Modeling of Characteristic Parameter for Submicron MOSFET.
- Published in:
- IUP Journal of Electrical & Electronics Engineering, 2012, v. 5, n. 3, p. 67
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- Publication type:
- Article
Works matching DE "MEASUREMENT of surfact potential"
Results: 9
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Cation-Selective Channel Regulated by Anions According to Their Hofmeister Ranking.
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- Angewandte Chemie International Edition, 2017, v. 56, n. 13, p. 3506, doi. 10.1002/anie.201611335
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- Publication type:
- Article
3
Photoelectric electron emission from a charged spherical particle: modified DuBridge theory.
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- Canadian Journal of Physics, 2014, v. 92, n. 3, p. 236, doi. 10.1139/cjp-2012-0526
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- Publication type:
- Article
4
Surface potential measurement on organic ultrathin film by Kelvin probe force microscopy using a piezoelectric cantilever.
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- Applied Physics A: Materials Science & Processing, 2001, v. 72, p. S97, doi. 10.1007/s003390100641
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- Publication type:
- Article
5
Surface charge distribution patterns of a truncated cone-type spacer for high-voltage direct current gas-insulated metal-enclosed transmission line/gas-insulated metal-enclosed switchgear.
- Published in:
- IET Science, Measurement & Technology (Wiley-Blackwell), 2018, v. 12, n. 4, p. 436, doi. 10.1049/iet-smt.2017.0325
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- Publication type:
- Article
6
Calculation of electric potentials generated by a dipole source in a circular conducting cylinder of a finite length.
- Published in:
- Journal of Communications Technology & Electronics, 2015, v. 60, n. 2, p. 166, doi. 10.1134/S1064226915020072
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- Publication type:
- Article
7
Combination of Universal Mechanical Testing Machine with Atomic Force Microscope for Materials Research.
- Published in:
- Scientific Reports, 2015, p. 12998, doi. 10.1038/srep12998
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- Publication type:
- Article
8
On the Volta potential measured by SKPFM - fundamental and practical aspects with relevance to corrosion science.
- Published in:
- Corrosion Engineering, Science & Technology, 2019, v. 54, n. 3, p. 185, doi. 10.1080/1478422X.2019.1583436
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- Publication type:
- Article
9
Multifrequency Atomic Force Microscopy: Compositional Imaging with Electrostatic Force Measurements.
- Published in:
- Microscopy & Microanalysis, 2011, v. 17, n. 4, p. 587, doi. 10.1017/S1431927611000122
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- Publication type:
- Article