Works matching DE "LOW-voltage scanning electron microscopy"
Results: 21
Oxidation behavior of in situ synthesized TiB/Ti-Al composite.
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- Journal of Materials Science, 2005, v. 40, n. 24, p. 6553, doi. 10.1007/s10853-005-1688-2
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Photon cascade emission of Gd in Tm-doped and un-doped LiGd(PO) under low-voltage electron beam and vacuum ultraviolet excitation.
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- Applied Physics B: Lasers & Optics, 2010, v. 100, n. 4, p. 865, doi. 10.1007/s00340-010-3940-y
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Fine dispersed blends for compatibilizers for laminates of immiscible polymers.
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- Journal of Materials Science, 2000, v. 35, n. 20, p. 5255, doi. 10.1023/A:1004876925821
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Low voltage scanning electron microscopy and atomic force microscopy: state-of-the-art microscopy techniques for investigations of polymer single crystals.
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- e-Polymers, 2002, p. 1
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Characterization of electroplated FeSe thin films.
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- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 8, p. 727, doi. 10.1007/s10854-008-9794-y
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The demonstration of bacteria on and within the stratum corneum using scanning electron microscopy.
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- British Journal of Dermatology, 1980, v. 102, n. 3, p. 267, doi. 10.1111/j.1365-2133.1980.tb08139.x
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A comparative scanning electron microscopic study of the effect of three different rotary instruments on smear layer formation.
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- Journal of Oral Science, 2009, v. 51, n. 1, p. 55, doi. 10.2334/josnusd.51.55
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Highly Reproducible Secondary Electron Imaging under Electron Irradiation Using High-Pass Energy Filtering in Low-Voltage Scanning Electron Microscopy.
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- Microscopy & Microanalysis, 2012, v. 18, n. 2, p. 385, doi. 10.1017/S1431927611012852
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Sub-Ångstrom Low-Voltage Performance of a Monochromated, Aberration-Corrected Transmission Electron Microscope.
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- Microscopy & Microanalysis, 2010, v. 16, n. 5, p. 386, doi. 10.1017/S1431927610093670
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Sub-Ångstrom Low-Voltage Performance of a Monochromated, Aberration-Corrected Transmission Electron Microscope.
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- Microscopy & Microanalysis, 2010, v. 16, n. 4, p. 386, doi. 10.1017/S1431927610093670
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Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes.
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- Journal of Histochemistry & Cytochemistry, 2020, v. 68, n. 6, p. 389, doi. 10.1369/0022155420929438
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NANO AND MICROSTRUCTURES OF SELENIUM OXIDE BY THERMAL EVAPORATION.
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- Chalcogenide Letters, 2009, v. 6, n. 9, p. 517
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Analytical advances in the SEM.
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- Analytical & Bioanalytical Chemistry, 2003, v. 375, n. 1, p. 38, doi. 10.1007/s00216-002-1615-1
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Improved Dyeing Properties of SiCi<sub>4</sub> (ST)-Plasma Treated Polyester Fabrics.
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- Textile Chemist & Colorist, 1996, v. 28, n. 6, p. 17
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Evaluating sharpness functions for automated scanning electron microscopy.
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- Journal of Microscopy, 2010, v. 240, n. 1, p. 38, doi. 10.1111/j.1365-2818.2010.03383.x
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Static and dynamic experiments in cryo-electron microscopy: comparative observations using high-vacuum, low-voltage and low-vacuum SEM.
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- Journal of Microscopy, 2004, v. 213, n. 2, p. 198, doi. 10.1111/j.1365-2818.2004.01282.x
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Synthesis and characterization of modified epoxy resins and novel E-glass-/spectra-reinforced composites.
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- High Performance Polymers, 2017, v. 29, n. 3, p. 328, doi. 10.1177/0954008316643767
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Determination of Swelling and Shrinkage Properties of Undisturbed Expansive Soils.
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- Geotechnical & Geological Engineering, 2010, v. 28, n. 4, p. 413, doi. 10.1007/s10706-010-9301-0
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Imaging of Liver Tissues Using a Combination of Silver Impregnation and Low-Vacuum Scanning Electron Microscopy; A Simple Method for the High-Resolution Visualization of Reticulin Structures with Applicability to a Quantitative Analysis.
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- Yonago Acta Medica, 2023, v. 66, n. 1, p. 78, doi. 10.33160/yam.2023.02.009
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Synthesis and characterization of new biopolymeric microcapsules containing DEHPA--TOPO extractants for separation of uranium from phosphoric acid solutions.
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- Journal of Microencapsulation, 2011, v. 28, n. 4, p. 248, doi. 10.3109/02652048.2011.559282
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Simple separations of topographic and material contrasts using one annular type in-lens detector of low-voltage SEM.
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- Surface & Interface Analysis: SIA, 2016, v. 48, n. 7, p. 470, doi. 10.1002/sia.5909
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