Works about MAGNETRONS
1
- Journal of Microwave Power & Electromagnetic Energy, 2003, v. 38, n. 4, p. 237, doi. 10.1080/08327823.2003.11688502
- Roussy, Georges;
- Kongmark, Nils
- Article
2
- Journal of Microwave Power & Electromagnetic Energy, 2003, v. 38, n. 3, p. 197, doi. 10.1080/08327823.2003.11688499
- Roussy, Georges;
- Dichtel, Bernard;
- Chaabane, Haykel
- Article
3
- International Journal of Nanoscience, 2023, v. 22, n. 1, p. 1, doi. 10.1142/S0219581X22500545
- Article
4
- International Journal of Nanoscience, 2006, v. 5, n. 6, p. 763, doi. 10.1142/S0219581X06005121
- NI, G.;
- WANG, F.;
- PENG, K.;
- ZHANG, F. M.;
- DU, Y. W.;
- HUANG, W.
- Article
5
- Particle & Particle Systems Characterization, 2024, v. 41, n. 9, p. 1, doi. 10.1002/ppsc.202400038
- Drewes, Jonas;
- Ziegler, Florian;
- Morisch, Michael;
- Lemke, Jonathan;
- Rehders, Stefan;
- Ellermann, Frowin;
- Strunskus, Thomas;
- Faupel, Franz;
- Vahl, Alexander
- Article
6
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 4, p. 349, doi. 10.1007/s10854-009-9919-y
- Cui Chuanwen;
- Shi Feng;
- Li Yuguo;
- Wang Shuyun
- Article
7
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 4, p. 295, doi. 10.1007/s10854-008-9723-0
- Chandra, S. V. Jagadeesh;
- Chandrasekhar, M.;
- Rao, G. Mohan;
- Uthanna, S.
- Article
8
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 4, p. 319, doi. 10.1007/s10854-008-9727-9
- Jun Wang;
- Junhuai Xiang;
- Shuwang Duo;
- Wenkui Li;
- Mingsheng Li;
- Lingyun Bai
- Article
9
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 3, p. 253, doi. 10.1007/s10854-008-9712-3
- Bai, Shr-Nan;
- Tseng, Tseung-Yuen
- Article
10
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 2, p. 117, doi. 10.1007/s10854-008-9644-y
- Stamate, Marius;
- Lazar, Gabriel;
- Lazar, Iulia
- Article
11
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 11, p. 1135, doi. 10.1007/s10854-007-9489-9
- Hua Wang;
- Jiwen Xu;
- Mingfang Ren;
- Ling Yang
- Article
12
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 382, doi. 10.1007/s10854-008-9695-0
- Mukhamedshina, D. M.;
- Mit’, K. A.;
- Beisenkhanov, N. B.;
- Dmitriyeva, E. A.;
- Valitova, I. V.
- Article
13
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 744, doi. 10.1007/s10854-007-9401-7
- Ahn, C. H.;
- Kim, Y. Y.;
- Kang, S. W.;
- Kong, B. H.;
- Mohanta, S. K.;
- Cho, H. K.;
- Kim, J. H.;
- Lee, H. S.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 6, p. 528, doi. 10.1007/s10854-007-9375-5
- Yeon-Keon Moon;
- Borae Bang;
- Se-Hyun Kim;
- Chang-Oh Jeong;
- Jong-Wan Park
- Article
15
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 167, doi. 10.1007/s10854-007-9329-y
- Takakura, K.;
- Kudou, T.;
- Hayama, K.;
- Shigaki, K.;
- Ohyama, H.;
- Kayamoto, K.;
- Shibuya, M.
- Article
16
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 103, doi. 10.1007/s10854-007-9310-9
- Natarajan, Gomathi;
- Rajendra Kumar, R. T.;
- Daniels, S.;
- Cameron, D. C.;
- McNally, P. J.
- Article
17
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 1, p. 85, doi. 10.1007/s10854-007-9353-y
- Ki-Deuk Min;
- Jongwon Lee;
- Taek Lee;
- Jong Chun;
- Hong-Kee Lee;
- Dae Kim;
- Yong Choi;
- Bong Cho
- Article
18
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 71, doi. 10.1007/s10854-007-9167-y
- Adachi, Daisuke;
- Kitaike, Ryohei;
- Ota, Jun;
- Toyama, Toshihiko;
- Okamoto, Hiroaki
- Article
19
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 10, p. 1021, doi. 10.1007/s10854-007-9273-x
- Zhu Xingwen;
- Li Yingwei;
- Li Yongqiang;
- Ma Ji;
- Xia Yiben
- Article
20
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 10, p. 1003, doi. 10.1007/s10854-007-9120-0
- Reddy, K. Venkata Subba;
- Reddy, A. Sivasankar;
- Reddy, P. Sreedhara;
- Uthanna, S.
- Article
21
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 6, p. 611, doi. 10.1007/s10854-006-9115-2
- Santana-Aranda, M.;
- Armenta-Estrada, A.;
- Mendoza-Barrera, C.;
- Michel, C.;
- Chávez-Chávez, A.;
- Jiménez-Sandoval, S.;
- Meléndez-Lira, M.
- Article
22
- Journal of Materials Science Letters, 2003, v. 22, n. 16, p. 1155, doi. 10.1023/A:1025131212403
- Kim, K. S.;
- Kim, H. W.;
- Kim, N. H.
- Article
23
- Journal of Materials Science Letters, 2003, v. 22, n. 7, p. 531, doi. 10.1023/A:1022942504615
- Article
24
- Journal of Materials Science Letters, 2003, v. 22, n. 6, p. 479, doi. 10.1023/A:1022940518224
- Ding, Shinn-Jyh;
- Lee, Tien-Ling;
- Chu, Yu-Hua
- Article
25
- Microscopy & Microanalysis, 2010, v. 16, n. 6, p. 662, doi. 10.1017/S143192761009392X
- Simões, S.;
- Viana, F.;
- Ramos, A. S.;
- Vieira, M. T.;
- Vieira, M. F.
- Article
26
- Microscopy & Microanalysis, 2008, v. 14, n. 0, p. 1, doi. 10.1017/S1431927608089204
- Article
27
- Applied Microbiology & Biotechnology, 2011, v. 91, n. 4, p. 1149, doi. 10.1007/s00253-011-3195-5
- Ivanova, Elena P.;
- Hasan, Jafar;
- Truong, Vi Khanh;
- Wang, James Y.;
- Raveggi, Massimo;
- Fluke, Christopher;
- Crawford, Russell J.
- Article
28
- Measurement Techniques, 2020, v. 62, n. 11, p. 1003, doi. 10.1007/s11018-020-01725-z
- Karachevtsev, F. N.;
- Dvoretskov, R. M.;
- Mikheeva, E. A.
- Article
29
- Measurement Techniques, 2013, v. 56, n. 4, p. 451, doi. 10.1007/s11018-013-0227-9
- Article
30
- Measurement Techniques, 2011, v. 54, n. 3, p. 221, doi. 10.1007/s11018-011-9710-3
- Article
31
- Fluid Dynamics, 2023, v. 58, n. 8, p. 1662, doi. 10.1134/S0015462823602863
- Article
32
- Metallophysics & Advanced Technologies / Metallofizika i Novejsie Tehnologii, 2022, v. 44, n. 2, p. 241, doi. 10.15407/mfint.44.02.0241
- Shkurat, O. I.;
- Baturin, V. A.;
- Kravchenko, S. M.;
- Kolomiets, V. M.;
- Kononenko, I. M.;
- Chyzhov, І. G.;
- Samoilov, P. E.;
- Pavlenko, Yu. A.;
- Firstov, S. O.;
- Gorban, V. F.;
- Danylenko, M. I.
- Article
33
- Metallophysics & Advanced Technologies / Metallofizika i Novejsie Tehnologii, 2021, v. 43, n. 4, p. 505, doi. 10.15407/mfint.43.04.0505
- Шаміс, М. Н.;
- Макушко, П. В.;
- Бєсєдін, І. Д.;
- Бeрезняк, Я. О.;
- Грайворонська, К. О.;
- Вербицька, Т. І.;
- Макогон, Ю. М.
- Article
34
- Metallophysics & Advanced Technologies / Metallofizika i Novejsie Tehnologii, 2020, v. 42, n. 6, p. 815, doi. 10.15407/mfint.42.06.0815
- Goncharov, A. A.;
- Zykov, A. V.;
- Yunda, A. N.;
- Shelest, I. V.;
- Buranich, V. V.
- Article
35
- Metallophysics & Advanced Technologies / Metallofizika i Novejsie Tehnologii, 2017, v. 39, n. 5, p. 665, doi. 10.15407/mfint.39.05.0665
- Chermime, Brahim;
- Abboudi, Abdelaziz;
- Djebaili, Hamid;
- Brioua, Mourad
- Article
36
- Ferroelectrics, 2009, v. 387, n. 1, p. 154, doi. 10.1080/00150190902966693
- JIANG, S. W.;
- LI, Y. R.;
- LI, R. G.;
- TAN, L. F.;
- XIONG, N. D.
- Article
37
- Ferroelectrics, 2009, v. 381, n. 1, p. 59, doi. 10.1080/00150190902865085
- KAI-HUANG CHEN;
- CHENG-FU YANG
- Article
38
- Ferroelectrics, 2008, v. 362, n. 1, p. 21, doi. 10.1080/00150190801997427
- Ferri, A.;
- Da Costa, A.;
- Saitzek, S.;
- Desfeux, R.;
- Detalle, M.;
- Wang, G. S.;
- Remiens, D.
- Article
39
- Ferroelectrics, 2007, v. 353, n. 1, p. 233, doi. 10.1080/00150190701368190
- Combette, Philippe;
- Nougaret, Laurianne;
- Sorli, Brice;
- Pascal-Delannoy, Frédérique
- Article
40
- Ferroelectrics, 2007, v. 349, n. 1, p. 171, doi. 10.1080/00150190701260991
- Sidorkin, A. S.;
- Nesterenko, L. P.;
- Smirnov, A. L.;
- Smirnov, G. L.;
- Ryabtsev, S. V.
- Article
41
- Ferroelectrics, 2006, v. 333, n. 1, p. 203, doi. 10.1080/00150190600701269
- Kim, H. H.;
- Jeon, J. H.;
- Kim, K. T.;
- Yoon, S. H.;
- Park, D. H.;
- Lim, K. J.
- Article
42
- Ferroelectrics, 2005, v. 329, n. 1, p. 57, doi. 10.1080/00150190500315343
- Gupta, Vinay;
- Tomar, Monika;
- Sreenivas, K.
- Article
43
- Ferroelectrics, 2005, v. 329, n. 1, p. 139, doi. 10.1080/00150190500315970
- Kumar, A. K. Nanda;
- Kaviraj, S.;
- Jayakumar, S.;
- Ramanathaswamy, P.
- Article
44
- Ferroelectrics, 2005, v. 328, n. 1, p. 69, doi. 10.1080/00150190500311177
- Wasa, K.;
- Kanno, I.;
- Seo, S.;
- Noh, D.;
- Matsunaga, T.;
- Okino, H.;
- Yamamoto, T.
- Article
45
- Ferroelectrics, 2005, v. 328, n. 1, p. 111, doi. 10.1080/00150190500311409
- Park, S.;
- Ryu, M.;
- Heo, J.;
- Cho, D.;
- Kim, S.;
- Yang, Y.;
- Kim, J.;
- Jang, M.
- Article
46
- Ferroelectrics, 2005, v. 327, n. 1, p. 85, doi. 10.1080/00150190500316374
- Article
47
- Ferroelectrics, 2003, v. 293, n. 1, p. 201, doi. 10.1080/00150190390238405
- Mazon, T.;
- Joanni, E.;
- Fernandes, J. R. A.;
- Zaghete, M. A.;
- Cilense, M.;
- Varela, J. A.
- Article
48
- Ferroelectrics, 2003, v. 292, n. 1, p. 103, doi. 10.1080/00150190390222880
- Nosek, J.;
- Burianová, L.;
- Sulc, M.;
- Soyer, C.;
- Cattan, E.;
- Remiens, D.
- Article
49
- Ferroelectrics, 2003, v. 288, n. 1, p. 79, doi. 10.1080/00150190390211981
- Bravina, Svetlana L.;
- Cattan, Eric;
- Fribouro-Blanc, Eric;
- Morozovsky, Nicholas V.;
- Remiens, Denis
- Article
50
- Ferroelectrics, 2002, v. 271, n. 1, p. 199, doi. 10.1080/00150190211486
- Kobune, Masafumi;
- Matsuura, Osamu;
- Matsuzaki, Tomoaki;
- Sawada, Tatsuya;
- Fujisawa, Hironori;
- Shimizu, Masaru;
- Niu, Hirohiko
- Article