Works matching DE "ION beam lithography"

Results: 39

Next-generation litho progress, innovative technologies at MRS.

Published in:: Solid State Technology, 2001, v. 44, n. 2, p. 32
Publication type:: Article

MEDEA's lithography project.

Published in:: Solid State Technology, 1998, v. 41, n. 3, p. S3
Publication type:: Article

Focused ion beam mask repair.

Published in:

Solid State Technology, 1998, v. 41, n. 3, p. 61

By:

Morgan, John C.

Publication type:

Article

Expert System Design of beam spot size measurements in FIB system.

Published in:

Iraqi Journal for Electrical & Electronic Engineering, 2010, v. 6, n. 1, p. 167, doi. 10.33762/eeej.2010.54889

By:

Ali, Fadhil A.

Publication type:

Article

Temperature and Current Dependent Matching Fields in Superconducting NbN Film.

Published in:

Journal of Superconductivity & Novel Magnetism, 2011, v. 24, n. 1/2, p. 919, doi. 10.1007/s10948-010-0885-7

By:

Kamran, M.;
Anis-ur-Rehman, M.;
Mansoor, Khalid;
He, S. K.;
Qiu, X. G.

Publication type:

Article

FOCUSED ION BEAM FABRICATION OF ELECTROCHEMICALLY SYNTHESIZED NANOWIRE-BASED ELECTRODES.

Published in:

Anadolu University Journal of Sciences & Technology, 2009, v. 10, n. 1, p. 37

By:

VALIZADEH, S.

Publication type:

Article

Decrease in the ignition pressure of anomalous glow discharge in a magnetron with an ion-beam-irradiated cathode.

Published in:

Instruments & Experimental Techniques, 2009, v. 52, n. 1, p. 99, doi. 10.1134/S0020441209010151

By:

Semenov, A.;
Semenova, I.

Publication type:

Article

High-Throughput Top-Down Fabrication of Uniform Magnetic Particles.

Published in:

PLoS ONE, 2012, v. 7, n. 5, p. 1, doi. 10.1371/journal.pone.0037440

By:

Litvinov, Julia;
Nasrullah, Azeem;
Sherlock, Timothy;
Yi-Ju Wang;
Ruchhoeft, Paul;
Willson, Richard C.

Publication type:

Article

FIB Lithography Challenges of Si3N4/GaN Mask Preparation for Selective Epitaxy.

Published in:

Semiconductors, 2018, v. 52, n. 16, p. 2114, doi. 10.1134/S1063782618160212

By:

Mitrofanov, M. I.;
Levitskii, I. V.;
Voznyuk, G. V.;
Tatarinov, E. E.;
Rodin, S. N.;
Lundin, W. V.;
Evtikhiev, V. P.;
Mizerov, M.N.

Publication type:

Article

Electrical transport properties of focused ion beam lithography Au contacts on PbTiO3 nanorods.

Published in:

Journal of Advanced Dielectrics, 2019, v. 9, n. 4, p. N.PAG, doi. 10.1142/S2010135X19500280

By:

Wang, Jian;
Chen, Bin;
Deng, Heming;
Zhang, Xiaojun;
Li, Xiaoguang;
Cao, Yuancheng;
Hu, Yongming

Publication type:

Article

Scanning probe-based high-accuracy overlay alignment concept for lithography applications.

Published in:

Applied Physics A: Materials Science & Processing, 2017, v. 123, n. 1, p. 1, doi. 10.1007/s00339-016-0681-8

By:

Ishchuk, Valentyn;
Guliyev, Elshad;
Aydogan, Cemal;
Buliev, Ivan;
Kaestner, Marcus;
Ivanov, Tzvetan;
Ahmad, Ahmad;
Reum, Alexander;
Lenk, Steve;
Lenk, Claudia;
Nikolov, Nikolay;
Glinsner, Thomas;
Rangelow, Ivo

Publication type:

Article

Sub-10 nm writing: focused electron beam-induced deposition in perspective.

Published in:

Applied Physics A: Materials Science & Processing, 2014, v. 117, n. 4, p. 1615, doi. 10.1007/s00339-014-8588-8

By:

Dorp, W.

Publication type:

Article

The rapid prototyping of textured amorphous surfaces for the graphoepitaxial deposition of CdTe films using focused ion beam lithography.

Published in:

Applied Physics A: Materials Science & Processing, 2011, v. 102, n. 2, p. 259, doi. 10.1007/s00339-010-6171-5

By:

Neretina, S.;
Hughes, R.;
Stortz, G.;
Preston, J.;
Mascher, P.

Publication type:

Article

Three-dimensional ultrastructural analysis of development at the supraspinatus insertion by using focused ion beam/scanning electron microscope tomography in rats.

Published in:

Journal of Orthopaedic Research, 2016, v. 34, n. 6, p. 969, doi. 10.1002/jor.23111

By:

Kanazawa, Tomonoshin;
Gotoh, Masafumi;
Ohta, Keisuke;
Shiba, Naoto;
Nakamura, Kei‐ichiro

Publication type:

Article

Focused, Nanoscale Electron-Beam-Induced Deposition and Etching.

Published in:

Critical Reviews in Solid State & Materials Science, 2006, v. 31, n. 3, p. 55, doi. 10.1080/10408430600930438

By:

Randolph, S. J.;
Fowlkes, J. D.;
Rack, P. D.

Publication type:

Article

Direct patterning of poly(acrylic acid) on polymer surfaces by ion beam lithography for the controlled adhesion of mammalian cells.

Published in:

Biotechnology Letters, 2014, v. 36, n. 10, p. 2135, doi. 10.1007/s10529-014-1569-3

By:

Hwang, In-Tae;
Oh, Min-Suk;
Jung, Chan-Hee;
Choi, Jae-Hak

Publication type:

Article

Shape-modification of patterned nanoparticles by an ion beam treatment.

Published in:

Scientific Reports, 2015, p. 8523, doi. 10.1038/srep08523

By:

Heo, Kyong Chan;
Gwag, Jin Seog

Publication type:

Article

Not so small.

Published in:: Nature Photonics, 2014, v. 8, n. 12, p. 877, doi. 10.1038/nphoton.2014.282
Publication type:: Article

Focused Ion Beam Lithography of Nanophotonic Structures.

Published in:

2012

By:

Sanabia, J.E.;
Nadzeyka, A.;
Bauerdick, S.;
Peto, L.;
Nouvertné, F.

Publication type:

Abstract

Direct-write Focused Ion Beam Lithography.

Published in:

2010

By:

Joshi-Imre, A.;
Ocola, L. E.;
Klingfus, J.

Publication type:

Abstract

Direct Insights on Flax Fiber Structure by Focused Ion Beam Microscopy.

Published in:

Microscopy & Microanalysis, 2010, v. 16, n. 2, p. 175, doi. 10.1017/S1431927609991292

By:

Domenges, Bernadette;
Charlet, Karine

Publication type:

Article

3D Volumetric Energy Deposition of Focused Helium Ion Beam Lithography: Visualization, Modeling, and Applications in Nanofabrication.

Published in:

Advanced Materials Interfaces, 2018, v. 5, n. 12, p. 1, doi. 10.1002/admi.201800203

By:

Cai, Jingxuan;
Zhu, Zhouyang;
Alkemade, Paul F. A.;
van Veldhoven, Emile;
Wang, Qianjin;
Ge, Haixiong;
Rodrigues, Sean P.;
Cai, Wenshan;
Li, Wen‐Di

Publication type:

Article

SCANNING ION MICROBEAM ANALYSIS OF DIFFUSION IN IN-MOUTH DRUG RELEASE POLYMERS.

Published in:

International Journal of PIXE, 2005, v. 15, n. 3/4, p. 161, doi. 10.1142/S0129083505000477

By:

Massingham, G.;
Arslanoglu, R.;
Gauntlett, F. E.;
Rihawy, M. S.;
Smith, R. W.;
Clough, A. S.;
Braden, M.;
Patel, M. P.

Publication type:

Article

ISTFA '11 User's Group Summary.

Published in:: Electronic Device Failure Analysis, 2012, v. 14, n. 1, p. 27, doi. 10.31399/asm.edfa.2012-1.p027
Publication type:: Article

SEM for the 21st Century- Scanning Ion Microscopy.

Published in:

Electronic Device Failure Analysis, 2012, v. 14, n. 1, p. 4, doi. 10.31399/asm.edfa.2012-1.p004

By:

Joy, David C.

Publication type:

Article

Around the bend.

Published in:

Nature Materials, 2011, v. 10, n. 12, p. 902, doi. 10.1038/nmat3192

By:

Heber, Joerg

Publication type:

Article

Enhancement of Raman scattering in Subwave plasmonic nanostructures formed by ion-beam lithography.

Published in:

Crystallography Reports, 2014, v. 59, n. 1, p. 125, doi. 10.1134/S1063774514010088

By:

Mamichev, D.;
Kuznetsov, I.;
Andreev, A.;
Konovko, A.;
Drynkin, V.;
Smirnov, I.

Publication type:

Article

Vortex Lattice Instabilities in YBa2Cu3O7-x Nanowires.

Published in:

Materials (1996-1944), 2018, v. 11, n. 2, p. 211, doi. 10.3390/ma11020211

By:

Rouco, Víctor;
Massarotti, Davide;
Stornaiuolo, Daniela;
Papari, Gian Paolo;
Obradors, Xavier;
Puig, Teresa;
Tafuri, Francesco;
Palau, Anna

Publication type:

Article

Development and Characterization of a Diamond-Insulated Graphitic Multi Electrode Array Realized with Ion Beam Lithography.

Published in:

Sensors (14248220), 2015, v. 15, n. 1, p. 515, doi. 10.3390/s150100515

By:

Picollo, Federico;
Battiato, Alfio;
Carbone, Emilio;
Croin, Luca;
Enrico, Emanuele;
Forneris, Jacopo;
Gosso, Sara;
Olivero, Paolo;
Pasquarelli, Alberto;
Carabelli, Valentina

Publication type:

Article

All chopped up.

Published in:

Nature, 2001, v. 410, n. 6824, p. 31, doi. 10.1038/35065196

By:

Chen, Josette

Publication type:

Article

Fabrication of blazed grating by native substrate grating mask.

Published in:

Optical Engineering, 2013, v. 52, n. 9, p. 1, doi. 10.1117/1.OE.52.9.091706

By:

Quan Liu;
Jianhong Wu;
Minghui Chen

Publication type:

Article

Smoothing of diamond-turned substrates for extreme ultraviolet illuminators .

Published in:

Optical Engineering, 2004, v. 43, n. 12, p. 3089, doi. 10.1117/1.1815005

By:

Regina Soufli;
Eric M. Gullikson

Publication type:

Article

Fabrication and characterization of well-aligned plasmonic nanopillars with ultrasmall separations.

Published in:

Nanoscale Research Letters, 2014, v. 9, n. 1, p. 1, doi. 10.1186/1556-276X-9-299

By:

Si, Guangyuan;
Jiang, Xiaoxiao;
Lv, Jiangtao;
Gu, Qiongchan;
Wang, Fengwen

Publication type:

Article

Creation of Controlled Defects Inside Colloidal Crystal Arrays with a Focused Ion Beam.

Published in:

Nanoscale Research Letters, 2010, v. 5, n. 7, p. 1182, doi. 10.1007/s11671-010-9623-0

By:

Magni, Simone;
Milani, Marziale

Publication type:

Article

Implementation of sub-Rayleigh-resolution lithography using an N-photon absorber.

Published in:

Journal of Modern Optics, 2006, v. 53, n. 16/17, p. 2271, doi. 10.1080/09500340600895656

By:

Chang, Hye Jeong;
Shin, Heedeuk;
O'Sullivan-Hale, Malcolm N.;
Boyd, Robert W.

Publication type:

Article

COLD SPRAY: ADVANCED CHARACTERIZATION METHODS--FOCUSED ION BEAM MACHINING AND ELECTRON PROBE MICROANALYSIS.

Published in:

Advanced Materials & Processes, 2017, v. 175, n. 4, p. 42, doi. 10.31399/asm.amp.2017-04.p042

By:

Srinivasan, Dheepa

Publication type:

Article

Our choice from the recent literature.

Published in:: Nature Nanotechnology, 2011, v. 6, n. 11, p. 689, doi. 10.1038/nnano.2011.200
Publication type:: Article

Nanofabrication by magnetic focusing of supersonic beams.

Published in:

Applied Physics B: Lasers & Optics, 2011, v. 103, n. 3, p. 547, doi. 10.1007/s00340-010-4229-x

By:

Clark, R.;
Mazur, T.;
Libson, A.;
Raizen, M.

Publication type:

Article

Emission characteristics of debris from CO2 and Nd:YAG laser-produced tin plasmas for extreme ultraviolet lithography light source.

Published in:

Applied Physics B: Lasers & Optics, 2008, v. 92, n. 1, p. 73, doi. 10.1007/s00340-008-3068-5

By:

Takahashi, A.;
Nakamura, D.;
Tamaru, K.;
Akiyama, T.;
Okada, T.

Publication type:

Article

Works matching DE "ION beam lithography"

Next-generation litho progress, innovative technologies at MRS.

MEDEA's lithography project.

Focused ion beam mask repair.

Expert System Design of beam spot size measurements in FIB system.

Temperature and Current Dependent Matching Fields in Superconducting NbN Film.

FOCUSED ION BEAM FABRICATION OF ELECTROCHEMICALLY SYNTHESIZED NANOWIRE-BASED ELECTRODES.

Decrease in the ignition pressure of anomalous glow discharge in a magnetron with an ion-beam-irradiated cathode.

High-Throughput Top-Down Fabrication of Uniform Magnetic Particles.

FIB Lithography Challenges of Si<sub>3</sub>N<sub>4</sub>/GaN Mask Preparation for Selective Epitaxy.

Electrical transport properties of focused ion beam lithography Au contacts on PbTiO<sub>3</sub> nanorods.

Scanning probe-based high-accuracy overlay alignment concept for lithography applications.

Sub-10 nm writing: focused electron beam-induced deposition in perspective.

The rapid prototyping of textured amorphous surfaces for the graphoepitaxial deposition of CdTe films using focused ion beam lithography.

Three-dimensional ultrastructural analysis of development at the supraspinatus insertion by using focused ion beam/scanning electron microscope tomography in rats.

Focused, Nanoscale Electron-Beam-Induced Deposition and Etching.

Direct patterning of poly(acrylic acid) on polymer surfaces by ion beam lithography for the controlled adhesion of mammalian cells.

Shape-modification of patterned nanoparticles by an ion beam treatment.

Not so small.

Focused Ion Beam Lithography of Nanophotonic Structures.

Direct-write Focused Ion Beam Lithography.

Direct Insights on Flax Fiber Structure by Focused Ion Beam Microscopy.

3D Volumetric Energy Deposition of Focused Helium Ion Beam Lithography: Visualization, Modeling, and Applications in Nanofabrication.

SCANNING ION MICROBEAM ANALYSIS OF DIFFUSION IN IN-MOUTH DRUG RELEASE POLYMERS.

ISTFA '11 User's Group Summary.

SEM for the 21st Century- Scanning Ion Microscopy.

Around the bend.

Enhancement of Raman scattering in Subwave plasmonic nanostructures formed by ion-beam lithography.

Vortex Lattice Instabilities in YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7-x</sub> Nanowires.

Development and Characterization of a Diamond-Insulated Graphitic Multi Electrode Array Realized with Ion Beam Lithography.

All chopped up.

Fabrication of blazed grating by native substrate grating mask.

Smoothing of diamond-turned substrates for extreme ultraviolet illuminators .

Fabrication and characterization of well-aligned plasmonic nanopillars with ultrasmall separations.

Creation of Controlled Defects Inside Colloidal Crystal Arrays with a Focused Ion Beam.

Implementation of sub-Rayleigh-resolution lithography using an N-photon absorber.

COLD SPRAY: ADVANCED CHARACTERIZATION METHODS--FOCUSED ION BEAM MACHINING AND ELECTRON PROBE MICROANALYSIS.

Our choice from the recent literature.

Nanofabrication by magnetic focusing of supersonic beams.

Emission characteristics of debris from CO<sub>2</sub> and Nd:YAG laser-produced tin plasmas for extreme ultraviolet lithography light source.