Works matching DE "INTEGRATED circuit yield"
1
- Progress in Electromagnetics Research B, 2017, v. 77, p. 137, doi. 10.2528/pierb17041605
- Shaowu Huang;
- Charles, Gary;
- Kai Xiao;
- Lee, Beomteak
- Article
2
- Circuits, Systems & Signal Processing, 2015, v. 34, n. 10, p. 3353, doi. 10.1007/s00034-015-0010-z
- Kan, Tsang-Chi;
- Ruan, Shanq-Jang;
- Chang, Ting-Feng;
- Yang, Shih-Hsien
- Article
3
- Operations Research, 2018, v. 66, n. 6, p. 1571, doi. 10.1287/opre.2018.1741
- Hochbaum, Dorit S.;
- Liu, Sheng
- Article
4
- Journal of Microelectronic & Electronic Packaging, 2011, v. 8, n. 3, p. 114, doi. 10.4071/imaps.301
- Article
5
- International Journal of RF & Microwave Computer-Aided Engineering, 2013, v. 23, n. 6, p. 619, doi. 10.1002/mmce.20696
- Scotti, Giuseppe;
- Tommasino, Pasquale;
- Trifiletti, Alessandro
- Article
6
- Journal of Circuits, Systems & Computers, 2019, v. 28, n. 1, p. N.PAG, doi. 10.1142/S0218126619500105
- Article
7
- Journal of Electronic Testing, 2015, v. 31, n. 5/6, p. 427, doi. 10.1007/s10836-015-5546-0
- Hsieh, Tong-Yu;
- Wang, Chih-Hao;
- Kuo, Chun-Wei;
- Huang, Shu-Yu;
- Chih, Tsung-Liang
- Article
8
- Journal of Electronic Testing, 2015, v. 31, n. 3, p. 255, doi. 10.1007/s10836-015-5528-2
- Castro Marquez, Carlos;
- Strum, Marius;
- Chau, Wang
- Article
9
- Automatika: Journal for Control, Measurement, Electronics, Computing & Communications, 2016, v. 57, n. 2, p. 506, doi. 10.7305/automatika.2016.10.1005
- Article
