Works about MAGNETIC circuits
1
- Sensors (14248220), 2025, v. 25, n. 12, p. 3813, doi. 10.3390/s25123813
- Krobot, Robert;
- Dadić, Martin
- Article
2
- Symmetry (20738994), 2025, v. 17, n. 6, p. 897, doi. 10.3390/sym17060897
- Chen, Keqi;
- Ma, Shilun;
- Li, Changwei;
- Wu, Yongyi;
- Ma, Jianwei
- Article
3
- Journal of Separation Science, 2014, v. 37, n. 14, p. 1805, doi. 10.1002/jssc.201400256
- Kaur, Ranjeet;
- Hasan, Abshar;
- Iqbal, Nusrat;
- Alam, Samsul;
- Saini, Mahesh Kr;
- Raza, Syed Kalbe
- Article
4
- Microscopy & Microanalysis, 2019, p. 446, doi. 10.1017/S1431927618002726
- Lovejoy, T.C.;
- Corbin, G.C.;
- Dellby, N.;
- Hoffman, M.V.;
- Krivanek, O.L.
- Article
5
- Russian Journal of Nondestructive Testing, 2018, v. 54, n. 12, p. 861, doi. 10.1134/S1061830918120069
- Gorkunov, E. S.;
- Povolotskaya, A. M.;
- Zadvorkin, S. M.
- Article
6
- Russian Journal of Nondestructive Testing, 2015, v. 51, n. 2, p. 79, doi. 10.1134/S1061830915020072
- Article
7
- Russian Journal of Nondestructive Testing, 2014, v. 50, n. 10, p. 580, doi. 10.1134/S1061830914100064
- Ismagilov, F.;
- Yangirov, I.;
- Maksudov, D.
- Article
8
- Russian Journal of Nondestructive Testing, 2010, v. 46, n. 8, p. 580, doi. 10.1134/S106183091008005X
- Nichipuruk, A.;
- Bida, G.;
- Tsar'kova, T.;
- Gobov, Yu.;
- Stashkov, A.;
- Povolotskaya, A.
- Article
9
- Russian Journal of Nondestructive Testing, 2010, v. 46, n. 6, p. 411, doi. 10.1134/S1061830910060033
- Gusev, A. P.;
- Kosovets, S. A.;
- Zatsepin, E. N.
- Article
10
- Russian Journal of Nondestructive Testing, 2009, v. 45, n. 10, p. 693, doi. 10.1134/S1061830909100040
- Gorkunov, E.;
- Tabachnik, V.
- Article
11
- Russian Journal of Nondestructive Testing, 2007, v. 43, n. 5, p. 316, doi. 10.1134/S1061830907050051
- Bida, G.V.;
- Stashkov, A.N.;
- Nichipuruk, A.P.;
- Somova, V.M.
- Article
12
- Russian Journal of Nondestructive Testing, 2007, v. 43, n. 3, p. 143, doi. 10.1134/S1061830907030035
- Matyuk, V. F.;
- Osipov, A. A.
- Article
13
- Russian Journal of Nondestructive Testing, 2006, v. 42, n. 10, p. 656, doi. 10.1134/S1061830906100044
- Article
14
- Russian Journal of Nondestructive Testing, 2005, v. 41, n. 3, p. 175, doi. 10.1007/s11181-005-0146-1
- Gorkunov, E.;
- Mitropol’skaya, S.;
- Povolotskaya, A.
- Article
15
- Russian Journal of Nondestructive Testing, 2005, v. 41, n. 3, p. 182, doi. 10.1007/s11181-005-0147-0
- Gorkunov, E.;
- Povolotskaya, A.;
- Mitropol’skaya, S.
- Article
16
- Russian Journal of Nondestructive Testing, 2004, v. 40, n. 6, p. 406, doi. 10.1023/B:RUNT.0000049850.32233.55
- Sandomirskii, S. G.;
- Sandomirskaya, E. G.
- Article
17
- Russian Journal of Nondestructive Testing, 2004, v. 40, n. 6, p. 412, doi. 10.1023/B:RUNT.0000049851.36697.50
- Article
18
- Russian Journal of Nondestructive Testing, 2003, v. 39, n. 7, p. 559, doi. 10.1023/B:RUNT.0000012796.17990.ab
- Article
19
- Measurement Techniques, 2024, v. 67, n. 1, p. 39, doi. 10.1007/s11018-024-02318-w
- Article
20
- Measurement Techniques, 2023, v. 66, n. 9, p. 699, doi. 10.1007/s11018-024-02283-4
- Plotnikov, S. M.;
- Iksil, N.
- Article
21
- Measurement Techniques, 2021, v. 64, n. 9, p. 751, doi. 10.1007/s11018-022-01999-5
- Article
22
- Measurement Techniques, 2015, v. 58, n. 3, p. 336, doi. 10.1007/s11018-015-0711-5
- Bakhvalov, Yu.;
- Gorbatenko, N.;
- Grechikhin, V.
- Article
23
- Measurement Techniques, 2013, v. 56, n. 4, p. 403, doi. 10.1007/s11018-013-0218-x
- Article
24
- Measurement Techniques, 2010, v. 53, n. 3, p. 295, doi. 10.1007/s11018-010-9499-5
- Article
25
- Machine Tool & Hydraulics, 2025, v. 53, n. 6, p. 111, doi. 10.3969/j.issn.1001-3881.2025.06.017
- Article
26
- Machine Tool & Hydraulics, 2024, v. 52, n. 24, p. 160, doi. 10.3969/j.issn.1001-3881.2024.24.024
- Article
27
- Machine Tool & Hydraulics, 2024, v. 52, n. 16, p. 144, doi. 10.3969/j.issn.1001-3881.2024.16.022
- Article
28
- Machine Tool & Hydraulics, 2023, v. 51, n. 20, p. 112, doi. 10.3969/j.issn.1001-3881.2023.20.018
- Article
29
- Machine Tool & Hydraulics, 2023, v. 51, n. 10, p. 95, doi. 10.3969/j.issn.1001-3881.2023.10.017
- Article
30
- Inventions (2411-5134), 2023, v. 8, n. 3, p. 68, doi. 10.3390/inventions8030068
- Ilyasov, Roman Ildusovich
- Article
31
- Technical Diagnostics & Nondestructive Testing / Tekhnicheskaya Diagnostika I Nerazrushayushchiy Kontrol, 2023, n. 3, p. 3, doi. 10.37434/tdnk2023.03.01
- Соломаха, Р. М.;
- Рибачук, В. Г.;
- Учанін, В. М.
- Article
32
- Open Physics, 2018, v. 16, n. 1, p. 42, doi. 10.1515/phys-2018-0008
- Goryca, Zbigniew;
- Paduszyński, Kamil;
- Pakosz, Artur
- Article
33
- International Journal of Rotating Machinery, 2021, p. 1, doi. 10.1155/2021/6691574
- Zhang, Wenchao;
- Shi, Liwei;
- Liu, Kaiwen;
- Li, Lintao;
- Jing, Jianning
- Article
34
- Mathematics (2227-7390), 2021, v. 9, n. 12, p. 1352, doi. 10.3390/math9121352
- Dmitrievskii, Vladimir;
- Prakht, Vladimir;
- Anuchin, Alecksey;
- Kazakbaev, Vadim
- Article
35
- Electronics (2079-9292), 2025, v. 14, n. 12, p. 2335, doi. 10.3390/electronics14122335
- Kelp, Keegan;
- Wright, Dawson;
- Stephens, Jacob;
- Dickens, James;
- Mankowski, John;
- Shaw, Zach;
- Neuber, Andreas
- Article
36
- Electronics (2079-9292), 2025, v. 14, n. 11, p. 2235, doi. 10.3390/electronics14112235
- Csizmadia, Miklós;
- Horváth, Tamás;
- Orosz, Tamás
- Article
37
- Electronics (2079-9292), 2025, v. 14, n. 8, p. 1642, doi. 10.3390/electronics14081642
- Liu, Zhixin;
- Tang, Chenqi;
- He, Yisong;
- Chen, Junquan
- Article
38
- Electronics (2079-9292), 2025, v. 14, n. 7, p. 1304, doi. 10.3390/electronics14071304
- Article
39
- Electronics (2079-9292), 2025, v. 14, n. 6, p. 1059, doi. 10.3390/electronics14061059
- Blanco-Ortiz, Juan;
- García-Martínez, Eduardo;
- González-Prieto, Ignacio;
- Duran, Mario J.
- Article
40
- Electronics (2079-9292), 2024, v. 13, n. 21, p. 4313, doi. 10.3390/electronics13214313
- Park, Hyun Ho;
- Song, Eakhwan;
- Kim, Jiseong;
- Kim, Cheolsoo
- Article
41
- Electronics (2079-9292), 2024, v. 13, n. 20, p. 4092, doi. 10.3390/electronics13204092
- Duan, Weiping;
- Zhang, Yuxiang;
- Liu, Shihao;
- Shen, Qian;
- Hou, Zhiwei;
- Chen, Renwen
- Article
42
- Electronics (2079-9292), 2024, v. 13, n. 18, p. 3772, doi. 10.3390/electronics13183772
- Zuo, Chao;
- Lai, Zhipeng;
- Wang, Zuoshuai;
- Wang, Jianxun;
- Xiao, Hanchen;
- Yang, Wentie;
- Geng, Pan;
- Chen, Meng
- Article
43
- Electronics (2079-9292), 2024, v. 13, n. 14, p. 2766, doi. 10.3390/electronics13142766
- Komeza, Krzysztof;
- Dems, Maria
- Article
44
- Electronics (2079-9292), 2024, v. 13, n. 13, p. 2495, doi. 10.3390/electronics13132495
- Article
45
- Electronics (2079-9292), 2024, v. 13, n. 11, p. 2219, doi. 10.3390/electronics13112219
- Prajzendanc, Pawel;
- Palka, Ryszard;
- Paplicki, Piotr;
- Wardach, Marcin;
- Cichowicz, Michal;
- Cierzniewski, Kamil;
- Dorobczynski, Lech;
- Gundabattini, Edison
- Article
46
- Electronics (2079-9292), 2024, v. 13, n. 9, p. 1733, doi. 10.3390/electronics13091733
- Hofbauer, Tobias;
- Denk, Frank
- Article
47
- Electronics (2079-9292), 2024, v. 13, n. 6, p. 1125, doi. 10.3390/electronics13061125
- Wang, Jintao;
- Hou, Yanjin;
- Shi, Zhuoqun;
- Sun, Qianfang;
- Guo, Yanhua;
- Cai, Shengkun;
- Liu, Zhizhen
- Article
48
- Electronics (2079-9292), 2023, v. 12, n. 22, p. 4631, doi. 10.3390/electronics12224631
- Li, Ming;
- Chen, Zilin;
- Mu, Haiqi;
- Lun, Shuxian
- Article
49
- Electronics (2079-9292), 2023, v. 12, n. 13, p. 2911, doi. 10.3390/electronics12132911
- Zhang, Yufeng;
- Zhang, Xueyi;
- Liu, Lin;
- Yan, Shilong;
- Wang, Wei;
- Jiao, Wenjie;
- Xu, Mingjun;
- Hu, Wenjing
- Article
50
- Electronics (2079-9292), 2023, v. 12, n. 13, p. 2867, doi. 10.3390/electronics12132867
- Zhang, Jiaxu;
- Liu, Junfeng;
- Wu, Hongbing
- Article