Works matching DE "MAGNETIC properties of thin films"
1
- Surface Engineering, 2017, v. 33, n. 11, p. 835, doi. 10.1080/02670844.2017.1303981
- Samiyammal, P.;
- Parasuraman, K.;
- Prabha, D.;
- Usharani, K.;
- Balu, A. R.
- Article
2
- Surface Engineering, 2012, v. 28, n. 7, p. 540, doi. 10.1179/1743294412Y.0000000014
- Hu, B;
- Man, B Y;
- Liu, M;
- Chen, C S;
- Gao, X G;
- Xu, S C;
- Wang, C C
- Article
3
- Surface Engineering, 2012, v. 28, n. 1, p. 30, doi. 10.1179/1743294411Y.0000000055
- Yu, Y D;
- Wei, G Y;
- Guo, H F;
- Lou, J W;
- Ge, H L
- Article
4
- Advanced Functional Materials, 2014, v. 24, n. 47, p. 7478, doi. 10.1002/adfm.201401464
- Choi, Eun‐Mi;
- Fix, Thomas;
- Kursumovic, Ahmed;
- Kinane, Christy J.;
- Arena, Darío;
- Sahonta, Suman‐Lata;
- Bi, Zhenxing;
- Xiong, Jie;
- Yan, Li;
- Lee, Jun‐Sik;
- Wang, Haiyan;
- Langridge, Sean;
- Kim, Young‐Min;
- Borisevich, Albina Y.;
- MacLaren, Ian;
- Ramasse, Quentin M.;
- Blamire, Mark G.;
- Jia, Quanxi;
- MacManus‐Driscoll, Judith L.
- Article
5
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 2764, doi. 10.1007/s10854-017-8204-8
- Gupta, Arti;
- Dutta, Shankar;
- Tandon, R. P.
- Article
6
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 19, p. 14848, doi. 10.1007/s10854-017-7356-x
- Anbarasi, M.;
- Nagarethinam, V.;
- Usharani, K.;
- Balamurugan, S.;
- Prabha, D.;
- Suganya, M.;
- Srivind, J.;
- Balu, A.
- Article
7
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 15, p. 11464, doi. 10.1007/s10854-017-6942-2
- Saroja, A.;
- Punithavathy, I.;
- Jeyakumar, S.;
- Balu, A.;
- Gnanamuthu, S.
- Article
8
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 14, p. 10433, doi. 10.1007/s10854-017-6815-8
- Abubacker, M.;
- Selvan, G.;
- Balu, A.
- Article
9
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 6, p. 4570, doi. 10.1007/s10854-016-6093-x
- Zhong, Xiaoxi;
- Li, Lezhong;
- Wang, Rui;
- Tu, Xiaoqiang
- Article
10
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 4, p. 3616, doi. 10.1007/s10854-016-5963-6
- Liu, T.;
- Ma, L.;
- Zhao, S.;
- Ma, D.;
- Li, L.;
- Cheng, G.;
- Rao, G.
- Article
11
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 3, p. 2893, doi. 10.1007/s10854-016-5874-6
- Hone, Fekadu;
- Ampong, Francis;
- Nkum, Robert;
- Boakye, Francis
- Article
12
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 3, p. 2833, doi. 10.1007/s10854-016-5866-6
- Yudar, H.;
- Pat, Suat;
- Korkmaz, Şadan;
- Özen, Soner;
- Şenay, Volkan
- Article
13
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 3, p. 2852, doi. 10.1007/s10854-016-5869-3
- Article
14
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 3, p. 2949, doi. 10.1007/s10854-016-5879-1
- Liu, Huilian;
- Li, Weijun;
- Yang, Jinghai;
- Gao, Ming;
- Liu, Xiaoyan;
- Wei, Maobin
- Article
15
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 3, p. 2574, doi. 10.1007/s10854-015-4060-6
- Kavitha, N.;
- Chandramohan, R.;
- Valanarasu, S.;
- Vijayan, T.;
- Rosario, S.;
- Kathalingam, A.
- Article
16
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 10, p. 7381, doi. 10.1007/s10854-015-3368-6
- Mehrizi, S.;
- Heydarzadeh Sohi, M.
- Article
17
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 8, p. 5767, doi. 10.1007/s10854-015-3135-8
- Dou, S.;
- Yan, L.;
- Wang, H.;
- Liu, J.
- Article
18
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 8, p. 6232, doi. 10.1007/s10854-015-3208-8
- Yan, Xia;
- Tan, Guoqiang;
- Liu, Wenlong;
- Ye, Wei;
- Xia, Ao;
- Ren, Huijun
- Article
19
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 7, p. 5202, doi. 10.1007/s10854-015-3052-x
- Adam, Adam;
- Cheng, Xiaomin;
- Miao, Xiangshui
- Article
20
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 5, p. 2931, doi. 10.1007/s10854-015-2779-8
- Xu, Jing;
- Dai, Bo;
- Ren, Yong;
- Wang, Yubo;
- Huang, Xiaohu
- Article
21
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 2, p. 955, doi. 10.1007/s10854-014-2488-8
- Sankarasubramanian, K.;
- Sampath, M.;
- Archana, J.;
- Sethuraman, K.;
- Ramamurthi, K.;
- Hayakawa, Y.
- Article
22
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 2, p. 1212, doi. 10.1007/s10854-014-2527-5
- Zhu, Xiaoqin;
- Hu, Yifeng;
- Zou, Hua;
- Sui, Yongxing;
- Xue, Jianzhong;
- Shen, Dahua;
- Zhang, Jianhao;
- Song, Sannian;
- Song, Zhitang;
- Sun, Shunping
- Article
23
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 10, p. 4553, doi. 10.1007/s10854-014-2203-9
- Kumar, Pawan;
- No-Lee, Heung;
- Kumar, Rajesh
- Article
24
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 9, p. 3846, doi. 10.1007/s10854-014-2098-5
- Valanarasu, S.;
- Dhanasekaran, V.;
- Karunakaran, M.;
- Vijayan, T.;
- Chandramohan, R.;
- Mahalingam, T.
- Article
25
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 7, p. 3137, doi. 10.1007/s10854-014-1994-z
- Wu, Gang;
- Deng, Hongmei;
- Wang, Weijun;
- Zhang, Kezhi;
- Cao, Huiyi;
- Yang, Pingxiong;
- Chu, Junhao
- Article
26
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 4, p. 1908, doi. 10.1007/s10854-014-1819-0
- Wang, W.;
- Zhu, Q.;
- Yang, M.;
- Zheng, R.;
- Li, X.
- Article
27
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 4, p. 1792, doi. 10.1007/s10854-014-1800-y
- Xu, Jiwen;
- Yang, Zupei;
- Zhang, Xiaowen;
- Wang, Hua;
- Xu, Huarui
- Article
28
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1881, doi. 10.1007/s10854-012-0678-9
- Deo, Nirmalendu;
- Bain, Michael;
- Montgomery, John;
- Gamble, Harold
- Article
29
- 2012
- Mehrizi, S.;
- Heydarzadeh Sohi, M.;
- Shafahian, E.;
- Khangholi, A.
- Correction Notice
30
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 6, p. 1215, doi. 10.1007/s10854-011-0575-7
- Deng, Huan;
- Deng, Hongmei;
- Yang, Pingxiong;
- Chu, Junhao
- Article
31
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 6, p. 1174, doi. 10.1007/s10854-011-0568-6
- Mehrizi, S.;
- Heydarzadeh Sohi, M.;
- Shafahian, E.;
- Khangholi, A.
- Article
32
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 928, doi. 10.1007/s10854-011-0522-7
- Yildirim, G.;
- Varilci, A.;
- Akdogan, M.;
- Terzioglu, C.
- Article
33
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 2, p. 542, doi. 10.1007/s10854-011-0433-7
- Liu, Yuanda;
- Xia, Xiaochuan;
- Liang, Hongwei;
- Zhang, Hezhi;
- Bian, Jiming;
- Liu, Yang;
- Shen, Rensheng;
- Luo, Yingmin;
- Du, Guotong
- Article
34
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 2, p. 493, doi. 10.1007/s10854-011-0424-8
- Lin, Y.;
- Lin, Z.;
- Shen, C.;
- Wang, L.;
- Ha, C.;
- Peng, Chris
- Article
35
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 1, p. 234, doi. 10.1007/s10854-011-0392-z
- Wang, Hua;
- Huang, Xiaodan;
- Xu, Jiwen;
- Yang, Ling;
- Zhou, Shangju
- Article
36
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 898, doi. 10.1007/s10854-008-9658-5
- Chin Shuang Lee;
- Chia Chan Chen;
- Chin Shun Hsu;
- Shyong Lee;
- Ron-Kai Hsu
- Article
37
- Nature, 1997, v. 387, n. 6630, p. 266, doi. 10.1038/387266a0
- Article
38
- Instrumentation Science & Technology, 2016, v. 44, n. 6, p. 629, doi. 10.1080/10739149.2016.1176035
- Brătfălean, Radu T.;
- Marconi, Daniel;
- Colniță, Alia
- Article
39
- Integrated Ferroelectrics, 2018, v. 190, n. 1, p. 112, doi. 10.1080/10584587.2018.1457344
- Article
40
- Integrated Ferroelectrics, 2015, v. 161, n. 1, p. 70, doi. 10.1080/10584587.2015.1036616
- Article
41
- Integrated Ferroelectrics, 2014, v. 157, n. 1, p. 168, doi. 10.1080/10584587.2014.912892
- Katiyar, Rajesh K.;
- Misra, Pankaj;
- Morell, Gerardo;
- Katiyar, Ram S.
- Article
42
- Integrated Ferroelectrics, 2014, v. 157, n. 1, p. 132, doi. 10.1080/10584587.2014.912887
- Pelloquin, Sylvain;
- Le Rhun, Gwenael;
- Defaÿ, Emmanuel;
- Renaux, Philippe;
- Nolot, Emmanuel;
- Abergel, Julie;
- Sibuet, Henri
- Article
43
- Integrated Ferroelectrics, 2014, v. 157, n. 1, p. 101, doi. 10.1080/10584587.2014.912110
- Kim, Jin Woong;
- Shima, Hiromi;
- Funakubo, Hiroshi;
- Nishida, Ken;
- Yamamoto, Takashi
- Article
44
- Integrated Ferroelectrics, 2014, v. 157, n. 1, p. 63, doi. 10.1080/10584587.2014.912081
- Tomar, M. S.;
- Charris-Hernández, A.;
- Barrionuevo, D.;
- Kumar, A.
- Article
45
- Integrated Ferroelectrics, 2012, v. 139, n. 1, p. 48, doi. 10.1080/10584587.2012.737214
- Li, R.;
- Tang, X. G.;
- Chen, D. G.;
- Liu, Q. X.;
- Jiang, Y. P.
- Article
46
- Issues in Science & Technology, 2008, v. 24, n. 4, p. 40
- Article
47
- Physica Status Solidi (B), 2016, v. 253, n. 6, p. 1144, doi. 10.1002/pssb.201552648
- Paddubrouskaya, H.;
- Volodin, A.;
- Petermann, C.;
- Tripathi, S.;
- Lagae, L.;
- Temst, K.;
- Van Haesendonck, C.
- Article
48
- Physica Status Solidi (B), 2014, v. 251, n. 11, p. 2274, doi. 10.1002/pssb.201451115
- Hong, Nguyen Hoa;
- Shaidiuk, Viacheslav;
- Atabaev, Timur Sh.;
- Ciftja, Orion;
- Kurisu, Makio;
- Kim, Hyung‐Kook;
- Hwang, Yoon‐Hwae
- Article
49
- Physica Status Solidi (B), 2014, v. 251, n. 6, p. 1178, doi. 10.1002/pssb.201451041
- Savchenko, Dariya;
- Kulikovsky, Valeriy;
- Vorlíček, Vladimir;
- Lančok, Jan;
- Kiselov, Vitalii;
- Kalabukhova, Ekaterina
- Article
50
- Physica Status Solidi (B), 2014, v. 251, n. 6, p. 1219, doi. 10.1002/pssb.201350307
- Apostolov, A. T.;
- Apostolova, I. N.;
- Wesselinowa, J. M.
- Article