Works matching DE "INSERTION loss measurement"
1
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 12, p. 5546, doi. 10.1007/s10854-014-2342-z
- Sharma, Updesh;
- Dutta, Shankar
- Article
2
- Acta Informatica, 2019, v. 56, n. 1, p. 35, doi. 10.1007/s00236-018-0312-2
- Fernau, Henning;
- Kuppusamy, Lakshmanan;
- Raman, Indhumathi
- Article
3
- Noise & Vibration Worldwide, 2015, v. 46, n. 9, p. 27
- Article
4
- Journal of Electromagnetic Waves & Applications, 2016, v. 30, n. 5, p. 553, doi. 10.1080/09205071.2015.1090347
- Huang, Yulin;
- Li, Xinyi;
- Bao, Jingfu;
- Deng, Di;
- Wang, Yiling;
- Du, Yijia
- Article
5
- Acta Anaesthesiologica Scandinavica, 2014, v. 58, n. 2, p. 214, doi. 10.1111/aas.12232
- MOGENSEN, S.;
- BERGLUND, L.;
- ERIKSSON, M.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 11, p. 693, doi. 10.1049/el.2018.0823
- Hailin Deng;
- Dongfang Zhou;
- Dewei Zhang;
- Yi Zhang
- Article
7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 552, doi. 10.1049/el.2017.0022
- Bui, D. H. N.;
- Vuong, T. P.;
- Allard, B.;
- Verdier, J.;
- Benech, P.
- Article
8
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 546, doi. 10.1049/el.2016.3620
- Article
9
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 542, doi. 10.1049/el.2017.0380
- Hammou, D.;
- Nedil, M.;
- Tatu, S. O.
- Article
10
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 8, p. 540, doi. 10.1049/el.2016.4333
- Bing Liu;
- Zijun Guo;
- Xiangyun Wei;
- Yu Ma;
- Renrong Zhao;
- Ke Xing;
- Lei Wu
- Article
11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 18, p. 1545, doi. 10.1049/el.2016.2488
- H. Okayama;
- Y. Onawa;
- D. Shimura;
- H. Takahashi;
- H. Yaegashi;
- H. Sasaki
- Article
12
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 7, p. 564, doi. 10.1049/el.2014.4129
- Article
13
- 2016
- Zagadou, Brissi;
- Chan, Philemon;
- Ho, Kevin
- journal article
14
- Progress in Electromagnetics Research C, 2013, v. 38, p. 177, doi. 10.2528/pierc13022709
- Sai Wai Wong;
- Xiao-Han Liu;
- Kai Wang;
- Ruisen Chen;
- Li-Sheng Zheng;
- Qing-Xin Chu
- Article
15
- Noise Control Engineering Journal, 2016, v. 64, n. 2, p. 134, doi. 10.3397/1/376366
- Article
16
- Frequenz, 2016, v. 70, n. 3/4, p. 173, doi. 10.1515/freq-2015-0232
- Le, Ru;
- Wensheng, Chi;
- Yaqing, Liu;
- Haidong, Yang
- Article
17
- Microwave Journal, 2014, v. 57, n. 2, p. 100
- Young Yun;
- Jang-Hyeon Jeong;
- Hong-Seung Kim;
- Nak-Won Jang
- Article
18
- International Journal of Emerging Electric Power Systems, 2015, v. 16, n. 5, p. 399, doi. 10.1515/ijeeps-2015-0033
- Akila, Abdelrahman Ahmed;
- Helal, Ahmed;
- Eldesouki, Hussein
- Article
19
- IET Microwaves, Antennas & Propagation (Wiley-Blackwell), 2018, v. 12, n. 15, p. 2332, doi. 10.1049/iet-map.2018.5277
- Parish, James S.;
- Somjit, Nutapong;
- Hunter, Ian Charles
- Article
20
- IET Microwaves, Antennas & Propagation (Wiley-Blackwell), 2017, v. 11, n. 8, p. 1156, doi. 10.1049/iet-map.2016.0965
- Kamma, Anil;
- Das, Ranjan;
- Mukherjee, Jayanta
- Article
21
- ETRI Journal, 2013, v. 35, n. 4, p. 638, doi. 10.4218/etrij.13.0112.0534
- Moon-Kyu Cho;
- Jeong-Geun Kim;
- Donghyun Baek
- Article
22
- International Journal of Contents, 2015, v. 11, n. 3, p. 63, doi. 10.5392/IJoC.2015.11.3.063
- Article
23
- Computer Journal, 2016, v. 59, n. 5, p. 630, doi. 10.1093/comjnl/bxv090
- SAIKKONEN, RIKU;
- SOISALON-SOININEN, ELJAS
- Article