Works matching DE "INDUSTRIAL use of ion bombardment"
Results: 8
A Tool for Advanced Failure Analysis.
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- EE: Evaluation Engineering, 2004, v. 43, n. 9, p. 60
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- Article
ION BEAM Surface Enhancement.
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- Advanced Materials & Processes, 1999, v. 155, n. 5, p. 31
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Development and Characterization of a Diamond-Insulated Graphitic Multi Electrode Array Realized with Ion Beam Lithography.
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- Sensors (14248220), 2015, v. 15, n. 1, p. 515, doi. 10.3390/s150100515
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- Article
Focused Ion Beam (FIB) Circuit Edit.
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- Electronic Device Failure Analysis, 2014, v. 16, n. 3, p. 20, doi. 10.31399/asm.edfa.2014-3.p020
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Superconducting superwires.
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- Nature, 1995, v. 375, n. 6527, p. 107, doi. 10.1038/375107a0
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High-Throughput Top-Down Fabrication of Uniform Magnetic Particles.
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- PLoS ONE, 2012, v. 7, n. 5, p. 1, doi. 10.1371/journal.pone.0037440
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FIB technology keeps pace with process and packaging developments.
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- Solid State Technology, 1998, v. 41, n. 12, p. 63
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The kinetics of conductivity type conversion in HgCdTe by ion beam milling.
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- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 10, p. 965, doi. 10.1007/s10854-007-9428-9
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- Article