Works matching DE "MASKS (Electronics)"
1
- Solid State Technology, 2001, v. 44, n. 8, p. 55
- Article
2
- Solid State Technology, 1998, v. 41, n. 3, p. 61
- Article
3
- Applied Physics A: Materials Science & Processing, 2006, v. 83, n. 3, p. 361, doi. 10.1007/s00339-006-3566-4
- Lee, W.;
- Moyen, E.;
- Wulfhekel, W.;
- Leycuras, A.;
- Nielsch, K.;
- Gösele, U.;
- Hanbücken, M.
- Article
4
- Applied Physics A: Materials Science & Processing, 2004, v. 78, n. 4, p. 537, doi. 10.1007/s00339-003-2375-2
- Landström, L.;
- Klimstein, J.;
- Schrems, G.;
- Piglmayer, K.;
- Bäuerle, D.
- Article
5
- International Journal of Electrical Engineering Education, 2006, v. 43, n. 2, p. 93
- Márquez-Segura, E.;
- Otero, P.;
- Camacho-Peñalosa, C.;
- Zürcher, J.-F.
- Article
6
- Electronics & Electrical Engineering, 2011, n. 116, p. 45
- Bahadorimehr, A.;
- Majlis, B. Y.
- Article
7
- Journal of Engineering Physics & Thermophysics, 2003, v. 76, n. 5, p. 1080, doi. 10.1023/B:JOEP.0000003223.10856.31
- Pilipenko, V. A.;
- Ponomar, V. N.;
- Gorushko, V. A.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 6, p. 468, doi. 10.1049/el.2015.3856
- Lee, J.;
- Jeon, J. H.;
- Kim, Y.-G.;
- Lee, S. Q.;
- Yang, W. S.;
- Lee, J. S.;
- Lee, S.-G.
- Article
9
- Advanced Optical Technologies, 2017, v. 6, n. 3/4, p. 293, doi. 10.1515/aot-2017-0024
- Hsu, Stephen D.;
- Jingjing Liu
- Article
10
- Advanced Optical Technologies, 2017, v. 6, n. 3/4, p. 221, doi. 10.1515/aot-2017-0023
- Article
11
- Advanced Optical Technologies, 2017, v. 6, n. 3/4, p. 203, doi. 10.1515/aot-2017-0017
- Article
12
- Advanced Optical Technologies, 2017, v. 6, n. 3/4, p. 187, doi. 10.1515/aot-2017-0019
- Erdmann, Andreas;
- Dongbo Xu;
- Evanschitzky, Peter;
- Philipsen, Vicky;
- Vu Luong;
- Hendrickx, Eric
- Article
13
- International Journal of Plasma Science & Engineering, 2008, p. 1, doi. 10.1155/2008/154035
- Hong-Ji Lee;
- Che-Lun Hung;
- Chia-Hao Leng;
- Nan-Tzu Lian;
- Ling-Wu Young;
- Tahone Yang;
- Kuang-Chao Chen;
- Chih-Yuan Lu
- Article
14
- Journal of the Royal Astronomical Society of Canada, 2012, v. 106, n. 2, p. 86
- Article
15
- Nanoscale Research Letters, 2017, v. 12, n. 1, p. 1, doi. 10.1186/s11671-016-1780-3
- Huang, Yuan-qing;
- Huang, Rong;
- Liu, Qing-lu;
- Zheng, Chang-cheng;
- Ning, Ji-qiang;
- Peng, Yong;
- Zhang, Zi-yang
- Article
16
- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2007, v. 10, n. 1, p. 40, doi. 10.15407/spqeo10.01.040
- Min'ko, V. I.;
- Shepeliavyi, P. E.;
- Indutnyy, I. Z.;
- Litvin, O. S.
- Article
17
- Journal of Materials Science, 2009, v. 44, n. 17, p. 4625, doi. 10.1007/s10853-009-3706-2
- Hauptman, Nina;
- Žveglič, Maša;
- Maček, Marijan;
- Gunde, Marta Klanjšek
- Article
18
- Optical Engineering, 2011, v. 50, n. 3, p. 038001, doi. 10.1117/1.3549254
- Philipp Mu¨ller;
- Yves Jourlin;
- Colette Veillas;
- Ge´rard Bernaud;
- Yannick Bourgin;
- Svetlen Tonchev;
- Olivier Dellea
- Article
19
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep03629
- Appeltant, Lennert;
- Van der Sande, Guy;
- Danckaert, Jan;
- Fischer, Ingo
- Article
20
- International Journal of Advanced Manufacturing Technology, 2007, v. 33, n. 11/12, p. 1149, doi. 10.1007/s00170-006-0564-9
- Article
21
- International Journal of Advanced Manufacturing Technology, 2006, v. 29, n. 5/6, p. 518, doi. 10.1007/s00170-005-2549-5
- Ruey Fang Shyu;
- Hsiharng Yang
- Article
22
- Nanoscale Research Letters, 2008, v. 3, n. 10, p. 351, doi. 10.1007/s11671-008-9164-y
- Wei Wu;
- Dey, Dibyendu;
- Memis, Omer G.;
- Katsnelson, Alex;
- Mohseni, Hooman
- Article