Works matching DE "INDIUM alloys"
1
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 6, p. 2829, doi. 10.1007/s10854-014-1948-5
- Deng, Weizhi;
- Yan, Zhi;
- Fang, Yalin;
- Wang, Ying
- Article
2
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 1, p. 163, doi. 10.1007/s10854-013-1567-6
- Kozer, V.;
- Bozhko, V.;
- Parasyuk, O.;
- Novosad, O.;
- Fedorchuk, A.
- Article
3
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 441, doi. 10.1007/s10854-009-9932-1
- Shenghao Wang;
- Jingquan Zhang;
- Bo Wang;
- Lianghuan Feng;
- Yaping Cai;
- Lili Wu;
- Wei Li;
- Zhi Lei;
- Bing Li
- Article
4
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 411, doi. 10.1007/s10854-007-9231-7
- Yao Chen;
- Yuqin Zhou;
- Qunfang Zhang;
- Meifang Zhu;
- Fengzhen Liu
- Article
5
- Journal of Solid State Electrochemistry, 2015, v. 19, n. 5, p. 1463, doi. 10.1007/s10008-015-2765-3
- El-Sayed, Abdel-Rahman;
- Mohran, Hossnia;
- Abd El-Lateef, Hany;
- Shilkamy, Hoda
- Article
6
- Journal of Solid State Electrochemistry, 2008, v. 12, n. 11, p. 1461, doi. 10.1007/s10008-007-0489-8
- Ts. Dobrovolska;
- G. Beck;
- I. Krastev;
- A. Zielonka
- Article
7
- Inorganic Materials, 2009, v. 45, n. 1, p. 1, doi. 10.1134/S0020168509010014
- Borovoi, N.;
- Gololobov, Yu.;
- Isaenko, G.;
- Stepanishchev, N.
- Article
8
- Inorganic Materials, 2009, v. 45, n. 1, p. 7, doi. 10.1134/S0020168509010026
- Alekperov, O.;
- Nadzhafov, A.
- Article
9
- Inorganic Materials, 2007, v. 43, n. 9, p. 921, doi. 10.1134/S0020168507090014
- Tyurin, A.;
- Gavrichev, K.;
- Zlomanov, V.
- Article
10
- Inorganic Materials, 2004, v. 40, n. 12, p. 1284, doi. 10.1007/s10789-005-0081-5
- Mudryi, S. I.;
- Lutsishin, T. I.;
- Korolyshin, A. V.
- Article
11
- Inorganic Materials, 2004, v. 40, n. 6, p. 567, doi. 10.1023/B:INMA.0000031987.03089.a8
- Abdinov, A.Sh.;
- Babaeva, R.F.;
- Rzaev, R.M.;
- Gasanov, G.A.
- Article
12
- Cogent Engineering, 2018, v. 5, n. 1, p. 1, doi. 10.1080/23311916.2018.1501864
- Thirugnanasambantham, KG.;
- Raju, Ramesh;
- Sankaramoorthy, T.;
- Velmurugan, P.;
- Kannagi, A.;
- Chaitanya Kishore Reddy, M.;
- Sai Koushik Chary, V.;
- Mustafa, M.A.;
- Ramesh Chandra, V.
- Article
13
- Minerals (2075-163X), 2017, v. 7, n. 9, p. 173, doi. 10.3390/min7090173
- Jianping Liu;
- Yanan Rong;
- Shugen Zhang;
- Zhongfa Liu;
- Weikang Chen
- Article
14
- Journal of Superconductivity & Novel Magnetism, 2023, v. 36, n. 1, p. 217, doi. 10.1007/s10948-022-06463-7
- Liu, Y. R.;
- Su, K. P.;
- Zhang, Y. H.;
- Shang, Q. X.;
- Hu, S. L.;
- Wang, H. O.;
- Huang, S.;
- Yang, D. X.;
- Huo, D. X.;
- Liu, J.
- Article
15
- Transactions of the Institute of Metal Finishing, 2015, v. 93, n. 6, p. 326, doi. 10.1080/00202967.2015.1117259
- Dobrovolska, Ts.;
- Georgiev, M.;
- Krastev, I.
- Article
16
- Transactions of the Institute of Metal Finishing, 2015, v. 93, n. 6, p. 321, doi. 10.1080/00202967.2015.1117260
- Dobrovolska, T. S.;
- Georgiev, M.;
- Krastev, I.
- Article
17
- Mechanical Sciences, 2021, v. 12, n. 1, p. 143, doi. 10.5194/ms-12-143-2021
- Chao, Yan Pu;
- Yi, Hao;
- Cen, Hui;
- Li, Yao Hui
- Article
18
- Applied Physics A: Materials Science & Processing, 2008, v. 90, n. 4, p. 629, doi. 10.1007/s00339-007-4381-2
- Lee, M. L.;
- Miao, X. S.;
- Ting, L. H.;
- Shi, L. P.
- Article
19
- Applied Physics A: Materials Science & Processing, 2007, v. 86, n. 2, p. 357, doi. 10.1007/s00339-006-3769-8
- Wang, Q.;
- Shang, D. S.;
- Wu, Z. H.;
- Chen, L. D.;
- Li, X. M.
- Article
20
- Applied Physics A: Materials Science & Processing, 1997, v. 65, n. 3, p. 231, doi. 10.1007/s003390050571
- Wegner, H.;
- Weiss, K.;
- Grunze, M.;
- Wöll, C.
- Article
21
- Nature Communications, 2022, v. 13, n. 1, p. 1, doi. 10.1038/s41467-022-28901-9
- Chen, Bin;
- Cao, Yudong;
- Li, Qiaoyu;
- Yan, Zhuo;
- Liu, Rui;
- Zhao, Yunjiao;
- Zhang, Xiang;
- Wu, Minying;
- Qin, Yixiu;
- Sun, Chang;
- Yao, Wei;
- Cao, Ziyi;
- Ajayan, Pulickel M.;
- Chee, Mason Oliver Lam;
- Dong, Pei;
- Li, Zhaofen;
- Shen, Jianfeng;
- Ye, Mingxin
- Article
22
- Gold Bulletin, 2010, v. 43, n. 1, p. 4, doi. 10.1007/BF03214961
- Article
23
- Semiconductors, 2017, v. 51, n. 8, p. 1017, doi. 10.1134/S106378261708022X
- Mikhailin, N.;
- Parfeniev, R.;
- Chernyaev, A.;
- Shamshur, D.;
- Andrianov, G.
- Article
24
- Semiconductors, 2014, v. 48, n. 6, p. 705, doi. 10.1134/S1063782614060062
- Article
25
- Semiconductors, 2013, v. 47, n. 6, p. 856, doi. 10.1134/S1063782613060122
- Klochko, N.;
- Khrypunov, G.;
- Volkova, N.;
- Kopach, V.;
- Lyubov, V.;
- Kirichenko, M.;
- Momotenko, A.;
- Kharchenko, N.;
- Nikitin, V.
- Article
26
- Semiconductors, 2012, v. 46, n. 9, p. 1122, doi. 10.1134/S1063782612090047
- Article
27
- Semiconductors, 2001, v. 35, n. 3, p. 321, doi. 10.1134/1.1356155
- Aıdaraliev, M.;
- Zotova, N. V.;
- Karandashev, S. A.;
- Matveev, B. A.;
- Remennyı, M. A.;
- Stus’, N. M.;
- Talalakin, G. N.
- Article
28
- Semiconductors, 2001, v. 35, n. 3, p. 347, doi. 10.1134/1.1356160
- Soshnikov, I. P.;
- Gorbenko, O. M.;
- Golubok, A. O.;
- Ledentsov, N. N.
- Article
29
- Semiconductors, 2001, v. 35, n. 3, p. 331, doi. 10.1134/1.1356157
- Voronina, T. I.;
- Zhurtanov, B. E.;
- Lagunova, T. S.;
- Mikhaılova, M. P.;
- Moiseev, K. D.;
- Rozov, A. E.;
- Yakovlev, Yu. P.
- Article
30
- Semiconductors, 2001, v. 35, n. 3, p. 357, doi. 10.1134/1.1356162
- Zotova, N. V.;
- Karandashev, S. A.;
- Matveev, B. A.;
- Remennyı, M. A.;
- Stus’, N. M.;
- Talalakin, G. N.;
- Shustov, V. V.
- Article
31
- Semiconductors, 2001, v. 35, n. 3, p. 360, doi. 10.1134/1.1356163
- Imenkov, A. N.;
- Kolchanova, N. M.;
- Kubat, P.;
- Moiseev, K. D.;
- Civis, C.;
- Yakovlev, Yu. P.
- Article
32
- Semiconductors, 2001, v. 35, n. 3, p. 365, doi. 10.1134/1.1356164
- Livshits, D. A.;
- Egorov, A. Yu.;
- Kochnev, I. V.;
- Kapitonov, V. A.;
- Lantratov, V. M.;
- Ledentsov, N. N.;
- Nalyot, T. A.;
- Tarasov, I. S.
- Article
33
- Semiconductors, 2000, v. 34, n. 7, p. 810, doi. 10.1134/1.1188079
- Petrov, V. N.;
- Polyakov, N. K.;
- Egorov, V. A.;
- Cirlin, G. E.;
- Zakharov, N. D.;
- Werner, P.;
- Ustinov, V. M.;
- Denisov, D. V.;
- Ledentsov, N. N.;
- Alferov, Zh. I.
- Article
34
- Semiconductors, 2000, v. 34, n. 6, p. 677, doi. 10.1134/1.1188054
- Nikolaev, Yu. A.;
- Rud’, V. Yu.;
- Rud’, Yu. V.;
- Terukov, E. I.
- Article
35
- Semiconductors, 2000, v. 34, n. 6, p. 693, doi. 10.1134/1.1188057
- Evstigneev, S. V.;
- Imamov, R. M.;
- Lomov, A. A.;
- Sadof’ev, Yu. G.;
- Khabarov, Yu. V.;
- Chuev, M. A.;
- Shipitsin, D. S.
- Article
36
- Semiconductors, 2000, v. 34, n. 1, p. 104, doi. 10.1134/1.1187963
- Aıdaraliev, M.;
- Zotova, N. V.;
- Karandashev, S. A.;
- Matveev, B. A.;
- Remennyı, M. A.;
- Stus’, N. M.;
- Talalakin, G. N.
- Article
37
- Semiconductors, 2000, v. 34, n. 1, p. 119, doi. 10.1134/1.1187954
- Mikhrin, S. S.;
- Zhukov, A. E.;
- Kovsh, A. R.;
- Maleev, N. A.;
- Ustinov, V. M.;
- Shernyakov, Yu. M.;
- Kayander, I. N.;
- Kondrat’eva, E. Yu.;
- Livshits, D. A.;
- Tarasov, I. S.;
- Maksimov, M. V.;
- Tsatsul’nikov, A. F.;
- Ledentsov, N. N.;
- Kop’ev, P. S.;
- Bimberg, D.;
- Alferov, Zh. I.
- Article
38
- Journal of Electronic Materials, 2023, v. 52, n. 9, p. 6350, doi. 10.1007/s11664-023-10571-y
- Sah, Sanjay Kumar;
- Jha, Indu Shekhar;
- Koirala, Ishwar
- Article
39
- Journal of Electronic Materials, 2019, v. 48, n. 1, p. 286, doi. 10.1007/s11664-018-6713-8
- Zhang, Chi;
- Xia, Yong;
- Lian, Linyuan;
- Fu, Xiaoming;
- Yin, Liping;
- Zhang, Jianbing;
- Luo, Wei;
- Miao, Xiangshui;
- Zhang, Daoli
- Article
40
- Journal of Electronic Materials, 2018, v. 47, n. 11, p. 6923, doi. 10.1007/s11664-018-6618-6
- Cheng, Tien-Hung;
- Chang, Sheng-Po;
- Chang, Shoou-Jinn
- Article
41
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 937, doi. 10.1007/s11664-010-1462-3
- Fu, Hong;
- Ying, Pengzhan;
- Cui, Jiaolin;
- Yan, Yanming;
- Zhang, Xiaojun
- Article
42
- Journal of Electronic Materials, 2011, v. 40, n. 2, p. 103, doi. 10.1007/s11664-010-1432-9
- Wei, J.;
- Barnes, J.;
- Guha, S.;
- Gonzalez, L.;
- Yeo, Y.;
- Hengehold, R.;
- Rajagopalan, G.
- Article
43
- Journal of Electronic Materials, 2010, v. 39, n. 8, p. 1268, doi. 10.1007/s11664-010-1208-2
- Sruti, A.;
- Jagannadham, K.
- Article
44
- Journal of Electronic Materials, 2009, v. 38, n. 7, p. 1132, doi. 10.1007/s11664-009-0676-8
- Pantha, B. N.;
- Dahal, R.;
- Li, J.;
- Lin, J. Y.;
- Jiang, H. X.;
- Pomrenke, G.
- Article
45
- Journal of Electronic Materials, 2008, v. 37, n. 4, p. 498, doi. 10.1007/s11664-008-0380-0
- Shih-Kang Lin;
- Ching-Feng Yang;
- Shyr-Harn Wu;
- Sinn-Wen Chen
- Article
46
- Philosophical Magazine, 2006, v. 86, n. 3-5, p. 435, doi. 10.1080/14786430500253984
- Iwano, S.;
- Nishimoto, K.;
- Tamura, R.;
- Takeuchi, S.
- Article
47
- Advanced Functional Materials, 2014, v. 24, n. 23, p. 3501, doi. 10.1002/adfm.201303220
- Boley, J. William;
- White, Edward L.;
- Chiu, George T.‐C.;
- Kramer, Rebecca K.
- Article
48
- Mechanics of Time-Dependent Materials, 2014, v. 18, n. 1, p. 217, doi. 10.1007/s11043-013-9223-3
- Jeeva, Lavanya;
- Choi, Jae;
- Lee, Taeyong
- Article
49
- Journal of Materials Science: Materials in Electronics, 2022, v. 33, n. 3, p. 1162, doi. 10.1007/s10854-021-07398-w
- Nieto, L. F. Mulcue;
- Saldarriaga, W.;
- de la Cruz, W.;
- Restrepo, E.;
- Ospina, M. S.;
- Escobar, D.
- Article
50
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 18, p. 23371, doi. 10.1007/s10854-021-06824-3
- Jaiswal, Dheeraj;
- Singh, Vikrant;
- Pathote, Dileep;
- Behera, C. K.
- Article