Works matching DE "MAGNETIC flux leakage"
1
- Journal of Nano- & Electronic Physics, 2025, v. 17, n. 3, p. 03010-1, doi. 10.21272/jnep.17(3).03010
- Article
2
- Microsystems & Nanoengineering, 2025, v. 11, n. 1, p. 1, doi. 10.1038/s41378-025-00875-w
- Xian, Dan;
- Zhao, Yanan;
- Du, Yongjun;
- Xu, Yiwei;
- Qiao, Jiacheng;
- Wu, Jingen;
- Lin, Qijing;
- Liu, Ming;
- Jiang, Zhuangde
- Article
3
- Sensors (14248220), 2025, v. 25, n. 13, p. 3962, doi. 10.3390/s25133962
- Ji, Kailun;
- Wang, Ping;
- Jia, Yinliang
- Article
4
- Acta Materiae Compositae Sinica, 2025, v. 42, n. 6, p. 3181, doi. 10.13801/j.cnki.fhelxb.20240821.010
- Article
5
- Research in Nondestructive Evaluation, 2025, v. 36, n. 3, p. 124, doi. 10.1080/09349847.2025.2502115
- Singh, W. Sharatchandra;
- Thirunavukkarasu, S.;
- Kumar, Anish
- Article
6
- Experimental Techniques, 2025, v. 49, n. 4, p. 727, doi. 10.1007/s40799-025-00779-4
- Wang, Y.;
- Fan, J.;
- Jiang, H.
- Article
7
- Machines, 2025, v. 13, n. 6, p. 446, doi. 10.3390/machines13060446
- Wang, Chenlin;
- Tang, Jianhua;
- Duan, Yicheng;
- Lu, Senxiang;
- Wen, Hao
- Article
8
- Metals (2075-4701), 2025, v. 15, n. 6, p. 597, doi. 10.3390/met15060597
- Article
9
- Russian Journal of Nondestructive Testing, 2024, v. 60, n. 7, p. 801, doi. 10.1134/S1061830924601971
- Wang, Hongli;
- Zhang, Juwei;
- Wei, Jilin
- Article
10
- Russian Journal of Nondestructive Testing, 2024, v. 60, n. 1, p. 63, doi. 10.1134/S1061830923601459
- Markov, A. A.;
- Mosyagin, V. V.;
- Antipov, A. G.;
- Ivanov, G. A.
- Article
11
- Russian Journal of Nondestructive Testing, 2023, v. 59, n. 12, p. 1297, doi. 10.1134/S1061830923700596
- Nikitin, A. V.;
- Mikhaylov, A. V.;
- Mikhaylov, L. V.;
- Gobov, Yu. L.;
- Kostin, V. N.;
- Smorodinskiy, Ya. G.
- Article
12
- Russian Journal of Nondestructive Testing, 2023, v. 59, n. 6, p. 677, doi. 10.1134/S1061830923700420
- Antipov, A. G.;
- Markov, A. A.;
- Maximova, E. A.
- Article
13
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 12, p. 1129, doi. 10.1134/S1061830922700139
- Article
14
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 7, p. 643, doi. 10.1134/S1061830922070117
- Zhang, Zengguang;
- Zhang, Juwei
- Article
15
- Russian Journal of Nondestructive Testing, 2021, v. 57, n. 11, p. 1008, doi. 10.1134/S106183092111005X
- Bing Li;
- Zhang, Juwei;
- Chen, Qihang
- Article
16
- Russian Journal of Nondestructive Testing, 2021, v. 57, n. 8, p. 717, doi. 10.1134/S1061830921080106
- Article
17
- Russian Journal of Nondestructive Testing, 2020, v. 56, n. 5, p. 417, doi. 10.1134/S1061830920050083
- Shleenkov, A. S.;
- Bulychev, O. A.;
- Shleenkov, S. A.;
- Novgorodov, D. V.
- Article
18
- Russian Journal of Nondestructive Testing, 2019, v. 55, n. 12, p. 875, doi. 10.1134/S1061830919120064
- Markov, A. A.;
- Maksimova, E. A.;
- Antipov, A. G.
- Article
19
- Russian Journal of Nondestructive Testing, 2019, v. 55, n. 8, p. 581, doi. 10.1134/S1061830919080102
- Article
20
- Russian Journal of Nondestructive Testing, 2019, v. 55, n. 4, p. 277, doi. 10.1134/S1061830919040028
- Antipov, A. G.;
- Markov, A. A.
- Article
21
- Russian Journal of Nondestructive Testing, 2019, v. 55, n. 3, p. 233, doi. 10.1134/S1061830919030100
- Wang, Hongyao;
- Tian, Jie;
- Meng, Guoying;
- Li, Xiaowei;
- Zhou, Junying;
- Lü, Xin
- Article
22
- Russian Journal of Nondestructive Testing, 2017, v. 53, n. 12, p. 862, doi. 10.1134/S1061830917120075
- Wenhua Han;
- Zhengyang Wu;
- Mengchu Zhou;
- Hou, Edwin;
- Xiaoyan Su;
- Ping Wang;
- Guiyun Tian
- Article
23
- Russian Journal of Nondestructive Testing, 2016, v. 52, n. 3, p. 155, doi. 10.1134/S1061830916030037
- Article
24
- Russian Journal of Nondestructive Testing, 2016, v. 52, n. 3, p. 175, doi. 10.1134/S1061830916030049
- Kim, Hyung;
- Choi, Doo-Hyun
- Article
25
- 2015
- Potapov, A.;
- Syas'ko, V.;
- Pudovkin, O.
- Erratum
26
- Russian Journal of Nondestructive Testing, 2015, v. 51, n. 8, p. 509, doi. 10.1134/S1061830915080082
- Article
27
- Russian Journal of Nondestructive Testing, 2015, v. 51, n. 8, p. 513, doi. 10.1134/S1061830915080070
- Potapov, A.;
- Syas'ko, V.;
- Pudovkin, O.
- Article
28
- Russian Journal of Nondestructive Testing, 2014, v. 50, n. 8, p. 481, doi. 10.1134/S1061830914080026
- Article
29
- Russian Journal of Nondestructive Testing, 2013, v. 49, n. 8, p. 465, doi. 10.1134/S106183091308007X
- Shur, M.;
- Novoslugina, A.;
- Smorodinskii, Ya.
- Article
30
- Russian Journal of Nondestructive Testing, 2013, v. 49, n. 9, p. 493, doi. 10.1134/S106183091309009X
- Slesarev, D. A.;
- Abakumov Jr., A. A.
- Article
31
- Measurement Techniques, 2024, v. 67, n. 1, p. 39, doi. 10.1007/s11018-024-02318-w
- Article
32
- Measurement Techniques, 2023, v. 66, n. 9, p. 699, doi. 10.1007/s11018-024-02283-4
- Plotnikov, S. M.;
- Iksil, N.
- Article
33
- Measurement Techniques, 2022, v. 65, n. 1, p. 59, doi. 10.1007/s11018-022-02048-x
- Article
34
- Measurement Techniques, 2022, v. 64, n. 12, p. 1016, doi. 10.1007/s11018-022-02038-z
- Volegova, E. A;
- Andreev, S. V.;
- Kudrevatykh, N. V.;
- Maltseva, V. E.;
- Maslova, T. I.;
- Neznakhin, D. S.;
- Serdiukov, S. V.;
- Urzhumtsev, A. N.;
- Volegov, A. S.
- Article
35
- Measurement Techniques, 2021, v. 64, n. 9, p. 751, doi. 10.1007/s11018-022-01999-5
- Article
36
- Measurement Techniques, 2021, v. 64, n. 3, p. 217, doi. 10.1007/s11018-021-01921-5
- Article
37
- Measurement Techniques, 2019, v. 62, n. 8, p. 722, doi. 10.1007/s11018-019-01685-z
- Article
38
- Measurement Techniques, 2018, v. 61, n. 3, p. 199, doi. 10.1007/s11018-018-1409-2
- Malygin, M. A.;
- Maslova, T. I.;
- Volegova, E. A.;
- Volegov, A. S.
- Article
39
- Measurement Techniques, 2013, v. 56, n. 9, p. 949, doi. 10.1007/s11018-013-0311-1
- Maslova, T.;
- Malyuk, V.;
- Didik, Yu.;
- Malygin, M.
- Article
40
- Machine Tool & Hydraulics, 2024, v. 52, n. 16, p. 144, doi. 10.3969/j.issn.1001-3881.2024.16.022
- Article
41
- Machine Tool & Hydraulics, 2024, v. 52, n. 15, p. 75, doi. 10.3969/j.issn.1001-3881.2024.15.012
- Article
42
- Mathematics & Mechanics of Solids, 2022, v. 27, n. 10, p. 2147, doi. 10.1177/10812865221103482
- La Valle, Gabriele;
- Ciallella, Alessandro;
- Falsone, Giovanni
- Article
43
- Inventions (2411-5134), 2023, v. 8, n. 6, p. 132, doi. 10.3390/inventions8060132
- Patel, Brijesh;
- Huang, Zih Fong;
- Yeh, Chih-Ho;
- Shih, Yen-Ru;
- Lin, Po Ting
- Article
44
- Mathematics (2227-7390), 2022, v. 10, n. 13, p. 2346, doi. 10.3390/math10132346
- Quondam Antonio, Simone;
- Fulginei, Francesco Riganti;
- Lozito, Gabriele Maria;
- Faba, Antonio;
- Salvini, Alessandro;
- Bonaiuto, Vincenzo;
- Sargeni, Fausto
- Article
45
- Electronics (2079-9292), 2025, v. 14, n. 5, p. 941, doi. 10.3390/electronics14050941
- Ravera, Alessandro;
- Oliveri, Alberto;
- Lodi, Matteo;
- Storace, Marco
- Article
46
- Electronics (2079-9292), 2025, v. 14, n. 5, p. 906, doi. 10.3390/electronics14050906
- Huang, Wencong;
- Shu, Cheng;
- Wang, Aoli;
- Chang, Yufang;
- Yan, Huaicheng
- Article
47
- Electronics (2079-9292), 2024, v. 13, n. 23, p. 4781, doi. 10.3390/electronics13234781
- Chen, Pengchao;
- Xuan, Wenbo;
- Li, Rui;
- Wang, Fuxiang;
- Fu, Kuan
- Article
48
- Electronics (2079-9292), 2024, v. 13, n. 21, p. 4188, doi. 10.3390/electronics13214188
- Shin, Yujun;
- Rhee, Jaewon;
- Woo, Seongho
- Article
49
- Electronics (2079-9292), 2024, v. 13, n. 9, p. 1716, doi. 10.3390/electronics13091716
- Du, Hao;
- Cai, Linglong;
- Ma, Zhiqin;
- Rao, Zhangquan;
- Shu, Xiang;
- Jiang, Shuo;
- Li, Zhongxiang;
- Li, Xianqiang
- Article
50
- Electronics (2079-9292), 2024, v. 13, n. 9, p. 1712, doi. 10.3390/electronics13091712
- Article