FIB technology keeps pace with process and packaging developments.
- Published in:
- Solid State Technology, 1998, v. 41, n. 12, p. 63
- By:
- Publication type:
- Article
Works matching DE "INDUSTRIAL use of ion bombardment"
Results: 9
1
2
The kinetics of conductivity type conversion in HgCdTe by ion beam milling.
- Published in:
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 10, p. 965, doi. 10.1007/s10854-007-9428-9
- By:
- Publication type:
- Article
3
Superconducting superwires.
- Published in:
- Nature, 1995, v. 375, n. 6527, p. 107, doi. 10.1038/375107a0
- By:
- Publication type:
- Article
4
Development and Characterization of a Diamond-Insulated Graphitic Multi Electrode Array Realized with Ion Beam Lithography.
- Published in:
- Sensors (14248220), 2015, v. 15, n. 1, p. 515, doi. 10.3390/s150100515
- By:
- Publication type:
- Article
5
Construction of Two-Dimensional Waveguides in Insulating Optical Materials by Means of Ion Beam Implantation for Photonic Applications: Fabrication Methods and Research Progress.
- Published in:
- Critical Reviews in Solid State & Materials Science, 2008, v. 33, n. 3/4, p. 165, doi. 10.1080/10408430802310868
- By:
- Publication type:
- Article
6
ION BEAM Surface Enhancement.
- Published in:
- Advanced Materials & Processes, 1999, v. 155, n. 5, p. 31
- By:
- Publication type:
- Article
7
A Tool for Advanced Failure Analysis.
- Published in:
- EE: Evaluation Engineering, 2004, v. 43, n. 9, p. 60
- By:
- Publication type:
- Article
8
High-Throughput Top-Down Fabrication of Uniform Magnetic Particles.
- Published in:
- PLoS ONE, 2012, v. 7, n. 5, p. 1, doi. 10.1371/journal.pone.0037440
- By:
- Publication type:
- Article
9
Focused Ion Beam (FIB) Circuit Edit.
- Published in:
- Electronic Device Failure Analysis, 2014, v. 16, n. 3, p. 20, doi. 10.31399/asm.edfa.2014-3.p020
- By:
- Publication type:
- Article