Works matching DE "MAGNETIC flux leakage"
1
- Applied Physics A: Materials Science & Processing, 2025, v. 131, n. 6, p. 1, doi. 10.1007/s00339-025-08578-9
- Vinodhini, V.;
- Vijayakanth, Vembakam;
- Brahadeeswaran, Subhashini;
- Tamizhselvi, Ramasamy;
- Chintagumpala, Krishnamoorthi
- Article
2
- Mathematics (2227-7390), 2025, v. 13, n. 11, p. 1865, doi. 10.3390/math13111865
- Cha, Kyoung-Soo;
- Kim, Jae-Hyun;
- Lee, Soo-Gyung;
- Park, Min-Ro
- Article
3
- Polymers (20734360), 2025, v. 17, n. 11, p. 1572, doi. 10.3390/polym17111572
- Liu, Kai;
- Ai, Yusen;
- Cui, Mei;
- Huang, Renliang;
- Su, Rongxin
- Article
4
- IEEJ Transactions on Electrical & Electronic Engineering, 2025, v. 20, n. 7, p. 1016, doi. 10.1002/tee.24265
- Chen, Zhiwei;
- Yang, Ruibo;
- Wang, Junxian;
- Xiang, Nianwen;
- Liu, Xin
- Article
5
- Nanomaterials (2079-4991), 2025, v. 15, n. 11, p. 806, doi. 10.3390/nano15110806
- Yang, Xiaojiao;
- Han, Shuai;
- Xing, Hongna;
- Dong, Yi;
- Deng, Xia;
- Zong, Yan;
- Feng, Juan;
- Zhu, Xiuhong;
- Li, Xinghua;
- Zheng, Xinliang
- Article
6
- International Journal of Circuit Theory & Applications, 2025, v. 53, n. 6, p. 3581, doi. 10.1002/cta.4294
- Huang, Shengping;
- Liu, Zihan;
- Li, Ao;
- Yang, Jianhua;
- Sanjuán, Miguel A. F.;
- Wang, Zhongqiu
- Article
7
- International Journal of Circuit Theory & Applications, 2025, v. 53, n. 6, p. 3592, doi. 10.1002/cta.4280
- Hu, Yanwen;
- Heng, Tingzhen;
- Zhang, Tingrong;
- Zhou, Wenying;
- Chen, Qingyang
- Article
8
- Chest Disease Reports, 2024, v. 12, n. 1, p. 1, doi. 10.4081/cdr.12.12298
- Anelli, Marisa;
- Raimondi, Federico;
- Novelli, Luca;
- Allegri, Chiara;
- Bonetti, Simone;
- Catani, Carlo;
- Malandrino, Luca;
- Candiago, Elisabetta;
- Ciaravino, Giuseppe;
- Gianatti, Andrea;
- Di Marco, Fabiano
- Article
9
- Micromachines, 2025, v. 16, n. 5, p. 541, doi. 10.3390/mi16050541
- Mohammad, Hala;
- Li, Jiawei;
- Li, Bochao;
- Baraya, Jamilu Tijjani;
- Kone, Sana;
- Zhao, Zhenlong;
- Song, Xiaowei;
- Lin, Jingquan
- Article
10
- Journal of Electronic Materials, 2025, v. 54, n. 2, p. 977, doi. 10.1007/s11664-024-11618-4
- Dongquoc, Viet;
- Tu, B. D.;
- Phan, T. L.;
- Dang, N. T.;
- Park, Seung-Young;
- Jeong, Jong-Ryul
- Article
11
- Journal of Electronic Materials, 2024, v. 53, n. 12, p. 8212, doi. 10.1007/s11664-024-11502-1
- Xiao, Wenqi;
- He, Jun;
- Deng, Yonghe;
- He, Longhui;
- Ling, Jie
- Article
12
- Journal of Electronic Materials, 2024, v. 53, n. 7, p. 4059, doi. 10.1007/s11664-024-11106-9
- Li, Chen;
- Deng, Lianwen;
- Liang, Huasheng;
- Peng, Sen;
- Qiu, Leilei;
- Huang, Shengxiang
- Article
13
- Journal of Electronic Materials, 2024, v. 53, n. 5, p. 2309, doi. 10.1007/s11664-024-11007-x
- Gan, Lihong;
- Zheng, Zhipeng;
- Liu, Yinchen;
- Zhao, Jun;
- Yan, Min;
- Wang, Zhibin;
- Xiong, Tongqiang;
- Feng, Bo
- Article
14
- Chemistry - A European Journal, 2023, v. 29, n. 69, p. 1, doi. 10.1002/chem.202302680
- Wu, Sutang;
- Zhu, Yihan;
- Yan, Xuehua;
- Zhang, Wenjing;
- Zhang, Mengyang;
- Huang, Xinpeng;
- Pan, Jianmei;
- Shahnavaz, Zohreh;
- Mohammadi Moradian, Jamile
- Article
15
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 18, p. 17333, doi. 10.1007/s10854-019-02081-7
- Zhang, Kaichuang;
- Zhang, Xinggao;
- Zhao, Xin;
- Gai, Xiqiang;
- An, Wenshu;
- Fang, Guofeng;
- Zhang, Airong;
- Chen, Xuefang
- Article
16
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 16, p. 15619, doi. 10.1007/s10854-019-01940-7
- Liu, Sheng;
- Wei, Kexiang;
- Cheng, Yulan;
- Qin, Bo;
- Yan, Shuoqing;
- Luo, Heng;
- Deng, Lianwen
- Article
17
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 16, p. 15321, doi. 10.1007/s10854-019-01905-w
- Shen, Guozhu;
- Mei, Buqing;
- Wu, Hongyan;
- Zhao, Bin;
- Ren, Junzhao;
- Fang, Xumin;
- Xu, Yewen
- Article
18
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 16, p. 14923, doi. 10.1007/s10854-019-01864-2
- Singh, Charanjeet;
- Bai, Yang;
- Narang, Sukhleen Bindra;
- Sombra, A. S. B.;
- Mishra, Sanjay R.;
- Jotania, Rajshree;
- Khanna, Rajesh;
- Trukhanov, S. V.;
- Trukhanov, A. V.;
- Ghimire, Madhav
- Article
19
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 13, p. 12295, doi. 10.1007/s10854-019-01588-3
- Bai, Lang;
- Gao, Rongli;
- Zhang, Qingmei;
- Xu, Zhiyi;
- Wang, Zhenhua;
- Fu, Chunlin;
- Chen, Gang;
- Deng, Xiaoling;
- Qiu, Yang;
- Cai, Wei
- Article
20
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 13, p. 12012, doi. 10.1007/s10854-019-01558-9
- Yan, Tingyu;
- Wang, Jun;
- Wu, Qilei;
- Huo, Siqi;
- Duan, Huajun
- Article
21
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 9, p. 8864, doi. 10.1007/s10854-019-01214-2
- Ding, Juan;
- Cheng, Ligang;
- Zhang, Xutong;
- Liu, Qiangfei
- Article
22
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 9, p. 8437, doi. 10.1007/s10854-019-01162-x
- Article
23
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 20, p. 15050, doi. 10.1007/s10854-017-7379-3
- Ding, Wenhao;
- Sun, Wen;
- Deng, Chengfu;
- Wang, Lixi;
- Zhang, Qitu
- Article
24
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 15, p. 10853, doi. 10.1007/s10854-017-6863-0
- Yang, Haibo;
- Dai, Jingjing;
- Lin, Ying;
- Han, Ning;
- Liu, Xiao;
- Wang, Jingjing
- Article
25
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 12, p. 12846, doi. 10.1007/s10854-016-5419-z
- Xu, Huan;
- Sun, Wen;
- Gui, Yonghao;
- Wang, Lixi;
- Yu, Mingxun;
- Zhang, Qitu
- Article
26
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 6, p. 3474, doi. 10.1007/s10854-015-2857-y
- Huang, Xiaogu;
- Chen, Yunyun;
- Yu, Jianghua;
- Zhang, Jing;
- Sang, Tianyi;
- Tao, Gaixin;
- Zhu, Hongli
- Article
27
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 9, p. 3448, doi. 10.1007/s10854-013-1269-0
- Markondeya Raj, P.;
- Sharma, Himani;
- Samtani, Saurabh;
- Mishra, Dibyajat;
- Nair, Vijay;
- Tummala, Rao
- Article
28
- Russian Journal of Nondestructive Testing, 2024, v. 60, n. 7, p. 801, doi. 10.1134/S1061830924601971
- Wang, Hongli;
- Zhang, Juwei;
- Wei, Jilin
- Article
29
- Russian Journal of Nondestructive Testing, 2024, v. 60, n. 1, p. 63, doi. 10.1134/S1061830923601459
- Markov, A. A.;
- Mosyagin, V. V.;
- Antipov, A. G.;
- Ivanov, G. A.
- Article
30
- Russian Journal of Nondestructive Testing, 2023, v. 59, n. 12, p. 1297, doi. 10.1134/S1061830923700596
- Nikitin, A. V.;
- Mikhaylov, A. V.;
- Mikhaylov, L. V.;
- Gobov, Yu. L.;
- Kostin, V. N.;
- Smorodinskiy, Ya. G.
- Article
31
- Russian Journal of Nondestructive Testing, 2023, v. 59, n. 6, p. 677, doi. 10.1134/S1061830923700420
- Antipov, A. G.;
- Markov, A. A.;
- Maximova, E. A.
- Article
32
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 12, p. 1129, doi. 10.1134/S1061830922700139
- Article
33
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 7, p. 643, doi. 10.1134/S1061830922070117
- Zhang, Zengguang;
- Zhang, Juwei
- Article
34
- Russian Journal of Nondestructive Testing, 2021, v. 57, n. 11, p. 1008, doi. 10.1134/S106183092111005X
- Bing Li;
- Zhang, Juwei;
- Chen, Qihang
- Article
35
- Russian Journal of Nondestructive Testing, 2021, v. 57, n. 8, p. 717, doi. 10.1134/S1061830921080106
- Article
36
- Russian Journal of Nondestructive Testing, 2020, v. 56, n. 5, p. 417, doi. 10.1134/S1061830920050083
- Shleenkov, A. S.;
- Bulychev, O. A.;
- Shleenkov, S. A.;
- Novgorodov, D. V.
- Article
37
- Russian Journal of Nondestructive Testing, 2019, v. 55, n. 12, p. 875, doi. 10.1134/S1061830919120064
- Markov, A. A.;
- Maksimova, E. A.;
- Antipov, A. G.
- Article
38
- Russian Journal of Nondestructive Testing, 2019, v. 55, n. 4, p. 277, doi. 10.1134/S1061830919040028
- Antipov, A. G.;
- Markov, A. A.
- Article
39
- Russian Journal of Nondestructive Testing, 2019, v. 55, n. 8, p. 581, doi. 10.1134/S1061830919080102
- Article
40
- Russian Journal of Nondestructive Testing, 2019, v. 55, n. 3, p. 233, doi. 10.1134/S1061830919030100
- Wang, Hongyao;
- Tian, Jie;
- Meng, Guoying;
- Li, Xiaowei;
- Zhou, Junying;
- Lü, Xin
- Article
41
- Russian Journal of Nondestructive Testing, 2017, v. 53, n. 12, p. 862, doi. 10.1134/S1061830917120075
- Wenhua Han;
- Zhengyang Wu;
- Mengchu Zhou;
- Hou, Edwin;
- Xiaoyan Su;
- Ping Wang;
- Guiyun Tian
- Article
42
- Russian Journal of Nondestructive Testing, 2016, v. 52, n. 3, p. 155, doi. 10.1134/S1061830916030037
- Article
43
- Russian Journal of Nondestructive Testing, 2016, v. 52, n. 3, p. 175, doi. 10.1134/S1061830916030049
- Kim, Hyung;
- Choi, Doo-Hyun
- Article
44
- 2015
- Potapov, A.;
- Syas'ko, V.;
- Pudovkin, O.
- Erratum
45
- Russian Journal of Nondestructive Testing, 2015, v. 51, n. 8, p. 509, doi. 10.1134/S1061830915080082
- Article
46
- Russian Journal of Nondestructive Testing, 2015, v. 51, n. 8, p. 513, doi. 10.1134/S1061830915080070
- Potapov, A.;
- Syas'ko, V.;
- Pudovkin, O.
- Article
47
- Russian Journal of Nondestructive Testing, 2014, v. 50, n. 8, p. 481, doi. 10.1134/S1061830914080026
- Article
48
- Russian Journal of Nondestructive Testing, 2013, v. 49, n. 8, p. 465, doi. 10.1134/S106183091308007X
- Shur, M.;
- Novoslugina, A.;
- Smorodinskii, Ya.
- Article
49
- Russian Journal of Nondestructive Testing, 2013, v. 49, n. 9, p. 493, doi. 10.1134/S106183091309009X
- Slesarev, D. A.;
- Abakumov Jr., A. A.
- Article
50
- Measurement Techniques, 2024, v. 67, n. 1, p. 39, doi. 10.1007/s11018-024-02318-w
- Article