Works matching DE "INDUCTIVELY coupled plasma atomic emission spectrometry techniques"


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    ICP-AES analysis of high-purity silicon.

    Published in:
    Inorganic Materials, 2013, v. 49, n. 12, p. 1283, doi. 10.1134/S0020168513140082
    By:
    • Shaverina, A. V.;
    • Tsygankova, A. R.;
    • Shelpakova, I. R.;
    • Saprykin, A. I.
    Publication type:
    Article
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