Works matching DE "INTEGRATED circuit reliability"
1
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 4, p. 400, doi. 10.1007/s10854-010-0150-7
- Moshrefi-Torbati, M.;
- Swingler, J.
- Article
2
- Quality & Reliability Engineering International, 1993, v. 9, n. 5, p. 460
- Article
3
- Quality & Reliability Engineering International, 1993, v. 9, n. 5, p. 459
- Article
4
- Quality & Reliability Engineering International, 1993, v. 9, n. 5, p. 401, doi. 10.1002/qre.4680090503
- Golzio, D.;
- Graffi, S.;
- -Kovács, Zs. M.V.;
- Maseth, G.
- Article
5
- Quality & Reliability Engineering International, 1987, v. 3, n. 3, p. 203, doi. 10.1002/qre.4680030311
- Article
6
- Quality & Reliability Engineering International, 1987, v. 3, n. 3, p. 177, doi. 10.1002/qre.4680030308
- Footner, P. K.;
- Richards, B. P.;
- Yates, R. B.
- Article
7
- Journal of Microelectronic & Electronic Packaging, 2015, v. 12, n. 4, p. 219, doi. 10.4071/imaps.474
- Woychik, Charles G.;
- Lee, Sangil;
- McGrath, Scott;
- Arkalgud, Sitaram
- Article
8
- Journal of Electrical & Computer Engineering, 2014, p. 1, doi. 10.1155/2014/410758
- Article
9
- Journal of Electronic Materials, 2012, v. 41, n. 4, p. 706, doi. 10.1007/s11664-012-1944-6
- Article
10
- Circuits, Systems & Signal Processing, 2015, v. 34, n. 10, p. 3353, doi. 10.1007/s00034-015-0010-z
- Kan, Tsang-Chi;
- Ruan, Shanq-Jang;
- Chang, Ting-Feng;
- Yang, Shih-Hsien
- Article
11
- Journal of Electronic Testing, 2017, v. 33, n. 6, p. 721, doi. 10.1007/s10836-017-5692-7
- Srivastava, Ankush;
- Singh, Virendra;
- Singh, Adit;
- Saluja, Kewal
- Article
12
- Journal of Electronic Testing, 2015, v. 31, n. 5/6, p. 427, doi. 10.1007/s10836-015-5546-0
- Hsieh, Tong-Yu;
- Wang, Chih-Hao;
- Kuo, Chun-Wei;
- Huang, Shu-Yu;
- Chih, Tsung-Liang
- Article
13
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 107, doi. 10.1007/s10836-014-5495-z
- Vock, Stefan;
- Escalona, Omar;
- Turner, Colin
- Article
14
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 383, doi. 10.1007/s10836-013-5386-8
- Bonnoit, Thierry;
- Nicolaidis, Michael;
- Zergainoh, Nacer-Eddine
- Article
15
- International Journal of Advanced Research in Computer Science, 2012, v. 3, n. 2, p. 309
- Sharma, Divya;
- Kaushik, B. K.;
- Agarwal, R. P.
- Article
17
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 5, p. 231, doi. 10.1049/el.2019.0508
- Article
19
- Advances in Radio Science, 2008, v. 6, p. 205, doi. 10.5194/ars-6-205-2008
- Domdey, A.;
- Hafkemeyer, K. M.;
- Krautschneider, W. H.;
- Schroeder, D.
- Article
20
- Modern Physics Letters B, 2017, v. 31, n. 19-21, p. -1, doi. 10.1142/S0217984917400978
- Han, Yifeng;
- Zhai, Mingjing;
- Zhou, Junfeng
- Article
