Works matching DE "IMPURITY distribution in semiconductors"
1
- International Journal of Nanoscience, 2007, v. 6, n. 3/4, p. 253, doi. 10.1142/S0219581X0700447X
- GAVRILENKO, L. V.;
- YA. ALESHKIN, V.;
- DUBINOV, A. A.
- Article
2
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 12, p. 1235, doi. 10.1007/s10854-007-9131-x
- Jun Shen;
- Yongchang Liu;
- Yajing Han;
- Houxiu Gao
- Article
3
- Ferroelectrics, 2004, v. 304, n. 1, p. 83, doi. 10.1080/00150190490454611
- Trepakov, V.A.;
- Kapphan, S.E.;
- Bednorz, J.G.;
- Gregora, I.;
- Jastrabik, L.
- Article
4
- Ferroelectrics, 2002, v. 268, n. 1, p. 17, doi. 10.1080/00150190211045
- Article
5
- Plasma Physics Reports, 2007, v. 33, n. 11, p. 906, doi. 10.1134/S1063780X07110037
- Morozov, D. Kh.;
- Baronova, E. O.;
- Senichenkov, I. Yu.
- Article
6
- Plasma Physics Reports, 2001, v. 27, n. 12, p. 1011, doi. 10.1134/1.1426134
- Article
7
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep06917
- Baimuratov, Anvar S.;
- Rukhlenko, Ivan D.;
- Turkov, Vadim K.;
- Ponomareva, Irina O.;
- Leonov, Mikhail Yu.;
- Perova, Tatiana S.;
- Berwick, Kevin;
- Baranov, Alexander V.;
- Fedorov, Anatoly V.
- Article
8
- Journal of Nano- & Electronic Physics, 2015, v. 7, n. 2, p. 02032-1
- Stashans, A.;
- Puchaicela, P.
- Article
9
- Journal of Nano- & Electronic Physics, 2012, v. 4, n. 3, p. 3026-1
- Mazinov, A. S.;
- Shevchenko, A. I.;
- Bykov, M. A.
- Article
10
- Quarterly Journal of Mechanics & Applied Mathematics, 1998, v. 51, n. 4, p. 515, doi. 10.1093/qjmam/51.4.515
- Article
11
- European Physical Journal B: Condensed Matter, 2011, v. 81, n. 4, p. 441, doi. 10.1140/epjb/e2011-20265-0
- Duque, C.;
- Mora-Ramos, M.;
- Kasapoglu, E.;
- Sari, H.;
- Sökmen, I.
- Article
12
- European Physical Journal B: Condensed Matter, 2011, v. 81, n. 1, p. 79, doi. 10.1140/epjb/e2011-10831-9
- Article
13
- European Physical Journal B: Condensed Matter, 2011, v. 79, n. 3, p. 371, doi. 10.1140/epjb/e2010-10799-x
- Asfaw, M.;
- Aragie, B.;
- Bekele, M.
- Article
14
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2018, v. 32, n. 13, p. -1, doi. 10.1142/S0217979218501540
- Article
15
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2017, v. 31, n. 9, p. -1, doi. 10.1142/S0217979217500643
- Wu, Jiao;
- Huang, Wei-Qing;
- Yang, Ke;
- Wei, Zeng-Xi;
- Peng, P.;
- Huang, Gui-Fang
- Article
16
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2017, v. 31, n. 9, p. -1, doi. 10.1142/S0217979217500667
- Article
17
- International Journal of High Speed Electronics & Systems, 2003, v. 13, n. 3, p. 849, doi. 10.1142/S0129156403002058
- Article
18
- Semiconductors, 2001, v. 35, n. 11, p. 1242
- Gorban’, I. S.;
- Krokhmal’, A. P.
- Article
19
- Semiconductors, 2001, v. 35, n. 11, p. 1223, doi. 10.1134/1.1418062
- Onopko, D. E.;
- Ryskin, A. I.
- Article
20
- Semiconductors, 2001, v. 35, n. 11, p. 1254, doi. 10.1134/1.1418067
- Zykov, V. A.;
- Gavrikova, T. A.;
- Il’in, V. I.;
- Nemov, S. A.;
- Savintsev, P. V.
- Article
21
- Semiconductors, 2001, v. 35, n. 4, p. 371, doi. 10.1134/1.1365176
- Gerasimov, A. B.;
- Chiradze, G. D.
- Article
22
- Semiconductors, 2001, v. 35, n. 4, p. 398, doi. 10.1134/1.1365182
- Chumachkova, M. M.;
- Roıtsin, A. B.
- Article
23
- Semiconductors, 2001, v. 35, n. 2, p. 138, doi. 10.1134/1.1349919
- Sokolov, V. I.;
- Starovoıtova, V. N.
- Article
24
- Semiconductors, 2001, v. 35, n. 2, p. 132, doi. 10.1134/1.1349917
- Abramov, A. A.;
- Tulupenko, V. N.;
- Firsov, D. A.
- Article
25
- Semiconductors, 2001, v. 35, n. 2, p. 177, doi. 10.1134/1.1349927
- Vlasenko, L. S.;
- Gorelenok, A. T.;
- Emtsev, V. V.;
- Kamanin, A. V.;
- Poloskin, D. S.;
- Shmidt, N. M.
- Article
26
- Semiconductors, 2001, v. 35, n. 2, p. 199, doi. 10.1134/1.1349932
- Khanin, Yu. N.;
- Novoselov, K. S.;
- Vdovin, E. E.
- Article
27
- Semiconductors, 2000, v. 34, n. 10, p. 1193, doi. 10.1134/1.1317582
- Krevchik, V. D.;
- Zaıtsev, R. V.;
- Evstifeev, V. V.
- Article
28
- Semiconductors, 2000, v. 34, n. 5, p. 510, doi. 10.1134/1.1188016
- Aleksandrov, O. V.;
- Zakhar’in, A. O.;
- Sobolev, N. A.;
- Nikolaev, Yu. A.
- Article
29
- Semiconductors, 2000, v. 34, n. 4, p. 441, doi. 10.1134/1.1188004
- Gavrilovets, V. V.;
- Bondarenko, V. B.;
- Kudinov, Yu. A.;
- Korablev, V. V.
- Article
30
- Semiconductors, 2000, v. 34, n. 3, p. 269, doi. 10.1134/1.1187969
- Nasredinov, F. S.;
- Seregin, N. P.;
- Seregin, P. P.;
- Bondarevskiı, S. I.
- Article
31
- Semiconductors, 1999, v. 33, n. 3, p. 265, doi. 10.1134/1.1187676
- Guk, E. G.;
- Kamanin, A. V.;
- Shmidt, N. M.;
- Shuman, V. B.;
- Yurre, T. A.
- Article
32
- Semiconductors, 1997, v. 31, n. 2, p. 139, doi. 10.1134/1.1187095
- Boyarskaya, Yu. S.;
- Grabko, D. Z.;
- Medinskaya, M. I.;
- Palistrant, N. A.
- Article
33
- Journal of Materials Science, 2012, v. 47, n. 5, p. 2384, doi. 10.1007/s10853-011-6057-8
- Nikolic, P.;
- Paraskevopoulos, K.;
- Zachariadis, G.;
- Valasiadis, O.;
- Zorba, T.;
- Vujatovic, S.;
- Nikolic, N.;
- Aleksic, O.;
- Ivetic, T.;
- Cvetkovic, O.;
- Blagojevic, V.;
- Nikolic, M.
- Article
34
- Nature, 2005, v. 436, n. 7047, p. 32, doi. 10.1038/436032a
- Article
35
- Journal of Modern Technology & Engineering, 2021, v. 6, n. 2, p. 151
- Article
36
- Applied Physics A: Materials Science & Processing, 2004, v. 78, n. 7, p. 1053, doi. 10.1007/s00339-003-2161-1
- Kasapoglu, E.;
- Sari, H.;
- Sokmen, I.
- Article
37
- Applied Physics A: Materials Science & Processing, 2001, v. 73, n. 4, p. 425, doi. 10.1007/s003390100902
- Wautelet, M.;
- Dauchot, J.P.;
- Hecq, M.
- Article
38
- Contributions to Plasma Physics, 2016, v. 56, n. 6-8, p. 628, doi. 10.1002/ctpp.201610036
- Dai, S.;
- Kobayashi, M.;
- Kawamura, G.;
- Morita, S.;
- Oishi, T.;
- Zhang, H. M.;
- Huang, X.L.;
- Feng, Y.;
- Wang, D. Z.;
- Suzuki, Y.;
- the LHD experiment group
- Article
39
- Contributions to Plasma Physics, 2016, v. 56, n. 6-8, p. 698, doi. 10.1002/ctpp.201611004
- Article
40
- Contributions to Plasma Physics, 2016, v. 56, n. 6-8, p. 742, doi. 10.1002/ctpp.201610055
- Pigarov, A. Yu.;
- Krasheninnikov, S.I.;
- Hollmann, E. M.;
- Rognlien, T. D.
- Article
41
- Contributions to Plasma Physics, 2014, v. 54, n. 4/6, p. 404, doi. 10.1002/ctpp.201410032
- Hoshino, K.;
- Shimizu, K.;
- Kawashima, H.;
- Takizuka, T.;
- Nakano, T.;
- Ide, S.
- Article
42
- Surface Review & Letters, 2006, v. 13, n. 6, p. 747, doi. 10.1142/S0218625X06008797
- KASAPOGLU, E.;
- SARI, H.;
- YESILGUL, U.;
- SÖKMEN, I.
- Article
43
- Surface Review & Letters, 2005, v. 12, n. 2, p. 155, doi. 10.1142/S0218625X05006871
- Kasapoglu, E.;
- Sari, H.;
- Sökmen, I.
- Article
44
- Fractals, 2015, v. 23, n. 1, p. -1, doi. 10.1142/S0218348X15400022
- LU, DA-PENG;
- LIU, YI;
- HE, GAOHONG;
- JIANG, XIAO-BIN
- Article
45
- Journal of Electronic Materials, 2011, v. 40, n. 5, p. 1221, doi. 10.1007/s11664-011-1610-4
- Bhattacharya, Sitangshu;
- Mallik, Ramesh
- Article
46
- Philosophical Magazine, 2010, v. 90, n. 29, p. 3919, doi. 10.1080/14786435.2010.502143
- Koizumi, Yuichiro;
- Mizuno, Masataka;
- Sugihara, Atsushi;
- Minamino, Yoritoshi;
- Shirai, Yasuharu
- Article
47
- Philosophical Magazine, 2006, v. 86, n. 13/14, p. 1807, doi. 10.1080/14786430500070396
- Article
48
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 1, p. 839, doi. 10.1007/s10854-016-5598-7
- Zhu, He;
- Xu, Jintao;
- Zhu, Jiaqi;
- Wang, Miao;
- Wu, Huizhen;
- Li, Ning;
- Dai, Ning
- Article
49
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 8, p. 8670, doi. 10.1007/s10854-016-4888-4
- Article
50
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 3, p. 2687, doi. 10.1007/s10854-015-4078-9
- Lu, Xiaochi;
- Huang, Baoyu;
- Chen, Tao;
- Fu, Zhenxiao;
- Wang, Zhefei;
- Wang, Lixi;
- Zhang, Qitu
- Article