Works matching DE "HOLE traps (Semiconductors)"
1
- Advanced Materials Interfaces, 2018, v. 5, n. 19, p. N.PAG, doi. 10.1002/admi.201800645
- Zhang, Yanjun;
- Zhang, Shasha;
- Wu, Shaohang;
- Chen, Chuanliang;
- Zhu, Hongmei;
- Xiong, Zhenzhong;
- Chen, Weitao;
- Chen, Rui;
- Fang, Shaoying;
- Chen, Wei
- Article
2
- JETP Letters, 2017, v. 105, n. 10, p. 646, doi. 10.1134/S0021364017100101
- Article
3
- IPSJ Transactions on System LSI Design Methodology, 2020, v. 13, n. 1, p. 56, doi. 10.2197/ipsjtsldm.13.56
- TAKUMI HOSAKA;
- SHINICHI NISHIZAWA;
- RYO KISHIDA;
- TAKASHI MATSUMOTO;
- KAZUTOSHI KOBAYASHI
- Article
4
- Physica Status Solidi. A: Applications & Materials Science, 2017, v. 214, n. 1, p. n/a, doi. 10.1002/pssa.201600433
- Barkat, L.;
- Hssein, M.;
- El Jouad, Z.;
- Cattin, L.;
- Louarn, G.;
- Stephant, N.;
- Khelil, A.;
- Ghamnia, M.;
- Addou, M.;
- Morsli, M.;
- Bernède, J. C.
- Article
5
- Physica Status Solidi. A: Applications & Materials Science, 2013, v. 210, n. 11, p. 2463, doi. 10.1002/pssa.201329177
- Oniya, Ebenezer O.;
- Polymeris, George S.;
- Jibiri, Nnamdi N.;
- Tsirliganis, Nestor C.;
- Babalola, Israel A.;
- Kitis, George
- Article