X16090186
- Article
15
- Optics & Spectroscopy, 2011, v. 111, n. 2, p. 162, doi. 10.1134/S0030400X11080303
- Jiang, Tian;
- Chengi, Xiang-ai;
- Li, Li;
- Jiang, Hou-man;
- Lu, Qi-sheng
- Article
16
- High Energy Chemistry, 2016, v. 50, n. 5, p. 344, doi. 10.1134/S0018143916050118
- Nurullaev, Yu.;
- Barkhalov, B.
- Article
17
- High Energy Chemistry, 2013, v. 47, n. 3, p. 127, doi. 10.1134/S0018143913030107
- Nurullaev, Yu.;
- Barkhalov, B.;
- Novruzova, S.
- Article
18
- Semiconductors, 2016, v. 50, n. 13, p. 1716, doi. 10.1134/S1063782616130030
- Golubyatnikov, V.;
- Lysenko, A.;
- Belov, A.;
- Kanevskii, V.
- Article
19
- Semiconductors, 2016, v. 50, n. 7, p. 915, doi. 10.1134/S1063782616070253
- Vasilyev, Yu.;
- Mikhailov, N.;
- Vasilyeva, G.;
- Ivánov, Yu.;
- Zakhar'in, A.;
- Andrianov, A.;
- Vorobiev, L.;
- Firsov, D.;
- Grigoriev, M.;
- Antonov, A.;
- Ikonnikov, A.;
- Gavrilenko, V.
- Article
20
- Semiconductors, 2016, v. 50, n. 2, p. 208, doi. 10.1134/S1063782616020160
- Mynbaev, K.;
- Zablotsky, S.;
- Shilyaev, A.;
- Bazhenov, N.;
- Yakushev, M.;
- Marin, D.;
- Varavin, V.;
- Dvoretsky, S.
- Article
21
- Semiconductors, 2015, v. 49, n. 12, p. 1605, doi. 10.1134/S1063782615120106
- Kozlov, D.;
- Rumyantsev, V.;
- Morozov, S.;
- Kadykov, A.;
- Varavin, V.;
- Mikhailov, N.;
- Dvorestky, S.;
- Gavrilenko, V.;
- Teppe, F.
- Article
22
- Semiconductors, 2015, v. 49, n. 9, p. 1170, doi. 10.1134/S1063782615090067
- Bazhenov, N.;
- Mynbaev, K.;
- Zegrya, G.
- Article
23
- Semiconductors, 2014, v. 48, n. 2, p. 195, doi. 10.1134/S1063782614020134
- Izhnin, I.;
- Izhnin, A.;
- Mynbaev, K.;
- Bazhenov, N.;
- Fitsych, E.;
- Yakushev, M.;
- Mikhailov, N.;
- Varavin, V.;
- Dvoretsky, S.
- Article
24
- Semiconductors, 2012, v. 46, n. 11, p. 1362, doi. 10.1134/S1063782612110139
- Morozov, S.;
- Joludev, M.;
- Antonov, A.;
- Rumyantsev, V.;
- Gavrilenko, V.;
- Aleshkin, V.;
- Dubinov, A.;
- Mikhailov, N.;
- Dvoretskiy, S.;
- Drachenko, O.;
- Winnerl, S.;
- Schneider, H.;
- Helm, M.
- Article
25
- Semiconductors, 2012, v. 46, n. 7, p. 882, doi. 10.1134/S1063782612070093
- Gassan-zade, S.;
- Strikha, M.;
- Shepelskii, G.
- Article
26
- Semiconductors, 2012, v. 46, n. 6, p. 773, doi. 10.1134/S1063782612060061
- Bazhenov, N.;
- Shilyaev, A.;
- Mynbaev, K.;
- Zegrya, G.
- Article
27
- Semiconductors, 2012, v. 46, n. 2, p. 155, doi. 10.1134/S1063782612020091
- Article
28
- Semiconductors, 2007, v. 41, n. 2, p. 130, doi. 10.1134/S1063782607020029
- Ikusov, D. G.;
- Sizov, F. F.;
- Staryi, S. V.;
- Teterkin, V. V.
- Article
29
- Semiconductors, 2007, v. 41, n. 2, p. 235, doi. 10.1134/S1063782607020236
- Vergeles, P. S.;
- Krapukhin, V. V.;
- Yakimov, E. B.
- Article
30
- Semiconductors, 2003, v. 37, n. 10, p. 1127, doi. 10.1134/1.1619507
- Mynbaev, K.D.;
- Ivanov-Omskii, V.I.
- Article
31
- Semiconductors, 2001, v. 35, n. 9, p. 1045, doi. 10.1134/1.1403569
- Sidorov, Yu. G.;
- Dvoretskiı, S. A.;
- Varavin, V. S.;
- Mikhaılov, N. N.;
- Yakushev, M. V.;
- Sabinina, I. V.
- Article
32
- Semiconductors, 2001, v. 35, n. 7, p. 800, doi. 10.1134/1.1385716
- Gumenjuk-Sichevskaja, J. V.;
- Sizov, F. F.;
- Ovsyuk, V. N.;
- Vasil’ev, V. V.;
- Esaev, D. G.
- Article
33
- Semiconductors, 2001, v. 35, n. 7, p. 777, doi. 10.1134/1.1385712
- Article
34
- Semiconductors, 2001, v. 35, n. 7, p. 784, doi. 10.1134/1.1385713
- Brudnyı, V. N.;
- Grinyaev, S. N.
- Article
35
- Semiconductors, 2001, v. 35, n. 5, p. 525, doi. 10.1134/1.1371615
- Ivankiv, I. M.;
- Yafyasov, A. M.;
- Bogevol’nov, V. B.;
- Perepelkin, A. D.
- Article
36
- Semiconductors, 2000, v. 34, n. 7, p. 763, doi. 10.1134/1.1188069
- Venger, E. F.;
- Gasan-zade, S. G.;
- Strikha, M. V.;
- Staryı, S. V.;
- Shepel’skiı, G. A.
- Article
37
- Semiconductors, 2000, v. 34, n. 7, p. 794, doi. 10.1134/1.1188075
- Ovsyuk, V. N.;
- Vasil’ev, V. V.;
- Mashukov, Yu. P.
- Article
38
- Semiconductors, 2000, v. 34, n. 7, p. 844
- Vasil’ev, V. V.;
- Esaev, D. G.;
- Kravchenko, A. F.;
- Osadchiı, V. M.;
- Suslyakov, A. O.
- Article
39
- Semiconductors, 2000, v. 34, n. 6, p. 644, doi. 10.1134/1.1188046
- Vlasenko, A. I.;
- Olikh, Ya. M.;
- Savkina, R. K.
- Article
40
- Semiconductors, 2000, v. 34, n. 1, p. 32, doi. 10.1134/1.1187956
- Virt, I. V.;
- Prozorovskiı, V. D.;
- Tsyutsyura, D. I.
- Article
41
- Semiconductors, 1999, v. 33, n. 4, p. 398, doi. 10.1134/1.1187701
- Vlasenko, A. I.;
- Olikh, Ya. M.;
- Savkina, R. K.
- Article
42
- Journal of Electronic Materials, 2023, v. 52, n. 11, p. 7046, doi. 10.1007/s11664-023-10543-2
- Vilela, Mauro F.;
- Hogan, Jack;
- Jones, Kelly;
- Venzor, Gregory M.;
- Goetz, Paul M.;
- Seas, Michael;
- Hampp, Andreas
- Article
43
- Journal of Electronic Materials, 2022, v. 51, n. 9, p. 4731, doi. 10.1007/s11664-022-09810-5
- Vilela, Mauro F.;
- Hogan, Jack;
- Fennell, Brian T.;
- Venzor, Gregory M.;
- Goetz, Paul M.;
- Baley, Diane L.;
- Paloczi, George;
- Hampp, Andreas
- Article
44
- Journal of Electronic Materials, 2022, v. 51, n. 9, p. 4689, doi. 10.1007/s11664-022-09703-7
- Lee, Hyun-Jin;
- Kim, Young Chul;
- Eom, Jun Ho;
- Jung, Hyun Chul;
- Kang, Ko-Ku;
- Ryu, Seong Min;
- Jang, Ahreum;
- Lee, Tae Hee;
- Kim, Jong Gi;
- Kim, Young Ho;
- Jung, Han
- Article
45
- Journal of Electronic Materials, 2020, v. 49, n. 11, p. 6918, doi. 10.1007/s11664-020-08237-0
- Pichon, Thibault;
- Mouzali, Salima;
- Boulade, Olivier;
- Gravrand, Olivier;
- Limousin, Olivier
- Article
46
- Journal of Electronic Materials, 2020, v. 49, n. 11, p. 6946, doi. 10.1007/s11664-020-08224-5
- Hanna, S.;
- Bauer, A.;
- Bitterlich, H.;
- Eich, D.;
- Finck, M.;
- Figgemeier, H.;
- Gross, W.;
- Mahlein, K. M.;
- Wegmann, A.
- Article
47
- Journal of Electronic Materials, 2020, v. 49, n. 11, p. 6893, doi. 10.1007/s11664-020-08195-7
- Klipstein, P. C.;
- Benny, Y.;
- Cohen, Y.;
- Fraenkel, N.;
- Gliksman, S.;
- Glozman, A.;
- Hirsh, I.;
- Langof, L.;
- Lukomsky, I.;
- Marderfeld, I.;
- Milgrom, B.;
- Nitzani, M.;
- Rakhmilevich, D.;
- Shkedy, L.;
- Snapi, N.;
- Shtrichman, I.;
- Weiss, E.;
- Yaron, N.
- Article
48
- Journal of Electronic Materials, 2020, v. 49, n. 2, p. 1462, doi. 10.1007/s11664-019-07808-0
- Sun, Ting;
- Ye, Zhenhua;
- Liao, Qingjun;
- Hu, Xiaoning
- Article
49
- Journal of Electronic Materials, 2019, v. 48, n. 10, p. 6074, doi. 10.1007/s11664-019-07177-8
- Eich, D.;
- Ames, C.;
- Breiter, R.;
- Figgemeier, H.;
- Hanna, S.;
- Lutz, H.;
- Mahlein, K. M.;
- Schallenberg, T.;
- Sieck, A.;
- Wenisch, J.
- Article
50
- Journal of Electronic Materials, 2019, v. 48, n. 1, p. 571, doi. 10.1007/s11664-018-6737-0
- Vaghayenegar, M.;
- Doyle, K. J.;
- Trivedi, S.;
- Wijewarnasuriya, P.;
- Smith, David J.
- Article