Works matching DE "INTEGRATED circuits conferences"
2
- Journal of Electronic Testing, 2015, v. 31, n. 5/6, p. 423, doi. 10.1007/s10836-015-5550-4
- Article
3
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 9, doi. 10.1007/s10836-015-5508-6
- Article
4
- Journal of Electronic Testing, 2012, v. 28, n. 3, p. 265, doi. 10.1007/s10836-012-5300-9
- Article
7
- China Business Review, 2010, v. 37, n. 6, p. 50
- Article
9
- 2015
- Aubert, Hervé;
- Bazzy, Ivar
- Proceeding
10
- 2014
- Kushner, Lawrence;
- Bakkaloglu, Bertan;
- Wang, Albert
- Proceeding
11
- Solid State Technology, 2000, v. 43, n. 12, p. 48
- Article
12
- 2014
- Auciello, Orlando;
- Dey, Sandwip;
- Taylor, Deborah J.
- Proceeding