Works about INTEGRATED circuit interconnections


Results: 861
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    Yield grows by X.

    Published in:
    Electronics Systems & Software, 2005, v. 3, n. 3, p. 26
    By:
    • Strojwas, Andrzej J.;
    • Thurnaty, Kalyan;
    • Arora, Narain
    Publication type:
    Article
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    Cantilever testing of sintered-silver interconnects.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 2, p. 1530, doi. 10.1007/s10854-017-8063-3
    By:
    • Wereszczak, Andrew A.;
    • Chen, Branndon R.;
    • Jadaan, Osama M.;
    • Oistad, Brian A.;
    • Modugno, Max C.;
    • Sharp, Jeffrey W.;
    • Salvador, James R.
    Publication type:
    Article
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    Symmetry-guided design of topologies for supercomputer networks.

    Published in:
    International Journal of Modern Physics C: Computational Physics & Physical Computation, 2018, v. 29, n. 7, p. N.PAG, doi. 10.1142/S0129183118500481
    By:
    • Sabino, Alan U.;
    • Vasconcelos, Miguel F. S.;
    • Deng, Yuefan;
    • Ramos, Alexandre F.
    Publication type:
    Article
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    Scaling Challenges for Advanced CMOS Devices.

    Published in:
    International Journal of High Speed Electronics & Systems, 2017, v. 26, n. 1/2, p. -1, doi. 10.1142/S0129156417400018
    By:
    • Jacob, Ajey P.;
    • Xie, Ruilong;
    • Sung, Min Gyu;
    • Liebmann, Lars;
    • Lee, Rinus T. P.;
    • Taylor, Bill
    Publication type:
    Article