Works matching DE "IMPACT ionization"


Results: 232
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    Demonstration of Unified Memory in FinFETs.

    Published in:
    International Journal of High Speed Electronics & Systems, 2014, v. 23, n. 3/4, p. 1, doi. 10.1142/S0129156414500190
    By:
    • Sung-Jae Chang;
    • Bawedin, Maryline;
    • Jong-Hyun Lee;
    • Jung-Hee Lee;
    • Cristoloveanu, Sorin
    Publication type:
    Article
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    Correction.

    Published in:
    2023
    Publication type:
    Correction Notice
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