Works matching DE "INTEGRATED circuit verification"
1
- Journal of Circuits, Systems & Computers, 2025, v. 34, n. 12, p. 1, doi. 10.1142/S0218126625503232
- Mathew, Ribu;
- Maila, Madhushankara;
- Kulai, Trishal
- Article
2
- Coatings (2079-6412), 2025, v. 15, n. 5, p. 551, doi. 10.3390/coatings15050551
- Ji, Ming;
- Guo, Yiming;
- Pei, Yuhui;
- Qin, Zhenjiang;
- Liu, Weiji;
- Hon, Chitin
- Article
3
- International Journal on Software Tools for Technology Transfer, 2023, v. 25, n. 2, p. 129, doi. 10.1007/s10009-023-00699-x
- Jensen, Peter Gjøl;
- Neele, Thomas
- Article
4
- International Journal on Software Tools for Technology Transfer, 2023, v. 25, n. 1, p. 77, doi. 10.1007/s10009-022-00692-w
- Kirszenberg, Alexandre;
- Martin, Antoine;
- Moreau, Hugo;
- Renault, Etienne
- Article
5
- International Journal on Software Tools for Technology Transfer, 2009, v. 11, n. 4, p. 339, doi. 10.1007/s10009-009-0118-1
- Păsăreanu, Corina;
- Visser, Willem
- Article
6
- International Journal on Software Tools for Technology Transfer, 2009, v. 11, n. 4, p. 325, doi. 10.1007/s10009-009-0117-2
- Article
7
- International Journal on Software Tools for Technology Transfer, 2008, v. 10, n. 2, p. 111, doi. 10.1007/s10009-007-0060-z
- Hermanns, Holger;
- Palsberg, Jens
- Article
8
- International Journal on Software Tools for Technology Transfer, 2007, v. 9, n. 1, p. 77, doi. 10.1007/s10009-006-0007-9
- Braunstein, Cécile;
- Encrenaz, Emmanuelle
- Article
9
- International Journal on Software Tools for Technology Transfer, 2007, v. 9, n. 1, p. 5, doi. 10.1007/s10009-006-0001-2
- Bozzano, Marco;
- Villafiorita, Adolfo
- Article
10
- International Journal on Software Tools for Technology Transfer, 2007, v. 9, n. 1, p. 89, doi. 10.1007/s10009-006-0022-x
- Vasudevan, Shobha;
- Emerson, E.;
- Abraham, Jacob
- Article
11
- International Journal on Software Tools for Technology Transfer, 2006, v. 8, n. 3, p. 177, doi. 10.1007/s10009-006-0221-5
- Jensen, Kurt;
- Podelski, Andreas
- Article
12
- International Journal on Software Tools for Technology Transfer, 2005, v. 7, n. 4, p. 341, doi. 10.1007/s10009-004-0145-x
- Bunker, Annette;
- Gopalakrishnan, Ganesh;
- Slind, Konrad
- Article
13
- International Journal on Software Tools for Technology Transfer, 2003, v. 4, n. 3, p. 313
- Skander#Kort;
- Sofiène#Tahar;
- Paul#Curzon
- Article
14
- International Journal on Software Tools for Technology Transfer, 2003, v. 4, n. 3, p. 266
- Article
15
- Measurement Techniques, 2015, v. 58, n. 1, p. 38, doi. 10.1007/s11018-015-0660-z
- Article
16
- Chips, 2024, v. 3, n. 4, p. 311, doi. 10.3390/chips3040016
- Bepary, Md Kawser;
- Zhang, Tao;
- Farahmandi, Farimah;
- Tehranipoor, Mark
- Article
17
- Electronic Science & Technology, 2022, v. 35, n. 5, p. 66, doi. 10.16180/j.cnki.issn1007-7820.2022.05.011
- Article
18
- 2020
- Peters, Kirstin;
- Tini, Simone
- Editorial
19
- Journal of Robotics, 2022, p. 1, doi. 10.1155/2022/3652329
- Yuan, Jian;
- Liu, Hailin;
- Zhang, Wenxia
- Article
20
- Journal of Electronic Testing, 2019, v. 35, n. 1, p. 101, doi. 10.1007/s10836-019-05777-0
- Article
21
- Journal of Electronic Testing, 2015, v. 31, n. 3, p. 255, doi. 10.1007/s10836-015-5528-2
- Castro Marquez, Carlos;
- Strum, Marius;
- Chau, Wang
- Article
22
- Journal of Electronic Testing, 2013, v. 29, n. 5, p. 715, doi. 10.1007/s10836-013-5407-7
- Article
23
- Journal of Electronic Testing, 2011, v. 27, n. 4, p. 505, doi. 10.1007/s10836-011-5219-6
- Grosso, Michelangelo;
- Perez Holguin, Wilson;
- Ravotto, Danilo;
- Sanchez, Ernesto;
- Reorda, Matteo;
- Tonda, Alberto;
- Medina, Jaime
- Article
24
- Journal of Electronic Testing, 2011, v. 27, n. 4, p. 465, doi. 10.1007/s10836-011-5221-z
- Subrahmaniyan Radhakrishnan, Gurusubrahmaniyan;
- Ozev, Sule
- Article
25
- Journal of Electronic Testing, 2011, v. 27, n. 4, p. 485, doi. 10.1007/s10836-011-5225-8
- Castro Márquez, Carlos;
- Romero Tobar, Edgar;
- Strum, Marius;
- Chau, Wang
- Article
26
- Journal of Electronic Testing, 2011, v. 27, n. 4, p. 429, doi. 10.1007/s10836-011-5213-z
- Han, Kihyuk;
- Park, Joonsung;
- Lee, Jae;
- Chung, Jaeyong;
- Byun, Eonjo;
- Woo, Cheol-Jong;
- Oh, Sejang;
- Abraham, Jacob
- Article
27
- Journal of Electronic Testing, 2011, v. 27, n. 4, p. 477, doi. 10.1007/s10836-011-5232-9
- Sun, Haijun;
- Zeng, Yongjia;
- Li, Pu;
- Lei, Shaochong;
- Shao, Zhibiao
- Article
28
- Journal of Electronic Testing, 2010, v. 26, n. 5, p. 499, doi. 10.1007/s10836-010-5171-x
- Biamonte, Jacob;
- Allen, Jeff;
- Perkowski, Marek
- Article
29
- EE: Evaluation Engineering, 2017, v. 56, n. 11, p. 16
- Article
30
- EE: Evaluation Engineering, 2014, v. 53, n. 8, p. 28
- Article
31
- Multimedia Tools & Applications, 2024, v. 83, n. 19, p. 56991, doi. 10.1007/s11042-023-17561-6
- Tsai, Tsung-Han;
- Wang, Chiao-Li
- Article
32
- Ada User Journal, 2022, v. 43, n. 4, p. 269
- Article
33
- Ada User Journal, 2023, v. 44, n. 1, p. 38
- Article
34
- Electronics & Electrical Engineering, 2011, n. 112, p. 61
- Morkunas, K.;
- Seinauskas, R.
- Article
35
- Chinese Journal of Liquid Crystal & Displays, 2019, v. 34, n. 5, p. 515, doi. 10.3788/YJYXS20193405.0515
- Article
36
- IT: Information Technology, 2019, v. 61, n. 4, p. 187, doi. 10.1515/itit-2019-0001
- Article
37
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep07275
- Article
38
- Aerospace (MDPI Publishing), 2024, v. 11, n. 4, p. 247, doi. 10.3390/aerospace11040247
- Vera-Soto, Pablo;
- Villegas, Javier;
- Fortes, Sergio;
- Pulido, José;
- Escaño, Vicente;
- Ortiz, Rafael;
- Barco, Raquel
- Article
39
- Mathematics (2227-7390), 2019, v. 7, n. 9, p. 812, doi. 10.3390/math7090812
- Wisniewski, Remigiusz;
- Bazydło, Grzegorz;
- Szcześniak, Paweł;
- Grobelna, Iwona;
- Wojnakowski, Marcin
- Article
40
- Electronics (2079-9292), 2025, v. 14, n. 2, p. 401, doi. 10.3390/electronics14020401
- Batsakis, Sotiris;
- Tachmazidis, Ilias;
- Mantle, Matthew;
- Papadakis, Nikolaos;
- Antoniou, Grigoris
- Article
41
- Electronics (2079-9292), 2025, v. 14, n. 1, p. 120, doi. 10.3390/electronics14010120
- Abdollahi, Meisam;
- Yeganli, Seyedeh Faegheh;
- Baharloo, Mohammad;
- Baniasadi, Amirali
- Article
42
- Electronics (2079-9292), 2024, v. 13, n. 21, p. 4286, doi. 10.3390/electronics13214286
- Qin, Maoyuan;
- Li, Jiale;
- Yan, Jiaqi;
- Hao, Zishuai;
- Hu, Wei;
- Liu, Baolong
- Article
43
- Electronics (2079-9292), 2024, v. 13, n. 12, p. 2361, doi. 10.3390/electronics13122361
- Dranga, Diana;
- Dumitrescu, Catalin
- Article
44
- Electronics (2079-9292), 2023, v. 12, n. 15, p. 3211, doi. 10.3390/electronics12153211
- Yonekura, Miki;
- Nishimura, Shunji
- Article
45
- Electronics (2079-9292), 2023, v. 12, n. 6, p. 1419, doi. 10.3390/electronics12061419
- Hermassi, Mahdi;
- Krim, Saber;
- Kraiem, Youssef;
- Hajjaji, Mohamed Ali;
- Alshammari, Badr M.;
- Alsaif, Haitham;
- Alshammari, Ahmed S.;
- Guesmi, Tawfik
- Article
46
- Electronics (2079-9292), 2022, v. 11, n. 3, p. 402, doi. 10.3390/electronics11030402
- Jang, Seojin;
- Liu, Wei;
- Park, Sangun;
- Cho, Yongbeom
- Article
47
- Electronics (2079-9292), 2021, v. 10, n. 13, p. 1514, doi. 10.3390/electronics10131514
- Lim, Seung-Ho;
- Suh, WoonSik William;
- Kim, Jin-Young;
- Cho, Sang-Young
- Article
48
- Electronics (2079-9292), 2020, v. 9, n. 12, p. 2024, doi. 10.3390/electronics9122024
- Caba, Julián;
- Rincón, Fernando;
- Barba, Jesús;
- de la Torre, José Antonio;
- López, Juan Carlos
- Article
49
- Scientia et Technica, 2019, v. 24, n. 3, p. 354, doi. 10.22517/23447214.21081
- Chaparro-Mesa, J. E.;
- Lombana, N. B.;
- León-Socha, F. A.
- Article
50
- Computing & Informatics, 2012, v. 31, n. 3, p. 507
- Barnat, Jiří;
- Černa, Ivana;
- Tůmová, Jana
- Article