Works matching DE "INFRARED detectors"
1
- Solid State Technology, 2000, v. 43, n. 3, p. 20
- Article
2
- International Journal of Wavelets, Multiresolution & Information Processing, 2016, v. 14, n. 4, p. -1, doi. 10.1142/S0219691316500235
- Liu, Lei;
- Zhou, Yayun;
- Li, He;
- Huang, Wei;
- Cui, Minjie
- Article
3
- Macromolecular Symposia, 2023, v. 409, n. 1, p. 1, doi. 10.1002/masy.202200174
- Aboelanin, Hamza M.;
- Deshmukh, Subrajeet;
- Macko, Tibor;
- Arndt, Jan‐Hendrik;
- Podzimek, Stepan;
- Brüll, Robert
- Article
4
- Macromolecular Symposia, 2020, v. 390, n. 1, p. 1, doi. 10.1002/masy.201900014
- Article
5
- Macromolecular Symposia, 2015, v. 356, n. 1, p. 95, doi. 10.1002/masy.201500033
- Honghong, Huang;
- Meifang, Guo;
- Dong, Wei;
- Suárez, Inmaculada;
- Coto, Baudilio;
- López, Esther;
- Ortín, Alberto;
- Yau, Wallace W.
- Article
6
- Macromolecular Symposia, 2015, v. 356, n. 1, p. 87, doi. 10.1002/masy.201500077
- Frijns‐Bruls, Tiny;
- Ortin, Alberto;
- Weusten, Jos;
- Geladé, Erik
- Article
7
- Macromolecular Symposia, 2015, v. 356, n. 1, p. 110, doi. 10.1002/masy.201500048
- Honghong, Huang;
- Meifang, Guo;
- Juan, Li;
- Ortín, Alberto;
- Yau, Wallace W.
- Article
8
- Macromolecular Symposia, 2013, v. 330, n. 1, p. 63, doi. 10.1002/masy.201300060
- Ortín, A.;
- Montesinos, J.;
- López, E.;
- del Hierro, P.;
- Monrabal, B.;
- Torres‐Lapasió, J.R.;
- García‐Álvarez‐Coque, M.C.
- Article
9
- Advanced Functional Materials, 2015, v. 25, n. 11, p. 1745, doi. 10.1002/adfm.201404582
- Trung, Tran Quang;
- Ramasundaram, Subramaniyan;
- Lee, Nae‐Eung
- Article
10
- Advanced Functional Materials, 2014, v. 24, n. 13, p. 1821, doi. 10.1002/adfm.201302967
- Li, Zejun;
- Hu, Zhenpeng;
- Peng, Jing;
- Wu, Changzheng;
- Yang, Yuchen;
- Feng, Feng;
- Gao, Peng;
- Yang, Jinlong;
- Xie, Yi
- Article
11
- Advanced Functional Materials, 2014, v. 24, n. 13, p. 1820, doi. 10.1002/adfm.201470083
- Li, Zejun;
- Hu, Zhenpeng;
- Peng, Jing;
- Wu, Changzheng;
- Yang, Yuchen;
- Feng, Feng;
- Gao, Peng;
- Yang, Jinlong;
- Xie, Yi
- Article
12
- Advanced Functional Materials, 2014, v. 23, n. 37, p. 4678, doi. 10.1002/adfm.201300208
- Fernandes, Gustavo E.;
- Kim, Jin Ho;
- Sood, Ashok K.;
- Xu, Jimmy
- Article
13
- Journal of Materials Science: Materials in Electronics, 2022, v. 33, n. 31, p. 23900, doi. 10.1007/s10854-021-07339-7
- Article
14
- Journal of Materials Science: Materials in Electronics, 2022, v. 33, n. 30, p. 23515, doi. 10.1007/s10854-022-09112-w
- Yao, Zhongxiang;
- Bi, Gang;
- Yin, Juxin;
- Chen, Zeyu;
- Cai, Chunfeng
- Article
15
- Journal of Materials Science: Materials in Electronics, 2022, v. 33, n. 20, p. 16029, doi. 10.1007/s10854-022-08494-1
- Xiao, Yonghong;
- Xu, Tingwei;
- Zhang, Maofa;
- Zhou, Yufei;
- Chen, Duo;
- Bao, Xiaoqing;
- Zeng, Xiangbin
- Article
16
- Journal of Materials Science: Materials in Electronics, 2022, v. 33, n. 15, p. 12157, doi. 10.1007/s10854-022-08176-y
- Tripathi, Harshit;
- Kumar, Sushil;
- Kumar, Rohit;
- Bhardwaj, Sumit;
- Sharma, Jagmohan Datt
- Article
17
- Journal of Materials Science: Materials in Electronics, 2022, v. 33, n. 7, p. 4350, doi. 10.1007/s10854-021-07628-1
- Article
18
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 15, p. 12389, doi. 10.1007/s10854-020-03785-x
- Chu, Kaili;
- Li, Hongjiang;
- Pu, XingRui;
- Peng, Jubo;
- Liu, Yang;
- Dong, Gang;
- Zhang, Shuai;
- Liu, Xiang
- Article
19
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 10, p. 7798, doi. 10.1007/s10854-020-03318-6
- Sahni, Mohit;
- Mukaherjee, Sabyasachi;
- Hamid, Adil;
- Kumar, Dharmesh;
- Chauhan, Sunil;
- Kumar, Naresh
- Article
20
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 22, p. 19862, doi. 10.1007/s10854-019-02353-2
- Pu, Xingrui;
- Dong, Gang;
- Sun, Tao;
- Li, Hongjiang;
- Chu, Kaili;
- Liu, Yang;
- Zhang, Shuai;
- Liu, Xiang
- Article
21
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 4566, doi. 10.1007/s10854-016-4332-9
- Peng, Ruiqin;
- Jiao, Shujie;
- Jiang, Dongwei;
- Li, Hongtao;
- Zhao, Liancheng
- Article
22
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 6, p. 1188, doi. 10.1007/s10854-011-0570-z
- Ju, Yongfeng;
- Wu, Zhiming;
- Li, Shibin;
- Li, Lin;
- Jiang, Yadong
- Article
23
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 400, doi. 10.1007/s10854-008-9642-0
- Kouissa, S.;
- Aida, M. S.;
- Djemel, A.
- Article
24
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 159, doi. 10.1007/s10854-007-9497-9
- Peng Yuan Yang;
- Stankovic, Stevan;
- Crnjanski, Jasna;
- Ee Jin Teo;
- Thomson, David;
- Bettiol, Andrew A.;
- Breese, Mark B. H.;
- Headley, William;
- Giusca, Cristina;
- Reed, Graham T.;
- Mashanovich, Goran Z.
- Article
25
- Earth, Moon & Planets, 2014, v. 113, n. 1-4, p. 43, doi. 10.1007/s11038-014-9444-8
- Bhattacharya, A.;
- Pandit, J.;
- Bhattacharya, R.
- Article
26
- International Journal of Advanced Manufacturing Technology, 2023, v. 129, n. 11/12, p. 5679, doi. 10.1007/s00170-023-12668-4
- Su, Ming-Yao;
- Wang, De-Ru;
- Wang, Qi;
- Jiang, Min-Qiang;
- Dai, Lan-Hong
- Article
27
- International Journal of Advanced Manufacturing Technology, 2023, v. 125, n. 1/2, p. 587, doi. 10.1007/s00170-022-10755-6
- Masato, Davide;
- Kazmer, David O.;
- Panchal, Rahul R.
- Article
28
- Bulletin of Volcanology, 2011, v. 73, n. 9, p. 1109, doi. 10.1007/s00445-011-0487-7
- Steffke, Andrea;
- Harris, Andrew
- Article
29
- Solar Physics, 2015, v. 290, n. 11, p. 3267, doi. 10.1007/s11207-015-0803-z
- Watson, Fraser;
- Beck, Christian;
- Penn, Matthew;
- Tritschler, Alexandra;
- Pillet, Valentín;
- Livingston, William
- Article
30
- Solar Physics, 2007, v. 241, n. 2, p. 301, doi. 10.1007/s11207-007-0282-y
- Hui Li;
- Jianqi You;
- Xingfeng Yu;
- Qiusheng Du
- Article
31
- International Journal of Image & Graphics, 2013, v. 13, n. 3, p. -1, doi. 10.1142/S0219467813500149
- Article
32
- Chemical & Petroleum Engineering, 2016, v. 51, n. 11/12, p. 765, doi. 10.1007/s10556-016-0119-3
- Arkharov, I.;
- Navasardyan, E.;
- Simakov, M.
- Article
33
- High Temperature, 2007, v. 45, n. 2, p. 255, doi. 10.1134/S0018151X07020162
- Article
34
- IET Intelligent Transport Systems (Wiley-Blackwell), 2015, v. 9, n. 2, p. 135, doi. 10.1049/iet-its.2013.0096
- Shieh, Wern‐Yarng;
- Hsu, Chen‐Chien;
- Chen, Hsin‐Chuan;
- Wang, Ti‐Ho;
- Chang, Shyang‐Lih
- Article
35
- IET Intelligent Transport Systems (Wiley-Blackwell), 2015, v. 9, n. 1, p. 75, doi. 10.1049/iet-its.2013.0163
- Hurney, Patrick;
- Waldron, Peter;
- Morgan, Fearghal;
- Jones, Edward;
- Glavin, Martin
- Article
36
- IET Image Processing (Wiley-Blackwell), 2017, v. 11, n. 6, p. 397, doi. 10.1049/iet-ipr.2016.0316
- Nasiri, Mahdi;
- Mosavi, Mohammad Reza;
- Mirzakuchaki, Sattar
- Article
37
- International Journal of Aviation, Aeronautics & Aerospace, 2022, v. 9, n. 2, p. 1
- Cerreta, Joseph;
- Denney, Tray;
- Burgess, Scott S.;
- Galante, Anthony;
- Thirtyacre, David;
- Wilson, Gloria A.;
- Sherman, Patrick
- Article
38
- Leonardo, 2003, v. 36, n. 3, p. 207, doi. 10.1162/002409403321921424
- Article
39
- Instrumentation Science & Technology, 2016, v. 44, n. 5, p. 495, doi. 10.1080/10739149.2016.1158724
- Hu, Hai-feng;
- Zhao, Yong;
- Zhang, Ya-nan;
- Yang, Yang
- Article
40
- Museum Management & Curatorship, 1993, v. 12, n. 1, p. 112
- Article
41
- Transactions of the Japan Society of Aeronautical & Space Sciences, Aerospace Technology Japan, 2016, v. 14, n. ists 30, p. 77
- Toshinori KUWAHARA;
- Kazufumi FUKUDA;
- Nobuo SUGIMURA;
- Yuji SAKAMOTO;
- Kazuya YOSHIDA;
- DORSA, Arianna;
- PAGANI, Pietro;
- BERNELLI, Franco Z.
- Article
42
- Nondestructive Testing & Evaluation, 2016, v. 31, n. 4, p. 371, doi. 10.1080/10589759.2015.1121266
- Serio, L.M.;
- Palumbo, D.;
- Galietti, U.;
- De Filippis, L.A.C.;
- Ludovico, A.D.
- Article
43
- Nondestructive Testing & Evaluation, 2008, v. 23, n. 3, p. 195, doi. 10.1080/10589750701855171
- Howell, Patricia A.;
- Winfree, William P.;
- Cramer, K. Elliott
- Article
44
- Integrated Ferroelectrics, 2021, v. 216, n. 1, p. 43, doi. 10.1080/10584587.2021.1911256
- Wang, Bin;
- Li, Ning;
- Xie, Wan-Feng;
- Lai, Jian-Jun;
- Wang, Shu-Ying;
- Zheng, Yu;
- Chi, Zong-Tao;
- Yu, Bing;
- Shen, You-Qing;
- Cong, Hai-Lin
- Article
45
- Integrated Ferroelectrics, 2007, v. 95, n. 1, p. 26, doi. 10.1080/10584580701756029
- Wu, Ch. G.;
- Zhang, W. L.;
- Li, Y. R.;
- Liu, X. Zh.;
- Zhu, J.;
- Tao, B. W.
- Article
46
- Integrated Ferroelectrics, 2007, v. 92, n. 1, p. 147, doi. 10.1080/10584580701748810
- Ramos, P.;
- de Andres, A.;
- López, A.
- Article
47
- Integrated Ferroelectrics, 2007, v. 91, n. 1, p. 97, doi. 10.1080/10584580701320370
- Lin, T.;
- Sun, J. L.;
- Meng, X. J.;
- Ma, J. H.;
- Shi, F. W.;
- Chen, J.;
- Chu, J. H.
- Article
48
- Integrated Ferroelectrics, 2006, v. 83, n. 1, p. 99, doi. 10.1080/10584580600949113
- Cole, M. W.;
- Joshi, P. C.;
- Hubbard, C. W.;
- Ngo, E.
- Article
49
- Integrated Ferroelectrics, 2006, v. 80, n. 1, p. 87, doi. 10.1080/10584580600656502
- Abe, Jiro;
- Kobune, Masafumi;
- Nishimura, Toshiya;
- Yazaw, Tetsuo;
- Nakai, Yasuhiro
- Article
50
- Integrated Ferroelectrics, 2006, v. 80, n. 1, p. 47, doi. 10.1080/10584580600656171
- Joo-Hyung Kim;
- Grishin, Alexander M.
- Article