Works matching DE "INTEGRATED circuits testing"
Results: 32
An efficient small-delay faults simulator based on critical path tracing.
- Published in:
- International Journal of Circuit Theory & Applications, 2015, v. 43, n. 8, p. 1015, doi. 10.1002/cta.1990
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- Publication type:
- Article
Analysing semiconductor manufacturing big data for root cause detection of excursion for yield enhancement.
- Published in:
- International Journal of Production Research, 2017, v. 55, n. 17, p. 5095, doi. 10.1080/00207543.2015.1109153
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- Publication type:
- Article
Testing a 32-channel integrated circuit for recording signals of silicon detectors.
- Published in:
- Instruments & Experimental Techniques, 2012, v. 55, n. 4, p. 456, doi. 10.1134/S0020441212030098
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- Publication type:
- Article
LFSR Reseeding-Oriented Low-Power Test-Compression Architecture for Scan Designs.
- Published in:
- Journal of Electronic Testing, 2018, v. 34, n. 6, p. 685, doi. 10.1007/s10836-018-5756-3
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- Publication type:
- Article
A Reliability-Aware Methodology to Isolate Timing-Critical Paths under Aging.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 6, p. 721, doi. 10.1007/s10836-017-5692-7
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- Publication type:
- Article
Test Planning for Core-based Integrated Circuits under Power Constraints.
- Published in:
- Journal of Electronic Testing, 2017, v. 33, n. 1, p. 7, doi. 10.1007/s10836-016-5638-5
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- Publication type:
- Article
Defect Level Constrained Optimization of Analog and Radio Frequency Specification Tests.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 5/6, p. 479, doi. 10.1007/s10836-015-5545-1
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- Publication type:
- Article
Detecting Hardware Trojans using On-chip Sensors in an ASIC Design.
- Published in:
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 11, doi. 10.1007/s10836-015-5504-x
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- Publication type:
- Article
Online Testable Approaches in Reversible Logic.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 6, p. 763, doi. 10.1007/s10836-013-5399-3
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- Publication type:
- Article
Efficient Test Compression Technique for SoC Based on Block Merging and Eight Coding.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 6, p. 849, doi. 10.1007/s10836-013-5415-7
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- Publication type:
- Article
Observation-Oriented ATPG and Scan Chain Disabling for Capture Power Reduction.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 5, p. 625, doi. 10.1007/s10836-013-5404-x
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- Publication type:
- Article
Guest Editorial: Test and Verification Challenges for Future Microprocessors and SoC Designs.
- Published in:
- 2013
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- Publication type:
- Editorial
Eliminating the Timing Penalty of Scan.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 1, p. 103, doi. 10.1007/s10836-013-5352-5
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- Publication type:
- Article
A New Analog Circuit Fault Diagnosis Method Based on Improved Mahalanobis Distance.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 1, p. 95, doi. 10.1007/s10836-012-5342-z
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- Publication type:
- Article
Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 1, p. 35, doi. 10.1007/s10836-012-5345-9
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- Publication type:
- Article
2011 JETTA Reviewers.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 1, p. 7, doi. 10.1007/s10836-012-5278-3
- Publication type:
- Article
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2012, v. 28, n. 1, p. 11, doi. 10.1007/s10836-012-5280-9
- Publication type:
- Article
Improved test stimulus scan-in method for integrated circuits.
- Published in:
- DYNA - Ingeniería e Industria, 2018, v. 93, n. 4, p. 391, doi. 10.6036/8788
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- Publication type:
- Article
Modular Instruments Address IC Test.
- Published in:
- EE: Evaluation Engineering, 2012, v. 51, n. 7, p. 18
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- Publication type:
- Article
DPI With Integrated Current and Voltage Measurement.
- Published in:
- Microwave Journal, 2016, p. 24
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- Publication type:
- Article
Build Testbenches for Verification in Shift Register ICs using SystemVerilog.
- Published in:
- International Journal of Electronics & Telecommunications, 2022, v. 68, n. 3, p. 619, doi. 10.24425/ijet.2022.141281
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- Publication type:
- Article
Fault Diagnosis In Vlsi Chips Using Different Strategies.
- Published in:
- International Journal of Advanced Research in Computer Science, 2012, v. 3, n. 2, p. 309
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- Publication type:
- Article
Testing integrated circuits.
- Published in:
- IT: Information Technology, 2014, v. 56, n. 4, p. 148, doi. 10.1515/itit-2014-1043
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- Publication type:
- Article
Testing for gate oxide short defects using the detectability interval paradigm.
- Published in:
- IT: Information Technology, 2014, v. 56, n. 4, p. 173, doi. 10.1515/itit-2013-1040
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- Publication type:
- Article
Test and Diagnosis of Automotive Embedded Processors via High-Speed Standard Interfaces.
- Published in:
- Journal of Circuits, Systems & Computers, 2017, v. 26, n. 8, p. -1, doi. 10.1142/S0218126617400060
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- Publication type:
- Article
SUPERCONDUCTING SINGLE-PHOTON DETECTOR ENABLES TIME-RESOLVED EMISSION TESTING OF LOW-VOLTAGE SCALED ICs.
- Published in:
- Electronic Device Failure Analysis, 2016, v. 18, n. 4, p. 16, doi. 10.31399/asm.edfa.2016-4.p016
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- Publication type:
- Article
Space Domain Reflectometry for Opens Detection in Stacked-Die Packages.
- Published in:
- Electronic Device Failure Analysis, 2012, v. 14, n. 3, p. 22, doi. 10.31399/asm.edfa.2012-3.p022
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- Publication type:
- Article
Magnetic Microscopy to Reconstruct 3-D Currents in Complex Systems.
- Published in:
- Electronic Device Failure Analysis, 2012, v. 14, n. 3, p. 12, doi. 10.31399/asm.edfa.2012-3.p012
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- Publication type:
- Article
PROTECTING AI CHIPS FROM THERMAL CHALLENGES DURING ATE TEST.
- Published in:
- EE: Evaluation Engineering, 2019, v. 58, n. 6, p. 24
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- Publication type:
- Article
Automotive semiconductor test key topic at ITC.
- Published in:
- EE: Evaluation Engineering, 2017, v. 56, n. 2, p. 19
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- Publication type:
- Article
Test adds value as Moore's Law recedes.
- Published in:
- 2017
- By:
- Publication type:
- Proceeding
Performance analysis of the HRC? HPGR in pilot plant.
- Published in:
- Rem: Revista Escola de Minas, 2016, v. 69, n. 2, p. 227, doi. 10.1590/0370-44672015690124
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- Publication type:
- Article