Works matching DE "INDIUM arsenide"
1
- Applied Physics B: Lasers & Optics, 2025, v. 131, n. 7, p. 1, doi. 10.1007/s00340-025-08497-w
- Grishkov, Vyacheslav E.;
- Uryupin, Sergey A.
- Article
2
- Applied Physics A: Materials Science & Processing, 2025, v. 131, n. 7, p. 1, doi. 10.1007/s00339-025-08689-3
- Alsharari, Meshari;
- Han, Bo Bo;
- Patel, Shobhit K.;
- Aliqab, Khaled;
- Armghan, Ammar
- Article
3
- International Journal of Nanoscience, 2007, v. 6, n. 5, p. 339, doi. 10.1142/S0219581X07004900
- ALEXANDER, TONKIKH;
- DUBROVSKII, VLADIMIR;
- MUSIKHIN, YURII;
- USTINOV, VICTOR;
- CIRLIN, GEORGE;
- POLYAKOV, NIKOLAY;
- SAMSONENKO, YURII;
- WERNER, PETER
- Article
4
- International Journal of Nanoscience, 2007, v. 6, n. 5, p. 383, doi. 10.1142/S0219581X07004912
- TORCHYNSKA, T. V.;
- LOZADA, E. VELÁZQUEZ;
- DYBIEC, M.;
- OSTAPENKO, S.;
- ELISEEV, P. G.;
- STINTZ, A.;
- MALLOY, K. J.;
- SIERRA, R. PENA
- Article
5
- International Journal of Nanoscience, 2007, v. 6, n. 5, p. 319
- FÜRST, J.;
- PASCHER, H.;
- SHALYGIN, V. A.;
- VOROBJEV, L. E.;
- FIRSOV, D. A.;
- TONKIKH, A. A.;
- POLYAKOV, N. K.;
- SAMSONENKO, YU. B.;
- CIRLIN, G. E.;
- USTINOV, V. M.
- Article
6
- International Journal of Nanoscience, 2006, v. 5, n. 6, p. 729, doi. 10.1142/S0219581X06005066
- LEI, W.;
- CHEN, Y. H.;
- JIN, P.;
- XU, B.;
- YE, X. L.;
- WANG, Z. G.;
- HUANG, X. Q.
- Article
7
- International Journal of Nanoscience, 2006, v. 5, n. 6, p. 721, doi. 10.1142/S0219581X06005054
- YUXIN ZENG;
- WEI LIU;
- FUHUA YANG;
- PING XU;
- PINGHENG TAN;
- HOUZHI ZHENG;
- YIPING ZENG;
- YINGJIE XING;
- DAPENG YU
- Article
8
- International Journal of Nanoscience, 2006, v. 5, n. 6, p. 847, doi. 10.1142/S0219581X0600525X
- ZHIDAN FANG;
- ZHENG GONG;
- ZHENHUA MIAO;
- ZHICHUAN NIU
- Article
9
- International Journal of Nanoscience, 2006, v. 5, n. 6, p. 883, doi. 10.1142/S0219581X06005315
- ZHENG GONG;
- ZHIDAN FANG;
- ZHENHUA MIAO;
- ZHICHUAN NIU
- Article
10
- International Journal of Nanoscience, 2003, v. 2, n. 6, p. 437, doi. 10.1142/S0219581X0300153X
- Zakharova, A.;
- Yen, S.T.;
- Chao, K.A.
- Article
11
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 125, doi. 10.1007/s10854-007-9308-3
- Article
12
- Journal of Nano- & Electronic Physics, 2013, v. 5, n. 1, p. 01017-1
- Prasher, Rakesh;
- Dass, Devi;
- Vaid, Rakesh
- Article
13
- Bulletin of the Polish Academy of Sciences: Technical Sciences, 2019, v. 67, n. 1, p. 141, doi. 10.24425/bpas.2019.127343
- MICHALCZEWSKI, K.;
- TSAI, T. Y.;
- MARTYNIUK, P.;
- WU, C. H.
- Article
14
- Bulletin of the Polish Academy of Sciences: Technical Sciences, 2018, v. 66, n. 3, p. 317, doi. 10.24425/123438
- GOMÓŁKA, E.;
- MARKOWSKA, O.;
- KOPYTKO, M.;
- KOWALEWSKI, A.;
- MARTYNIUK, P.;
- ROGALSKI, A.;
- RUTKOWSKI, J.;
- MOTYKA, M.;
- KRISHNA, S.
- Article
15
- Modern Physics Letters B, 2016, v. 30, n. 32/33, p. -1, doi. 10.1142/S021798491650384X
- Article
16
- Modern Physics Letters B, 2015, v. 29, n. 31, p. -1, doi. 10.1142/S0217984915501973
- Liu, Ying;
- Ren, Guangjun;
- Du, Rongjian;
- Zhang, Yongming;
- Tan, Tianbo;
- Wang, Yaqi;
- Yao, Jianquan
- Article
17
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2024, v. 38, n. 29, p. 1, doi. 10.1142/S0217979224503995
- Niharika, Neha;
- Singh, Sangeeta
- Article
18
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2016, v. 30, n. 27, p. 1, doi. 10.1142/S021797921692003X
- Besahraoui, Fatiha;
- Bouslama, M'hamed;
- Bouzaiene, Lotfi;
- Saidi, Faouzi;
- Maaref, Hassen;
- Gendry, Michel
- Article
19
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2016, v. 30, n. 21, p. -1, doi. 10.1142/S0217979216501459
- Besahraoui, Fatiha;
- Bouslama, M'Hamed;
- Bouzaiene, Lotfi;
- Saidi, Faouzi;
- Maaref, Hassen;
- Gendry, Michel
- Article
20
- International Journal of High Speed Electronics & Systems, 2002, v. 12, n. 3, p. 761
- Article
21
- Journal of Materials Science, 2016, v. 51, n. 3, p. 1333, doi. 10.1007/s10853-015-9451-9
- Oliveira, A.;
- Rubinger, R.;
- Monteiro, H.;
- Rubinger, C.;
- Ribeiro, G.
- Article
22
- Journal of Materials Science, 2013, v. 48, n. 14, p. 4899, doi. 10.1007/s10853-013-7270-4
- López-Pérez, William;
- Simon-Olivera, Nicolás;
- González-Hernández, Rafael
- Article
23
- Journal of Materials Science, 2009, v. 44, n. 17, p. 4743, doi. 10.1007/s10853-009-3741-z
- Article
24
- Journal of Materials Science, 2008, v. 43, n. 8, p. 2935, doi. 10.1007/s10853-007-1794-4
- Mohammad, Rezek;
- Katırcıoğlu, Şenay;
- El-Hasan, Musa
- Article
25
- Nature, 2008, v. 451, n. 7176, p. 256, doi. 10.1038/451256a
- Khitrova, Galina;
- Gibbs, H. M.
- Article
26
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 3, p. 144, doi. 10.1049/el.2018.6413
- Loghmari, Z.;
- Bahriz, M.;
- Meguekam, A.;
- Teissier, R.;
- Baranov, A. N.
- Article
27
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 24, p. 1395, doi. 10.1049/el.2018.7118
- Yoshikawa, H.;
- Kwoen, J.;
- Doe, T.;
- Izumi, M.;
- Iwamoto, S.;
- Arakawa, Y.
- Article
28
- Bulletin of Environmental Contamination & Toxicology, 2006, v. 77, n. 2, p. 289, doi. 10.1007/s00128-006-1062-3
- Article
29
- Technical Physics Letters, 2020, v. 46, n. 2, p. 150, doi. 10.1134/S1063785020020121
- Semakova, A. A.;
- Lipnitskaya, S. N.;
- Mynbaev, K. D.;
- Bazhenov, N. L.;
- Kizhaev, S. S.;
- Chernyaev, A. V.;
- Stoyanov, N. D.;
- Lipsanen, H.
- Article
30
- Nano Convergence, 2025, v. 12, n. 1, p. 1, doi. 10.1186/s40580-025-00489-y
- Seo, Jaeyoung;
- Kim, Seongchan;
- Yeo, Dongjoon;
- Gwak, Namyoung;
- Oh, Nuri
- Article
31
- Nature Communications, 2021, v. 12, n. 1, p. 1, doi. 10.1038/s41467-021-27006-z
- Balaghi, Leila;
- Shan, Si;
- Fotev, Ivan;
- Moebus, Finn;
- Rana, Rakesh;
- Venanzi, Tommaso;
- Hübner, René;
- Mikolajick, Thomas;
- Schneider, Harald;
- Helm, Manfred;
- Pashkin, Alexej;
- Dimakis, Emmanouil
- Article
32
- Advances in Optical Technologies, 2012, p. 1, doi. 10.1155/2012/926365
- Wróbel, Jarosław;
- Martyniuk, Piotr;
- Rogalski, Antoni
- Article
33
- Nanoscale Research Letters, 2018, v. 13, n. 1, p. 1, doi. 10.1186/s11671-018-2612-4
- Benyahia, D.;
- Kubiszyn, Ł.;
- Michalczewski, K.;
- Boguski, J.;
- Kębłowski, A.;
- Martyniuk, P.;
- Piotrowski, J.;
- Rogalski, A.
- Article
34
- Nanoscale Research Letters, 2018, v. 13, n. 1, p. 1, doi. 10.1186/s11671-018-2478-5
- Yao Wu;
- Xin Yan;
- Xia Zhang;
- Xiaomin Ren
- Article
35
- Nanoscale Research Letters, 2018, v. 13, n. 1, p. 1, doi. 10.1186/s11671-018-2472-y
- Xiang-Bin Su;
- Ying Ding;
- Ben Ma;
- Ke-Lu Zhang;
- Ze-Sheng Chen;
- Jing-Lun Li;
- Xiao-Ran Cui;
- Ying-Qiang Xu;
- Hai-Qiao Ni;
- Zhi-Chuan Niu
- Article
36
- Electronics & Electrical Engineering, 2012, n. 122, p. 121
- Malisauskas, V.;
- Plonis, D.
- Article
37
- Journal of Electronic Materials, 2019, v. 48, n. 10, p. 6654, doi. 10.1007/s11664-019-07476-0
- Razavi, Pedram;
- Greer, James C.
- Article
38
- Journal of Electronic Materials, 2019, v. 48, n. 4, p. 2174, doi. 10.1007/s11664-019-07037-5
- Jangir, Suresh K.;
- Malik, Hitendra K.;
- Kumar, Anand;
- Sridhar Rao, D. V.;
- Muralidharan, R.;
- Mishra, Puspashree
- Article
39
- Journal of Electronic Materials, 2019, v. 48, n. 1, p. 679, doi. 10.1007/s11664-018-6783-7
- Yao, Yanping;
- Bo, Baoxue;
- Liu, Chunling
- Article
40
- Journal of Electronic Materials, 2015, v. 44, n. 8, p. 2792, doi. 10.1007/s11664-015-3760-2
- Ben Mahrsia, R.;
- Choubani, M.;
- Bouzaiene, L.;
- Maaref, H.
- Article
41
- Journal of Electronic Materials, 2014, v. 43, n. 8, p. 2984, doi. 10.1007/s11664-014-3169-3
- Klipstein, P.;
- Livneh, Y.;
- Glozman, A.;
- Grossman, S.;
- Klin, O.;
- Snapi, N.;
- Weiss, E.
- Article
42
- Journal of Electronic Materials, 2013, v. 42, n. 11, p. 3203, doi. 10.1007/s11664-013-2759-9
- Connelly, Blair;
- Metcalfe, Grace;
- Shen, Hongen;
- Wraback, Michael;
- Canedy, Chadwick;
- Vurgaftman, Igor;
- Melinger, Joseph;
- Affouda, Chaffra;
- Jackson, Eric;
- Nolde, Jill;
- Meyer, Jerry;
- Aifer, Edward
- Article
43
- Journal of Electronic Materials, 2013, v. 42, n. 11, p. 3015, doi. 10.1007/s11664-013-2685-x
- Reine, Marion;
- Schuster, Jonathan;
- Pinkie, Benjamin;
- Bellotti, Enrico
- Article
44
- Journal of Electronic Materials, 2013, v. 42, n. 7, p. 2409, doi. 10.1007/s11664-012-2409-7
- Karg, S.;
- Mensch, P.;
- Gotsmann, B.;
- Schmid, H.;
- Kanungo, P.;
- Ghoneim, H.;
- Schmidt, V.;
- Björk, M.;
- Troncale, V.;
- Riel, H.
- Article
45
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2714, doi. 10.1007/s11664-012-2035-4
- Cervera, C.;
- Ribet-Mohamed, I.;
- Taalat, R.;
- Perez, J.P.;
- Christol, P.;
- Rodriguez, J.B.
- Article
46
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2671, doi. 10.1007/s11664-012-2182-7
- D'Souza, A.I.;
- Robinson, E.;
- Ionescu, A.C.;
- Okerlund, D.;
- Lyon, T.J.;
- Sharifi, H.;
- Roebuck, M.;
- Yap, D.;
- Rajavel, R.D.;
- Dhar, N.;
- Wijewarnasuriya, P.S.;
- Grein, C.
- Article
47
- Journal of Electronic Materials, 2012, v. 41, n. 10, p. 2679, doi. 10.1007/s11664-012-2187-2
- Guidry, D.H.;
- Morath, C.P.;
- Cowan, V.M.;
- Cardimona, D.A.
- Article
48
- Journal of Electronic Materials, 2012, v. 41, n. 9, p. 2322, doi. 10.1007/s11664-012-2146-y
- Zhou, Chuanle;
- Nguyen, B.;
- Razeghi, M.;
- Grayson, M.
- Article
49
- Journal of Electronic Materials, 2012, v. 41, n. 3, p. 498, doi. 10.1007/s11664-011-1809-4
- Massoudi, I.;
- Habchi, M.M.;
- Rebey, A.;
- El Jani, B.
- Article
50
- Journal of Electronic Materials, 2011, v. 40, n. 8, p. 1815, doi. 10.1007/s11664-011-1653-6
- Article