Works matching DE "IMPURITY-dislocation interactions"
Results: 12
The roles of shallow and deep levels in the recombination behavior of polycrystalline silicon on glass solar cells.
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- Progress in Photovoltaics, 2012, v. 20, n. 8, p. 915, doi. 10.1002/pip.1154
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- Article
Non-target impurity profiling of marketplace Cetirizine using high-resolution mass spectrometry and multivariate data analysis.
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- Rapid Communications in Mass Spectrometry: RCM, 2016, v. 30, n. 17, p. 1941, doi. 10.1002/rcm.7675
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Development of an impurity-profiling method for source identification of spilled benzene series compounds by gas chromatography with mass spectrometry: Toluene as a case study.
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- Journal of Separation Science, 2015, v. 38, n. 18, p. 3198, doi. 10.1002/jssc.201500086
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- Article
THEORETICAL APPROACH TOWARDS MORE GENERALIZED TUNNELING MODEL.
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- Bulletin of Pure & Applied Sciences-Physics, 2012, v. 31D, n. 2, p. 219
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- Article
Fano-Kondo Effect of Magnetic Impurity with Side-Coupled Graphene Flake.
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- Acta Physica Polonica: A, 2014, v. 126, n. 1, p. 202, doi. 10.12693/APhysPolA.126.202
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- Article
First-principles study of the electronic structures and optical properties of Cr<sup>2+</sup>-doped ZnSe as a function of impurity concentration.
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- Physica Status Solidi (B), 2016, v. 253, n. 6, p. 1133, doi. 10.1002/pssb.201552684
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Multiple structural forms of a vacancy in silicon as evidenced by vacancy profiles produced by rapid thermal annealing.
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- Physica Status Solidi (B), 2014, v. 251, n. 11, p. 2179, doi. 10.1002/pssb.201400014
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- Article
Composition of uncontrolled impurities and their chemical states and depth profiles at the Al-Si interface.
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- Technical Physics, 2015, v. 60, n. 4, p. 621, doi. 10.1134/S1063784215040027
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A New Relationship Among Self- and Impurity Diffusion Coefficients in Binary Solution Phases.
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- Metallurgical & Materials Transactions. Part A, 2016, v. 47, n. 7, p. 3295, doi. 10.1007/s11661-016-3537-0
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A study of tin impurities in crystalline and amorphous silicon by means of Mössbauer spectroscopy.
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- Glass Physics & Chemistry, 2013, v. 39, n. 3, p. 287, doi. 10.1134/S1087659613030127
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Quantitative measurement of crystalline impurity in a pharmaceutical tablet by X-ray powder diffraction and method validation.
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- Powder Diffraction, 2013, v. 28, n. 3, p. 222, doi. 10.1017/S0885715613000432
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- Article
Impurity induced scale-free localization.
- Published in:
- Communications Physics, 2021, v. 4, n. 1, p. 1, doi. 10.1038/s42005-021-00547-x
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- Article