Works matching DE "INFRARED equipment"


Results: 455
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    Dielectric and Infrared Response of Ba 0.77 Ca 0.23 TiO 3.

    Published in:
    Ferroelectrics, 2003, v. 295, n. 1, p. 31, doi. 10.1080/00150190390239431
    By:
    • Savinov, M. E.;
    • Trepakov, V. A.;
    • Kamba, S.;
    • Kapphan, S. E.;
    • Petzelt, J.;
    • Pankrath, R.;
    • Kislova, I. L.;
    • Kutsenko, A. B.;
    • Jastrabik, L.
    Publication type:
    Article
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    2D GeP as a Novel Broadband Nonlinear Optical Material for Ultrafast Photonics.

    Published in:
    Laser & Photonics Reviews, 2019, v. 13, n. 9, p. N.PAG, doi. 10.1002/lpor.201900123
    By:
    • Guo, Jia;
    • Huang, Dazhou;
    • Zhang, Yue;
    • Yao, Huizhen;
    • Wang, Yunzheng;
    • Zhang, Feng;
    • Wang, Rui;
    • Ge, Yanqi;
    • Song, Yufeng;
    • Guo, Zhinan;
    • Yang, Fumei;
    • Liu, Jiefeng;
    • Xing, Chenyang;
    • Zhai, Tianyou;
    • Fan, Dianyuan;
    • Zhang, Han
    Publication type:
    Article
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    A thermal infrared instrument onboard a geostationary platform for CO and O<sub>3</sub> measurements in the lowermost troposphere: observing system simulation experiments.

    Published in:
    Atmospheric Measurement Techniques Discussions, 2011, v. 4, n. 1, p. 815, doi. 10.5194/amtd-4-815-2011
    By:
    • Claeyman, M.;
    • Attié, J.-L.;
    • Peuch, V.-H.;
    • Amraoui, L. El;
    • Lahoz, W. A.;
    • Josse, B.;
    • Joly, M.;
    • Barré, J.;
    • Ricaud, P.;
    • Massart, S.;
    • Piacentini, A.;
    • von Clarmann, T.;
    • Höpfner, M.;
    • Orphal, J.;
    • Flaud, J.-M.;
    • Edwards, D. P.
    Publication type:
    Article
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    Product Showcase.

    Published in:
    Insight: Non-Destructive Testing & Condition Monitoring, 2013, v. 55, n. 9, p. 527
    Publication type:
    Article
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    Product Showcase.

    Published in:
    Insight: Non-Destructive Testing & Condition Monitoring, 2006, v. 48, n. 8, p. 510, doi. 10.1784/insi.2006.48.8.510
    Publication type:
    Article
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    A meeting of infrared minds.

    Published in:
    Insight: Non-Destructive Testing & Condition Monitoring, 2005, v. 47, n. 9, p. 529
    Publication type:
    Article
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