Works matching DE "MAGNETIC memory (Computers)"
1
- Review of Economics & Statistics, 1995, v. 77, n. 4, p. 585, doi. 10.2307/2109808
- Article
2
- Advanced Functional Materials, 2015, v. 25, n. 1, p. 158, doi. 10.1002/adfm.201402955
- Luo, Zhaochu;
- Zhang, Xiaozhong;
- Xiong, Chengyue;
- Chen, Jiaojiao
- Article
3
- Advanced Functional Materials, 2014, v. 24, n. 21, p. 3179, doi. 10.1002/adfm.201304218
- Haberl, Johannes M.;
- Sánchez‐Ferrer, Antoni;
- Mihut, Adriana M.;
- Dietsch, Hervé;
- Hirt, Ann M.;
- Mezzenga, Raffaele
- Article
4
- Chemical & Petroleum Engineering, 2011, v. 47, n. 11/12, p. 837, doi. 10.1007/s10556-012-9559-6
- Article
5
- Nondestructive Testing & Evaluation, 2016, v. 31, n. 1, p. 45, doi. 10.1080/10589759.2015.1064121
- Pengpeng, Shi;
- Xiaojing, Zheng
- Article
6
- Nondestructive Testing & Evaluation, 2015, v. 30, n. 1, p. 13, doi. 10.1080/10589759.2014.977790
- Liu, Bin;
- Fu, Ying;
- Jian, Ren
- Article
7
- Nondestructive Testing & Evaluation, 2014, v. 29, n. 4, p. 377, doi. 10.1080/10589759.2014.949710
- Huang, Haihong;
- Jiang, Shilin;
- Yang, Cheng;
- Liu, Zhifeng
- Article
8
- Nondestructive Testing & Evaluation, 2012, v. 27, n. 2, p. 121, doi. 10.1080/10589759.2011.622758
- Xu, MingXiu;
- Xu, MinQiang;
- Li, JianWei;
- Xing, HaiYan
- Article
9
- Integrated Ferroelectrics, 2010, v. 120, n. 1, p. 114, doi. 10.1080/10584587.2010.503837
- Thakur, Sangeeta;
- Katyal, S. C.;
- Gupta, A.;
- Reddy, V. R.;
- Singh, M.
- Article
10
- International Journal of Computer Science & Management Studies, 2015, v. 17, n. 1, p. 15
- Article
11
- International Journal of High Speed Electronics & Systems, 2006, v. 16, n. 2, p. 479, doi. 10.1142/S0129156406003801
- White, Marvin H.;
- Yu Wang;
- Wrazien, Stephen J.;
- Yijie Zhao
- Article
12
- Welding International, 2014, v. 28, n. 12, p. 983, doi. 10.1080/09507116.2014.884332
- Article
13
- Mecatronica, 2005, n. 2, p. 19
- Comănescu, Dinu;
- Ruxandra, Ionica
- Article
14
- Mecatronica, 2005, n. 2, p. 15
- Comănescu, Dinu;
- Dinescu, Daniel-Petrel
- Article
15
- Mecatronica, 2005, n. 1, p. 31
- Comanescu, Dinu;
- Dinescu, Daniel-Petre;
- Ruxandra, Ionica
- Article
16
- Insight: Non-Destructive Testing & Condition Monitoring, 2019, v. 61, n. 1, p. 2
- Article
17
- Insight: Non-Destructive Testing & Condition Monitoring, 2018, v. 60, n. 8, p. 451, doi. 10.1784/insi.2018.60.8.451
- Haihong Huang;
- Zhengchun Qian
- Article
18
- Insight: Non-Destructive Testing & Condition Monitoring, 2018, v. 60, n. 6, p. 335, doi. 10.1784/insi.2018.60.6.335
- Haihong Huang;
- Bin Xiong;
- Zhengchun Qian;
- Jiaxin Ye;
- Zhifeng Liu
- Article
19
- Insight: Non-Destructive Testing & Condition Monitoring, 2018, v. 60, n. 3, p. 161, doi. 10.1784/insi.2018.60.3.161
- Article
20
- Insight: Non-Destructive Testing & Condition Monitoring, 2015, v. 57, n. 12, p. 709, doi. 10.1784/insi.2015.57.12.709
- Article
21
- Insight: Non-Destructive Testing & Condition Monitoring, 2015, v. 57, n. 12, p. 683, doi. 10.1784/insi.2015.57.12.683
- Bao, S;
- Hu, S N;
- Lin, L;
- Gu, Y B;
- Fu, M L
- Article
22
- Insight: Non-Destructive Testing & Condition Monitoring, 2015, v. 57, n. 6, p. 324, doi. 10.1784/insi.2015.57.6.324
- Li, Changjun;
- Chen, Chao;
- Liao, Kexi
- Article
23
- Insight: Non-Destructive Testing & Condition Monitoring, 2014, v. 56, n. 12, p. 691, doi. 10.1784/insi.2014.56.12.691
- Zhaoming, Zhou;
- Taihe, Shi;
- Runqiao, Yu;
- Zhanghua, Lian;
- Fu, Wan
- Article
24
- Insight: Non-Destructive Testing & Condition Monitoring, 2014, v. 56, n. 12, p. 669, doi. 10.1784/insi.2014.56.12.669
- Min, Yu;
- Rui-Bin, Gou;
- Chunyu, Zhang;
- Yinhu, Qiao;
- Zhiyuan, Si;
- Zhanshan, Xie
- Article
25
- Insight: Non-Destructive Testing & Condition Monitoring, 2011, v. 53, n. 10, p. 576
- Article
26
- Insight: Non-Destructive Testing & Condition Monitoring, 2011, v. 53, n. 3, p. 142, doi. 10.1784/insi.2011.53.3.142
- Jianwei Li;
- Minqiang Xu;
- Jiancheng Leng;
- Mingxiu Xu;
- Shuai Zhao
- Article
27
- Insight: Non-Destructive Testing & Condition Monitoring, 2010, v. 52, n. 6, p. 305, doi. 10.1784/insi.2010.52.6.305
- Ren Shang-kun;
- Ou Yang-chun;
- Fu Ren-zhen;
- Fu Yue-wen
- Article
28
- Diagram, 2022, v. 22, n. 5, p. 1
- Article
29
- Metallurgist, 2015, v. 59, n. 1/2, p. 164, doi. 10.1007/s11015-015-0078-5
- Article
30
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 4, p. 224, doi. 10.1049/el.2016.3877
- Article
31
- Computer Journal, 2005, v. 48, n. 3, p. 292, doi. 10.1093/comjnl/bxh085
- THOMASIAN, ALEXANDER;
- CHUNQI HAN
- Article
32
- Computer Journal, 1999, v. 42, n. 3, p. 232, doi. 10.1093/comjnl/42.3.232
- Hiasat, Ahmad A.;
- Abdel-Aty-Zohdy, Hoda
- Article
33
- Innovation, 2006, v. 6, n. 3, p. 6
- Article
34
- Innovation, 2004, v. 4, n. 2, p. 4
- Article
35
- Natural Computing, 2010, v. 9, n. 4, p. 903, doi. 10.1007/s11047-009-9162-8
- Maity, Goutam;
- Chattopadhyay, Tanay;
- Gayen, Dilip;
- Taraphdar, Chinmoy;
- Maiti, Anup;
- Maity, Santi;
- Roy, Jitendra
- Article
36
- Bioprocess & Biosystems Engineering, 2013, v. 36, n. 8, p. 1087, doi. 10.1007/s00449-012-0862-6
- Vardanega, Renata;
- Tres, Marcus;
- Mazutti, Marcio;
- Treichel, Helen;
- Oliveira, Débora;
- Luccio, Marco;
- Oliveira, J.
- Article
37
- Nature, 2010, v. 468, n. 7322, p. 417, doi. 10.1038/nature09478
- Mannini, M.;
- Pineider, F.;
- Danieli, C.;
- Totti, F.;
- Sorace, L.;
- Sainctavit, Ph.;
- Arrio, M.-A.;
- Otero, E.;
- Joly, L.;
- Cezar, J. C.;
- Cornia, A.;
- Sessoli, R.
- Article
38
- IETE Technical Review, 2010, v. 27, n. 4, p. 318, doi. 10.4103/0256-4602.64605
- Article
39
- CD-ROM Professional, 1995, v. 8, n. 7, p. 62
- Article
40
- Advances in Materials Science & Engineering, 2017, p. 1, doi. 10.1155/2017/1284560
- Wang, Guoqing;
- Yan, Ping;
- Wei, Liwa;
- Deng, Zilong
- Article
41
- Journal of Nanoparticle Research, 2012, v. 14, n. 4, p. 1, doi. 10.1007/s11051-012-0769-9
- Marangoni, Valéria;
- Martins, Marccus;
- Souza, José;
- Oliveira, Osvaldo;
- Zucolotto, Valtencir;
- Crespilho, Frank
- Article
42
- Journal of Electronic Testing, 2014, v. 30, n. 2, p. 183, doi. 10.1007/s10836-014-5440-1
- Evain, Samuel;
- Savin, Valentin;
- Gherman, Valentin
- Article
43
- Journal of Electronic Testing, 2012, v. 28, n. 5, p. 585, doi. 10.1007/s10836-012-5324-1
- Article
44
- Archive for Rational Mechanics & Analysis, 2017, v. 226, n. 2, p. 497, doi. 10.1007/s00205-017-1117-0
- Brzeźniak, Zdzisław;
- Goldys, Ben;
- Jegaraj, Terence
- Article
45
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep07459
- Guite, Chinkhanlun;
- Kerk, I. S.;
- Sekhar, M. Chandra;
- Ramu, M.;
- Goolaup, S.;
- Lew, W. S.
- Article
46
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep05123
- Jalil, Mansoor B. A.;
- Seng Ghee Tan
- Article
47
- Modélisation Mathématique et Analyse Numérique, 2008, v. 42, n. 4, p. 645, doi. 10.1051/m2an:2008021
- I?igo Arregui;
- Jos? Cend?n;
- Carlos Par?s;
- Carlos V?zquez
- Article
48
- Applied Cognitive Psychology, 2007, v. 21, n. 3, p. 345, doi. 10.1002/acp.1276
- Oswald, Karl M.;
- Coleman, Marjorie L.
- Article
49
- International Journal of Neuroscience, 2005, v. 115, n. 3, p. 329, doi. 10.1080/00207450590520939
- ARTURO, MARCOS;
- BANACLOCHA, MARTÍNEZ
- Article