Works matching DE "ION beams"
1
- Applied Physics A: Materials Science & Processing, 2025, v. 131, n. 6, p. 1, doi. 10.1007/s00339-025-08540-9
- Lingenfelder, Lukas P.;
- Finzel, Annemarie;
- Dornberg, Gregor;
- Zajadacz, Joachim;
- Frost, Frank
- Article
2
- Instruments & Experimental Techniques, 2025, v. 68, n. 1, p. 38, doi. 10.1134/S0020441225700216
- Ryabchikov, A. I.;
- Dektyarev, S. V.;
- Gurulev, A. V.
- Article
3
- Instruments & Experimental Techniques, 2025, v. 68, n. 1, p. 19, doi. 10.1134/S0020441225700058
- Balabaev, A. N.;
- Vasiliev, A. A.;
- Kulevoy, T. V.;
- Losev, A. A.;
- Satov, Yu. A.;
- Khrisanov, I. A.;
- Shumshurov, A. V.
- Article
4
- European Physical Journal D (EPJ D), 2025, v. 79, n. 5, p. 1, doi. 10.1140/epjd/s10053-025-01002-0
- Lin, Zihao;
- Li, Xiangzhi;
- Chen, Guanglong;
- Zhang, Peilei;
- Cao, Yunjiu;
- Ren, Li;
- Shao, Huili;
- Zhao, Xinxin
- Article
5
- npj Heritage Science, 2025, v. 13, n. 1, p. 1, doi. 10.1038/s40494-025-01799-4
- Yu, Xiaohong;
- Liang, Chenxi;
- Li, Wantao;
- Li, Linhui;
- Wang, Wei;
- Li, Yuniu
- Article
6
- Surface Engineering, 2025, v. 41, n. 3, p. 431, doi. 10.1177/02670844251340409
- Article
7
- Materials (1996-1944), 2025, v. 18, n. 10, p. 2316, doi. 10.3390/ma18102316
- Kupchishin, Anatoliy I.;
- Niyazov, Marat N.;
- Ghyngazov, Sergey A.
- Article
8
- Materials (1996-1944), 2025, v. 18, n. 10, p. 2258, doi. 10.3390/ma18102258
- Wen, Shuyu;
- Zhu, Yuan-Hao;
- Steuer, Oliver;
- Shaikh, Mohd Saif;
- Prucnal, Slawomir;
- Hübner, René;
- Worbs, Andreas;
- He, Li;
- Helm, Manfred;
- Zhou, Shengqiang;
- Luo, Jun-Wei;
- Berencén, Yonder
- Article
9
- Atmospheric Measurement Techniques, 2025, v. 18, n. 9, p. 2137, doi. 10.5194/amt-18-2137-2025
- Nava, Silvia;
- Vecchi, Roberta;
- Prati, Paolo;
- Bernardoni, Vera;
- Cadeo, Laura;
- Calzolai, Giulia;
- Carraresi, Luca;
- Cialdai, Carlo;
- Chiari, Massimo;
- Crova, Federica;
- Forello, Alice;
- Fratticioli, Cosimo;
- Giardi, Fabio;
- Manetti, Marco;
- Massabò, Dario;
- Mazzei, Federico;
- Repetto, Luca;
- Valli, Gianluigi;
- Vernocchi, Virginia;
- Lucarelli, Franco
- Article
10
- Soft Materials, 2019, v. 17, n. 4, p. 368, doi. 10.1080/1539445X.2019.1609512
- Jeong, Hae-Chang;
- Won, Jonghoon;
- Lee, Ju Hwan;
- Kim, Dong Hyun;
- Lee, Dong Wook;
- Oh, Byeong-Yun;
- Han, Jeong-Min;
- Seo, Dae-Shik
- Article
11
- Soft Materials, 2019, v. 17, n. 1, p. 32, doi. 10.1080/1539445X.2018.1545669
- Lee, Ju Hwan;
- Won, Jonghoon;
- Jeong, Hae-Chang;
- Kim, Dong Hyun;
- Lee, Dong Wook;
- Oh, Byeong-Yun;
- Han, Jeong-Min;
- Kim, Tae Wan;
- Seo, Dae-Shik
- Article
12
- Soft Materials, 2017, v. 15, n. 4, p. 325, doi. 10.1080/1539445X.2017.1365727
- Jeong, Hae-Chang;
- Lee, Ju Hwan;
- Kim, Dong Hyun;
- Lee, Dong Wook;
- Oh, Byeong-Yun;
- Han, Jeong-Min;
- Seo, Dae-Shik
- Article
13
- Soft Materials, 2016, v. 14, n. 3, p. 148, doi. 10.1080/1539445X.2016.1163268
- Jeong, Hae-Chang;
- Park, Hong-Gyu;
- Lee, Ju Hwan;
- Jang, Sang Bok;
- Oh, Byeong-Yun;
- Seo, Dae-Shik
- Article
14
- Journal of Electronic Materials, 2025, v. 54, n. 1, p. 220, doi. 10.1007/s11664-024-11565-0
- Deepika;
- Gupta, Deepika;
- Chauhan, Vishnu;
- Kumar, Satyendra;
- Singh, Paramjit;
- Sharma, S. K.;
- Kumar, Shalendra;
- Kumar, Rajesh
- Article
15
- Journal of Electronic Materials, 2025, v. 54, n. 1, p. 151, doi. 10.1007/s11664-024-11549-0
- Article
16
- Journal of Electronic Materials, 2024, v. 53, n. 12, p. 7456, doi. 10.1007/s11664-024-11458-2
- Bharti, Aniket;
- Gupta, Deepika;
- Deepika;
- Khanna, Manoj Kumar;
- Kumar, Rajesh
- Article
17
- Journal of Electronic Materials, 2024, v. 53, n. 10, p. 5937, doi. 10.1007/s11664-024-11162-1
- Article
18
- Surface Engineering, 2019, v. 35, n. 1, p. 54, doi. 10.1080/02670844.2018.1454997
- Wang, Hongjun;
- Li, Qintao;
- Wu, Xiujuan
- Article
19
- Surface Engineering, 2013, v. 29, n. 7, p. 543, doi. 10.1179/1743294413Y.0000000146
- Kumar, T;
- Kumar, M;
- Verma, S;
- Kanjilal, D
- Article
20
- Surface Engineering, 2013, v. 29, n. 4, p. 318, doi. 10.1179/1743294412Y.0000000100
- Yu, C Y;
- Wang, S B;
- Li, T B;
- Zhang, Z X
- Article
21
- Angewandte Chemie, 2014, v. 126, n. 46, p. 12736, doi. 10.1002/ange.201406660
- Anyin Li;
- Baird, Zane;
- Bag, Soumabha;
- Sarkar, Depanjan;
- Prabhath, Anupama;
- Pradeep, Thalappil;
- Cooks, R. Graham
- Article
22
- Angewandte Chemie, 2014, v. 126, n. 23, p. 5842, doi. 10.1002/ange.201482313
- Article
23
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 10, p. 9396, doi. 10.1007/s10854-019-01270-8
- Kuo, Bing-Hau;
- Tsai, Du-Cheng;
- Huang, Yen-Lin;
- Hsu, Po-Chun;
- Chuang, Tung-Han;
- Lee, Jun-Der;
- Tsai, Hsing-Hua;
- Shieu, Fuh-Sheng
- Article
24
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 5, p. 4880, doi. 10.1007/s10854-019-00782-7
- Ferrandis, Philippe;
- Kanoun, Mehdi;
- André, Bernard
- Article
25
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 13, p. 11013, doi. 10.1007/s10854-018-9183-0
- Saxena, Nupur;
- Kumar, Pragati;
- Gupta, Vinay;
- Kanjilal, D.
- Article
26
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 9, p. 7621, doi. 10.1007/s10854-018-8754-4
- Oza, Abha H.;
- Chopra, Vibha;
- Dhoble, N. S.;
- Dhoble, S. J.
- Article
27
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 20, p. 15293, doi. 10.1007/s10854-017-7410-8
- Zavarian, Ali;
- Țălu, Ștefan;
- Hafezi, Fatemeh;
- Achour, Amine;
- Luna, Carlos;
- Naderi, Sirvan;
- Mardani, Mohsen;
- Arman, Ali;
- Ahmadpourian, Azin
- Article
28
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 2, p. 1938, doi. 10.1007/s10854-015-3976-1
- Pedersen, Kristian;
- Østergaard, Lotte;
- Kristensen, Peter;
- Ghimire, Pramod;
- Popok, Vladimir;
- Pedersen, Kjeld
- Article
29
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 12, p. 5630, doi. 10.1007/s10854-014-2352-x
- Rana, Pallavi;
- Chauhan, R.
- Article
30
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 1, p. 438, doi. 10.1007/s10854-013-1607-2
- Liang, Guang-Xing;
- Fan, Ping;
- Chi, Jing-Rong;
- Zheng, Zhuang-Hao;
- Zhang, Dong-Ping
- Article
31
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 12, p. 4919, doi. 10.1007/s10854-013-1498-2
- Pandey, Saurabh Kumar;
- Pandey, Sushil Kumar;
- Verma, Shruti;
- Gupta, M.;
- Sathe, V.;
- Mukherjee, Shaibal
- Article
32
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 11, p. 4302, doi. 10.1007/s10854-013-1402-0
- Kaur, Amandeep;
- Chauhan, R.
- Article
33
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 7, p. 2541, doi. 10.1007/s10854-013-1130-5
- Pandey, Sushil;
- Pandey, Saurabh;
- Mukherjee, C.;
- Mishra, P.;
- Gupta, M.;
- Barman, S.;
- D'Souza, S.;
- Mukherjee, Shaibal
- Article
34
- Space Science Reviews, 2021, v. 217, n. 3, p. 1, doi. 10.1007/s11214-021-00817-8
- Trattner, K. J.;
- Petrinec, S. M.;
- Fuselier, S. A.
- Article
35
- Measurement Techniques, 2024, v. 67, n. 9, p. 660, doi. 10.1007/s11018-025-02386-6
- Article
36
- Measurement Techniques, 2013, v. 56, n. 1, p. 41, doi. 10.1007/s11018-013-0156-7
- Bulygin, F.;
- Krutikov, V.;
- Bilenko, I.;
- Ilyushin, Ya.;
- Lyaskovskii, V.
- Article
37
- Inorganic Materials, 2020, v. 56, n. 10, p. 1059, doi. 10.1134/S0020168520100052
- Ievlev, V. M.;
- Dontsov, A. I.;
- Morozova, N. B.;
- Roshan, N. R.;
- Serbin, O. V.;
- Prizhimov, A. S.;
- Solntsev, K. A.
- Article
38
- Inorganic Materials, 2017, v. 53, n. 9, p. 930, doi. 10.1134/S0020168517090060
- Domashevskaya, E.;
- Builov, N.;
- Terekhov, V.;
- Barkov, K.;
- Sitnikov, V.;
- Kalinin, Yu.
- Article
39
- Inorganic Materials, 2015, v. 51, n. 3, p. 197, doi. 10.1134/S0020168515020144
- Pashchenko, A.;
- Chebotarev, S.;
- Lunin, L.
- Article
40
- Inorganic Materials, 2013, v. 49, n. 5, p. 435, doi. 10.1134/S0020168513050075
- Lunin, L.;
- Chebotarev, S.;
- Pashchenko, A.
- Article
41
- Electrochem, 2022, v. 3, n. 2, p. 198, doi. 10.3390/electrochem3020012
- Jiang, Yiming;
- Chen, Chun-Yi;
- Luo, Xun;
- Yamane, Daisuke;
- Mizoguchi, Masanori;
- Kudo, Osamu;
- Maeda, Ryu;
- Sone, Masato;
- Chang, Tso-Fu Mark
- Article
42
- Feed Research, 2022, v. 45, n. 19, p. 78, doi. 10.13557/j.cnki.issn1002-2813.2022.19.016
- YU Jing;
- CUI Jin-na;
- HU Jian-hua;
- LIU Zhan-ying
- Article
43
- Communications Biology, 2021, v. 4, n. 1, p. 1, doi. 10.1038/s42003-021-02361-1
- Patwa, Aalok;
- Yamashita, Rikiya;
- Long, Jin;
- Risom, Tyler;
- Angelo, Michael;
- Keren, Leeat;
- Rubin, Daniel L.
- Article
44
- Chinese Journal of Inorganic Analytical Chemistry / Zhongguo Wuji Fenxi Huaxue, 2025, v. 15, n. 1, p. 56, doi. 10.20236/j.CJIAC.2025.01.005
- Article
45
- Acta Polytechnica CTU Proceedings, 2020, v. 27, p. 1, doi. 10.14311/APP.2020.27.0001
- VOKOUN, DAVID;
- MAŇÁK, JAN;
- TESAŘ, KAREL;
- HABR, STANISLAV
- Article
46
- Bioengineering (Basel), 2022, v. 9, n. 1, p. 30, doi. 10.3390/bioengineering9010030
- Zanza, Alessio;
- Seracchiani, Marco;
- Reda, Rodolfo;
- Miccoli, Gabriele;
- Testarelli, Luca;
- Di Nardo, Dario
- Article
47
- Technical Physics Letters, 2023, v. 49, p. S288, doi. 10.1134/S1063785023010285
- Payusov, A. S.;
- Mitrofanov, M. I.;
- Kornyshov, G. O.;
- Serin, A. A.;
- Voznyuk, G. V.;
- Kulagina, M. M.;
- Evtikhiev, V. P.;
- Gordeev, N. Yu.;
- Maximov, M. V.;
- Breuer, S.
- Article
48
- Basic & Clinical Pharmacology & Toxicology, 2014, v. 115, n. 1, p. 129, doi. 10.1111/bcpt.12205
- Nygren, Håkan;
- Dahlén, Gunnar;
- Malmberg, Per
- Article
49
- Atoms (2218-2004), 2018, v. 6, n. 4, p. 66, doi. 10.3390/atoms6040066
- Benis, Emmanouil P.;
- Madesis, Ioannis;
- Laoutaris, Angelos;
- Nanos, Stefanos;
- Zouros, Theo J. M.
- Article
50
- Atoms (2218-2004), 2018, v. 6, n. 4, p. 59, doi. 10.3390/atoms6040059
- Kraft-Bermuth, Saskia;
- Hengstler, Daniel;
- Egelhof, Peter;
- Enss, Christian;
- Fleischmann, Andreas;
- Keller, Michael;
- Stöhlker, Thomas
- Article