Works matching DE "INTEGRATED circuit passivation"
1
- Corrosion Engineering, Science & Technology, 2011, v. 46, n. 2, p. 159, doi. 10.1179/1743278210Y.0000000018
- Nakayama, G;
- Sakakibara, Y;
- Kawakami, S
- Article
2
- Corrosion Engineering, Science & Technology, 2009, v. 44, n. 4, p. 261, doi. 10.1179/174327808X326928
- Abd El-Haleem, S. M.;
- Abd El-Aal, E. E.;
- El-Wanees, S. Abd
- Article
3
- Advanced Functional Materials, 2018, v. 28, n. 19, p. 1, doi. 10.1002/adfm.201706815
- Ramin Moayed, Mohammad Mehdi;
- Bielewicz, Thomas;
- Noei, Heshmat;
- Stierle, Andreas;
- Klinke, Christian
- Article
4
- Physica Status Solidi - Rapid Research Letters, 2019, v. 13, n. 2, p. N.PAG, doi. 10.1002/pssr.201800505
- Zhang, Wenwen;
- Lei, Xiaoli;
- Liu, Jihong;
- Dong, Jun;
- Yan, Xuewen;
- Gao, Wei;
- Dong, Hua;
- Ran, Chenxin;
- Wu, Zhaoxin
- Article
5
- Physica Status Solidi - Rapid Research Letters, 2019, v. 13, n. 2, p. N.PAG, doi. 10.1002/pssr.201800493
- Cheng, Chun‐Hu;
- Fan, Chia‐Chi;
- Hsu, Hsiao‐Hsuan;
- Wang, Shih‐An;
- Chang, Chun‐Yen
- Article
6
- International Journal of Control, 2004, v. 77, n. 6, p. 517, doi. 10.1080/00207170410001682498
- Jiao, Xiaohong;
- Shen, Tielong;
- Tamura, Katsutoshi
- Article
7
- Naukovi visti NTUU - KPI, 2008, v. 2008, n. 6, p. 119
- Frolenkova, S. V.;
- Donchenko, M. I.
- Article
8
- International Journal of Fracture, 2003, v. 122, n. 1/2, p. 47, doi. 10.1023/B:FRAC.0000005374.52613.83
- Yosibash, Z.;
- Adan, O.;
- Schneck, R.;
- Atlas, H.
- Article
9
- Applied Sciences (2076-3417), 2018, v. 8, n. 3, p. 424, doi. 10.3390/app8030424
- Jeong, Seok Hwan;
- Liu, Na;
- Park, Heekyeong;
- Hong, Young Ki;
- Kim, Sunkook
- Article
10
- Materials & Manufacturing Processes, 2005, v. 20, n. 1, p. 35, doi. 10.1081/AMP-200041602
- Popa, M.V.;
- Vasilescu, E.;
- Drob, P.;
- Vasilescu, C.;
- Mirza-Rosca, J.;
- Lopez, A. Santana
- Article
11
- Quality & Reliability Engineering International, 1990, v. 6, n. 4, p. 275, doi. 10.1002/qre.4680060410
- Pecht, Michael;
- Lall, Pradeep;
- Whelan, Stanley J.
- Article
12
- Microwave & Optical Technology Letters, 2010, v. 52, n. 7, p. 1614, doi. 10.1002/mop.25266
- Heng-Kuang Lin;
- Hsiang-Lin Yu;
- Huang, F.-H.
- Article
13
- Integrated Ferroelectrics, 2007, v. 88, n. 1, p. 76, doi. 10.1080/10584580601099009
- Ki Yong Choi;
- Dae Sung Yoon;
- Tae Song Kim;
- Duck Kyun Choi
- Article
14
- Instruments & Experimental Techniques, 2009, v. 52, n. 1, p. 137, doi. 10.1134/S0020441209010230
- Gurov, Yu.;
- Karpukhin, V.;
- Rozov, S.;
- Sandukovsky, V.;
- Borowicz, D.;
- Kwiatkowska, J.;
- Rajchel, B.;
- Yurkowski, J.
- Article
15
- Instruments & Experimental Techniques, 2007, v. 50, n. 6, p. 757, doi. 10.1134/S0020441207060073
- Gurov, Yu.;
- Gusev, K.;
- Katulina, S.;
- Sandukovsky, V.;
- Borowicz, D.;
- Yurkowski, J.
- Article
16
- Journal of Adhesion Science & Technology, 2004, v. 18, n. 2, p. 275, doi. 10.1163/156856104772759467
- Article
17
- Energies (19961073), 2018, v. 11, n. 4, p. 939, doi. 10.3390/en11040939
- Dong, Peng;
- Zhang, Yuming;
- Guo, Hui;
- Zhang, Chenxu;
- Ma, Jikui;
- Qu, Xiaoyong;
- Zhang, Chunfu
- Article
18
- Energies (19961073), 2017, v. 10, n. 1, p. 14, doi. 10.3390/en10010014
- Feifan Ji;
- Ji Xiang;
- Wuhua Li;
- Quanming Yue
- Article
19
- International Journal of High Speed Electronics & Systems, 2011, v. 20, n. 3, p. 557, doi. 10.1142/S0129156411006854
- SAVICH, G. R.;
- PEDRAZZANI, J. R.;
- MAIMON, S.;
- WICKS, G. W.
- Article
20
- Journal of Electronic Materials, 2013, v. 42, n. 3, p. 502, doi. 10.1007/s11664-012-2353-6
- Lim, D.;
- Fan, J.;
- Peng, L.;
- Leong, K.;
- Tan, C.
- Article
21
- Journal of Electronic Materials, 2012, v. 41, n. 4, p. 706, doi. 10.1007/s11664-012-1944-6
- Article
22
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 624, doi. 10.1007/s11664-011-1832-5
- Article
23
- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1668, doi. 10.1007/s11664-011-1640-y
- Licausi, Nicholas;
- Rao, Sunil;
- Bhat, Ishwara
- Article
24
- Journal of Electronic Materials, 2010, v. 39, n. 12, p. 2681, doi. 10.1007/s11664-010-1367-1
- Arslan, Engin;
- Bütün, Serkan;
- Şafak, Yasemin;
- Ozbay, Ekmel
- Article
25
- Journal of Electronic Materials, 2010, v. 39, n. 11, p. 2452, doi. 10.1007/s11664-010-1343-9
- Tadjer, Marko;
- Anderson, Travis;
- Hobart, Karl;
- Mastro, Michael;
- Hite, Jennifer;
- Caldwell, Joshua;
- Picard, Yoosuf;
- Kub, Fritz;
- Eddy, Charles
- Article
26
- Journal of Electronic Materials, 2010, v. 39, n. 7, p. 1019, doi. 10.1007/s11664-010-1083-x
- Zhang, J.;
- Tsen, G. K. O.;
- Antoszewski, J.;
- Dell, J. M.;
- Faraone, L.;
- Hu, W. D.
- Article
27
- Journal of Electronic Materials, 2010, v. 39, n. 7, p. 1015, doi. 10.1007/s11664-010-1090-y
- Kim, K. H.;
- Carcelén, V.;
- Bolotnikov, A. E.;
- Camarda, G. S.;
- Gul, R.;
- Hossain, A.;
- Yang, G.;
- Cui, Y.;
- James, R. B.
- Article
28
- Journal of Electronic Materials, 2010, v. 39, n. 7, p. 951, doi. 10.1007/s11664-010-1152-1
- Jaime-Vasquez, M.;
- Jacobs, R. N.;
- Benson, J. D.;
- Stoltz, A. J.;
- Almeida, L. A.;
- Bubulac, L. O.;
- Chen, Y.;
- Brill, G.
- Article
29
- Journal of Electronic Materials, 2010, v. 39, n. 7, p. 924, doi. 10.1007/s11664-010-1176-6
- Zhao, W. F.;
- Cook, J.;
- Parodos, T.;
- Tobin, S.;
- Smith, David
- Article
30
- Journal of Electronic Materials, 2006, v. 35, n. 10, p. 1793, doi. 10.1007/s11664-006-0159-0
- Pal, R.;
- Malik, A.;
- Srivastav, V.;
- Sharma, B. L.;
- Dhar, V.;
- Sreedhar, B.;
- Vyas, H. P.
- Article
31
- Journal of Electronic Materials, 2006, v. 35, n. 6, p. 1429, doi. 10.1007/s11664-006-0279-6
- Min Yung Lee;
- Young Ho Kim;
- Nam Ho Lee;
- Yong Soo Lee;
- Hee Chul Lee
- Article
32
- Journal of Electronic Materials, 2006, v. 35, n. 6, p. 1385, doi. 10.1007/s11664-006-0272-0
- Boieriu, P.;
- Grein, C. H.;
- Garland, J.;
- Velicu, S.;
- Fulk, C.;
- Stoltz, A.;
- Bubulac, L.;
- Dinan, J. H.;
- Sivananthan, S.
- Article
33
- Journal of Electronic Materials, 2005, v. 34, n. 11, p. 1368, doi. 10.1007/s11664-005-0192-4
- Teynor, W. A.;
- Vaccaro, K.;
- Buchwald, W. R.;
- Dauplaise, H. M.;
- Morath, C. P.;
- Davis, A.;
- Roland, M. A.;
- Clark, W. R.
- Article
34
- Journal of Electronic Materials, 2004, v. 33, n. 7, p. 802, doi. 10.1007/s11664-004-0245-0
- Article
35
- Journal of Electronic Materials, 2004, v. 33, n. 5, p. 436
- Bernát, J.;
- Javorka, P.;
- Fox, A.;
- Marso, M.;
- Kordoš, P.
- Article
36
- Photovoltaics International, 2010, n. 10, p. 80
- Huan, C. C.;
- Huang, Y. T.;
- Tseng, Y. W.;
- Chen, W. H.;
- Fang, T.;
- Li, C. C.;
- Tsai, C. C.
- Article
37
- Photovoltaics International, 2010, n. 10, p. 65
- Ching-Hsi Li;
- Chien-Hua Lung;
- Yang-Fang Chen;
- Yu-Wei Tai;
- Wei-Chih Hsu
- Article
38
- Photovoltaics International, 2009, n. 4, p. 93
- Article
39
- Photovoltaics International, 2009, n. 4, p. 68
- Hofmann, Marc;
- Rentsch, Jochen;
- Glunz, Stefan W.;
- Preu, Ralf
- Article
40
- International Journal of Corrosion, 2011, p. 1, doi. 10.1155/2011/103785
- Naibao Huang;
- Chenghao Liang;
- Hongtao Wang;
- Lishuang Xu;
- Hongfeng Xu
- Article
41
- Advances in Applied Ceramics: Structural, Functional & Bioceramics, 2011, v. 110, n. 2, p. 63, doi. 10.1179/174367610X12804792635260
- Ganesh, I;
- Sundararajan, G;
- Ferreira, J M F
- Article
42
- Journal of Solid State Electrochemistry, 2011, v. 15, n. 11/12, p. 2311, doi. 10.1007/s10008-011-1463-z
- Gorzkowski, Maciej;
- Wesołowska, Aleksandra;
- Jurczakowski, Rafał;
- Ślepski, Paweł;
- Darowicki, Kazimierz;
- Orlik, Marek
- Article
43
- Journal of Solid State Electrochemistry, 2011, v. 15, n. 11/12, p. 2321, doi. 10.1007/s10008-011-1464-y
- Gorzkowski, Maciej;
- Orlik, Marek
- Article
44
- Journal of Solid State Electrochemistry, 2011, v. 15, n. 1, p. 125, doi. 10.1007/s10008-010-1074-0
- Heakal, Fakiha El-Taib;
- Fatayerji, M. Ziad
- Article
45
- Electronics (2079-9292), 2018, v. 7, n. 12, p. 416, doi. 10.3390/electronics7120416
- Geng, Kuiwei;
- Chen, Ditao;
- Zhou, Quanbin;
- Wang, Hong
- Article
46
- Applied Physics A: Materials Science & Processing, 2018, v. 124, n. 4, p. 1, doi. 10.1007/s00339-018-1702-6
- Fu, Chen;
- Lin, Zhaojun;
- Cui, Peng;
- Lv, Yuanjie;
- Zhou, Yang;
- Dai, Gang;
- Luan, Chongbiao;
- Liu, Huan;
- Cheng, Aijie
- Article
47
- Applied Physics A: Materials Science & Processing, 2005, v. 80, n. 6, p. 1339, doi. 10.1007/s00339-004-3162-4
- Ragan, R.;
- Kim, S.;
- Li, X.;
- Williams, R. Stanley
- Article
48
- Advances in OptoElectronics, 2008, p. 1, doi. 10.1155/2008/485467
- Hofmann, M.;
- Kambor, S.;
- Schmidt, C.;
- Grambole, D.;
- Rentsch, J.;
- Glunz, S. W.;
- Preu, R.
- Article
49
- Nucleus, 1998, n. 25, p. 41
- Santos, W. Machado Soares
- Article
50
- Optica Applicata, 2011, v. 41, n. 2, p. 441
- DOMANOWSKA, ALINA;
- ADAMOWICZ, BOGUSŁAWA;
- BIDZINSKI, PIOTR;
- KLIMASEK, ANDRZEJ;
- SZEWCZENKO, JANUSZ;
- GUTT, TOMASZ;
- PRZEWŁOCKI, HENRYK
- Article