Works matching DE "LEAD-free electronics manufacturing processes"
1
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 2, p. 501, doi. 10.1007/s10854-011-0425-7
- Article
2
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 4, p. 400, doi. 10.1007/s10854-010-0150-7
- Moshrefi-Torbati, M.;
- Swingler, J.
- Article
3
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 275, doi. 10.1007/s10854-007-9292-7
- Jun Shen;
- Shiqiang Lai;
- Yongchang Liu;
- Houxiu Gao;
- Jun Wei
- Article
4
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 247, doi. 10.1007/s10854-007-9279-4
- Wan, J. B.;
- Liu, Y. C.;
- Wei, C.;
- Gao, Z. M.;
- Ma, C. S.
- Article
5
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 1-3, p. 259
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6
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 1-3, p. 331
- Karl Puttlitz;
- George Galyon
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7
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 1-3, p. 229
- Michael Osterman;
- Abhijit Dasgupta
- Article
8
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 1-3, p. 307
- Article
9
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 1-3, p. 211
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10
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 1-3, p. 93
- Paul Vianco;
- Jerome Rejent;
- Arlo Fossum;
- Michael Neilsen
- Article
11
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 1-3, p. 19
- Sinn-Wen Chen;
- Chao-Hong Wang;
- Shih-Kang Lin;
- Chen-Nan Chiu
- Article
12
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 1-3, p. 155
- Article
13
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 1-3, p. 147
- Article
14
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 1-3, p. 175
- Article
15
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 1-3, p. 319
- Article
16
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 1-3, p. 247
- Seung-Hyun Chae;
- Xuefeng Zhang;
- Kuan-Hsun Lu;
- Huang-Lin Chao;
- Paul Ho;
- Min Ding;
- Peng Su;
- Trent Uehling;
- Lakshmi Ramanathan
- Article
17
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 1-3, p. 191
- Article
18
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 1-3, p. 39
- Article
19
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 1-3, p. 3
- H. Ipser;
- H. Flandorfer;
- Ch. Luef;
- C. Schmetterer;
- U. Saeed
- Article
20
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 1-3, p. 347
- Karl Puttlitz;
- George Galyon
- Article
21
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 1-3, p. 129
- Article
22
- EE: Evaluation Engineering, 2006, v. 45, n. 6, p. 48
- Article
23
- EE: Evaluation Engineering, 2004, v. 43, n. 12, p. 38
- Article
24
- Applied Physics A: Materials Science & Processing, 2007, v. 88, n. 1, p. 209, doi. 10.1007/s00339-007-3971-3
- Edwards, G.C.;
- Choy, S.H.;
- Chan, H.L.W.;
- Scott, D.A.;
- Batten, A.
- Article
25
- Applied Physics A: Materials Science & Processing, 2006, v. 84, n. 3, p. 313, doi. 10.1007/s00339-006-3625-x
- Choy, S. H.;
- Wang, X. X.;
- Chong, C. P.;
- Chan, H. L. W.;
- Liu, P. C. K.;
- Choy, C. L.
- Article
26
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2519, doi. 10.1007/s11664-012-2180-9
- Yazzie, K.E.;
- Williams, J.J.;
- Chawla, N.
- Article
27
- Journal of Electronic Materials, 2012, v. 41, n. 2, p. 204, doi. 10.1007/s11664-011-1808-5
- Snugovsky, Polina;
- Meschter, Stephan;
- Bagheri, Zohreh;
- Kosiba, Eva;
- Romansky, Marianne;
- Kennedy, Jeffrey
- Article
28
- Journal of Electronic Materials, 2012, v. 41, n. 1, p. 153, doi. 10.1007/s11664-011-1740-8
- Lin, T.Y.;
- Liao, C.N.;
- Wu, Albert
- Article
29
- Journal of Electronic Materials, 2012, v. 41, n. 1, p. 86, doi. 10.1007/s11664-011-1757-z
- Article
30
- Journal of Electronic Materials, 2011, v. 40, n. 7, p. 1517, doi. 10.1007/s11664-011-1632-y
- Laurila, T.;
- Karppinen, J.;
- Vuorinen, V.;
- Paul, A.;
- Paulasto-Kröckel, M.
- Article
31
- Journal of Electronic Materials, 2011, v. 40, n. 7, p. 1533, doi. 10.1007/s11664-011-1639-4
- Leinenbach, C.;
- Valenza, F.;
- Giuranno, D.;
- Elsener, H.;
- Jin, S.;
- Novakovic, R.
- Article
32
- Journal of Electronic Materials, 2011, v. 40, n. 7, p. 1556, doi. 10.1007/s11664-011-1650-9
- Hu, Jing;
- Luo, Tingbi;
- Hu, Anmin;
- Li, Ming;
- Mao, Dali
- Article
33
- Journal of Electronic Materials, 2011, v. 40, n. 6, p. 1409, doi. 10.1007/s11664-011-1534-z
- Nguyen, T.;
- Yu, D.;
- Park, S.
- Article
34
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2553, doi. 10.1007/s11664-010-1373-3
- Harcuba, Petr;
- Janeček, Miloš
- Article
35
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2503, doi. 10.1007/s11664-010-1389-8
- Article
36
- 2010
- Dalili, Neda;
- He, Anqiang;
- Liu, Qi;
- Ivey, Douglas
- Correction Notice
37
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2643, doi. 10.1007/s11664-010-1313-2
- Chang, Jaewon;
- Seo, Sun-Kyoung;
- Lee, Hyuck
- Article
38
- Journal of Electronic Materials, 2010, v. 39, n. 11, p. 2471, doi. 10.1007/s11664-010-1246-9
- Yuan, Y.;
- Zhou, X.;
- Zhao, C.;
- Li, B.;
- Zhang, S.
- Article
39
- Journal of Electronic Materials, 2009, v. 38, n. 6, p. 815, doi. 10.1007/s11664-009-0761-z
- Weiqiang Wang;
- Choubey, Anupam;
- Azarian, Michael;
- Pecht, Michael
- Article
40
- Journal of Electronic Materials, 2009, v. 38, n. 6, p. 843, doi. 10.1007/s11664-009-0772-9
- Nousiainen, Olli;
- Kangasvieri, Tero;
- Rautioaho, Risto;
- Vähäkangas, Jouko
- Article
41
- Journal of Electronic Materials, 2009, v. 38, n. 6, p. 828, doi. 10.1007/s11664-008-0611-4
- Zhao, N.;
- Pan, X. M.;
- D. Q. Yu;
- Ma, H. T.;
- L. Wang
- Article
42
- Journal of Electronic Materials, 2009, v. 38, n. 2, p. 284, doi. 10.1007/s11664-008-0590-5
- Hui Zhao;
- Nalagatla, Dinesh;
- Sekulic, Dusan
- Article
43
- Journal of Electronic Materials, 2009, v. 38, n. 2, p. 330, doi. 10.1007/s11664-008-0576-3
- Mahmudi, R.;
- Geranmayeh, A.R.;
- Noori, H.;
- Taghaddosi, M.
- Article
44
- Journal of Electronic Materials, 2009, v. 38, n. 1, p. 39, doi. 10.1007/s11664-008-0529-x
- Kim, Dong;
- Cho, Moon;
- Seo, Sun-Kyoung;
- Lee, Hyuck
- Article
45
- Journal of Electronic Materials, 2009, v. 38, n. 1, p. 88, doi. 10.1007/s11664-008-0579-0
- Lai, R.;
- Lin, K.;
- Salam, B.
- Article
46
- Journal of Electronic Materials, 2008, v. 37, n. 6, p. 806, doi. 10.1007/s11664-008-0408-5
- Kumamoto, Seishi;
- Sakural, Hitoshi;
- Kukimoto, Youichi;
- Suganuma, Katsuaki
- Article
47
- Journal of Electronic Materials, 2008, v. 37, n. 6, p. 880, doi. 10.1007/s11664-008-0400-0
- Xu, Luhua;
- Pang, John H. L.;
- Che, Faxing
- Article
48
- Journal of Electronic Materials, 2008, v. 37, n. 6, p. 860, doi. 10.1007/s11664-008-0399-2
- Babaghorbani, P.;
- Gupta, M.
- Article
49
- Journal of Electronic Materials, 2008, v. 37, n. 6, p. 845, doi. 10.1007/s11664-008-0387-6
- Article
50
- Journal of Electronic Materials, 2008, v. 37, n. 4, p. 515, doi. 10.1007/s11664-008-0379-6
- Nai, S. M. L.;
- Wei, J.;
- Gupta, M.
- Article