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Works matching DE "JEOL USA Inc."

Results: 23

1

The Formation and Utility of Sub-Angstrom to Nanometer-Sized Electron Probes in the Aberration-Corrected Transmission Electron Microscope at the University of Illinois.

Published in:

Microscopy & Microanalysis, 2010, v. 16, n. 2, p. 183, doi. 10.1017/S1431927610000085

By:

Jianguo Wen;
Mabon, James;
Changhui Lei;
Burdin, Steve;
Sammann, Ernie;
Petrov, Ivan;
Shah, Amish B.;
Chobpattana, Varistha;
Jiong Zhang;
Ke Ran;
Jan-Min Zuo;
Mishina, Satoshi;
Aoki, Toshihiro

Publication type:

Article

2

M&M 2008 Sponsors.

Published in:: Microscopy & Microanalysis, 2008, v. 14, n. S1, p. 30, doi. 10.1017/S1431927608080471
Publication type:: Article

3

High sensitivity GC-TOF mass spectrometer.

Published in:: 2009
Publication type:: Product Review

4

JEOL USA receives third Omega Award.

Published in:: LC-GC Europe, 2003, v. 16, n. 6, p. 326
Publication type:: Article

5

JEOL USA opens new facility.

Published in:: LC-GC Europe, 2003, v. 16, n. 1, p. 8
Publication type:: Article

6

JEOL Correlative Microscope Wins MT-10 Award.

Published in:: Electronic Device Failure Analysis, 2011, v. 13, n. 2, p. 44
Publication type:: Article

7

JEOL Cold Field-Emission Gun Enhances Atomic-Level Resolution.

Published in:

Electronic Device Failure Analysis, 2010, v. 12, n. 4, p. 40

By:

Wagner, Larry

Publication type:

Article

8

Product News.

Published in:: Journal of Failure Analysis & Prevention, 2016, v. 16, n. 4, p. 543, doi. 10.1007/s11668-016-0137-7
Publication type:: Article

9

Product News.

Published in:: Journal of Failure Analysis & Prevention, 2012, v. 12, n. 4, p. 361, doi. 10.1007/s11668-012-9586-9
Publication type:: Article

10

Industry Updates.

Published in:: Journal of Failure Analysis & Prevention, 2008, v. 8, n. 5, p. 449, doi. 10.1007/s11668-008-9176-z
Publication type:: Article

11

briefs.

Published in:: Advanced Materials & Processes, 2010, v. 168, n. 10, p. 17
Publication type:: Article

12

TESTING CHARACTERIZATION.

Published in:: Advanced Materials & Processes, 2010, v. 168, n. 9, p. 8
Publication type:: Article

13

briefs.

Published in:: Advanced Materials & Processes, 2010, v. 168, n. 8, p. 12
Publication type:: Article

14

TESTING CHARACTERIZATION.

Published in:: 2010
Publication type:: Product Review

15

BRIEFS.

Published in:: Advanced Materials & Processes, 2009, v. 167, n. 10, p. 10
Publication type:: Article

16

TESTING CHARACTERIZATION.

Published in:: Advanced Materials & Processes, 2009, v. 167, n. 5, p. 22
Publication type:: Article

17

Products and Literature.

Published in:: 2009
Publication type:: Product Review

18

MultiBeam SEM/FIB designed for micro milling and SEM imaging.

Published in:: 2008
Publication type:: Product Review

19

PRODUCTS/LITERATURE.

Published in:: Advanced Materials & Processes, 2007, v. 165, n. 2, p. 74
Publication type:: Article

20

Recycling results in award-winning chair.

Published in:: Advanced Materials & Processes, 2005, v. 163, n. 8, p. 16
Publication type:: Article

21

Corporate Members.

Published in:: 2016
Publication type:: Directory

22

Scanning Auger microprobe enables high-resolution analysis.

Published in:: Advanced Materials & Processes, 2004, v. 162, n. 12, p. 37
Publication type:: Article

23

OVERVIEW OF IMAGING EQUIPMENT.

Published in:: Advanced Materials & Processes, 2004, v. 162, n. 1, p. 63
Publication type:: Article