Works matching DE "HIGH energy electron diffraction"
1
- Surface Engineering, 2004, v. 20, n. 2, p. 143, doi. 10.1179/026708404225014889
- Article
2
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 18, p. 13464, doi. 10.1007/s10854-017-7185-y
- Sorokin, B.;
- Bormashov, V.;
- Korostilev, E.;
- Novoselov, A.;
- Doronin, M.;
- Kravchuk, K.;
- Blank, V.
- Article
3
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 2, p. 969, doi. 10.1007/s10854-013-1673-5
- Qin, Fu-Wen;
- Zhong, Miao-Miao;
- Liu, Yue-Mei;
- Wang, Hui;
- Bian, Ji-Ming;
- Wang, Chong;
- Zhao, Yue;
- Zhang, Dong;
- Li, Qin-ming
- Article
4
- Inorganic Materials, 2012, v. 48, n. 2, p. 123, doi. 10.1134/S0020168512010013
- Article
5
- European Physical Journal D (EPJ D), 2010, v. 59, n. 3, p. 361, doi. 10.1140/epjd/e2010-00197-1
- Article
6
- Physica Status Solidi - Rapid Research Letters, 2018, v. 12, n. 2, p. 1, doi. 10.1002/pssr.201700364
- Sun, Yizhu;
- Zhou, Yunpeng;
- Lu, Qingshan;
- Zhao, Shifeng
- Article
7
- Applied Physics A: Materials Science & Processing, 2006, v. 83, n. 3, p. 411, doi. 10.1007/s00339-006-3520-5
- Xu, J.;
- Thakur, J. S.;
- Hu, G.;
- Wang, Q.;
- Danylyuk, Y.;
- Ying, H.;
- Auner, G. W.
- Article
8
- Applied Physics A: Materials Science & Processing, 2003, v. 77, n. 3/4, p. 403, doi. 10.1007/s00339-002-1997-0
- Cerofolini, G.F.;
- Galati, C.;
- Lorenti, S.;
- Renna, L.;
- Viscuso, O.;
- Bongiorno, C.;
- Raineri, V.;
- Spinella, C.;
- Condorelli, G.G.;
- Fragalà, I.L.;
- Terrasi, A.
- Article
9
- Semiconductors, 2018, v. 52, n. 3, p. 390, doi. 10.1134/S1063782618030107
- Esin, M. Yu.;
- Nikiforov, A. I.;
- Timofeev, V. A.;
- Tuktamyshev, A. R.;
- Mashanov, V. I.;
- Loshkarev, I. D.;
- Deryabin, A. S.;
- Pchelyakov, O. P.
- Article
10
- Semiconductors, 2006, v. 40, n. 12, p. 1432, doi. 10.1134/S1063782606120116
- Chaldyshev, V. V.;
- Shkol’nik, A. S.;
- Evtikhiev, V. P.;
- Holden, T.
- Article
11
- Semiconductors, 2005, v. 39, n. 11, p. 1352, doi. 10.1134/1.2128465
- Article
12
- Semiconductors, 2004, v. 38, n. 10, p. 1202, doi. 10.1134/1.1808829
- Tonkikh, A. A.;
- Cirlin, G. E.;
- Dubrovskii, V. G.;
- Ustinov, V. M.;
- Werner, P.
- Article
13
- Journal of Electronic Materials, 2009, v. 38, n. 8, p. 1645, doi. 10.1007/s11664-009-0787-2
- Moravec, P.;
- Ivanits'ka, V.G.;
- Franc, J.;
- Tomashik, Z. F.;
- Tomashik, V. M.;
- Mašek, K.;
- Feychuk, P. I.;
- Shcherbak, L. P.;
- Höschl, P.;
- Grill, R.;
- Walter, J.
- Article
14
- Philosophical Magazine, 2005, v. 85, n. 36, p. 4465, doi. 10.1080/14786430500306501
- Qin, Y. L.;
- Zandbergen, H. W.;
- Yang, Z. Q.;
- Aarts, J.
- Article
15
- Technical Physics, 2014, v. 59, n. 11, p. 1674, doi. 10.1134/S1063784214110218
- Podsvirov, O.;
- Sidorov, A.;
- Churaev, D.
- Article
16
- Metals (2075-4701), 2017, v. 7, n. 7, p. 232, doi. 10.3390/met7070232
- Allain, Sébastien Yves Pierre;
- Geandier, Guillaume;
- Hell, Jean-Christophe;
- Soler, Michel;
- Danoix, Frédéric;
- Gouné, Mohamed
- Article
17
- Applied Physics A: Materials Science & Processing, 2021, v. 127, n. 6, p. 1, doi. 10.1007/s00339-021-04568-9
- Puech, Pascal;
- Gerber, Iann C.;
- Piazza, Fabrice;
- Monthioux, Marc
- Article
18
- Applied Physics A: Materials Science & Processing, 2011, v. 105, n. 3, p. 697, doi. 10.1007/s00339-011-6532-8
- Chen, Y.;
- Pryds, N.;
- Schou, J.;
- Linderoth, S.
- Article
19
- Applied Physics A: Materials Science & Processing, 2011, v. 104, n. 1, p. 257, doi. 10.1007/s00339-010-6120-3
- Wang, Lu;
- Li, Meicheng;
- Wang, Wenxin;
- Tian, Haitao;
- Xing, Zhigang;
- Xiong, Min;
- Zhao, Liancheng
- Article
20
- European Physical Journal C -- Particles & Fields, 2006, v. 48, n. 2, p. 467, doi. 10.1140/epjc/s10052-006-0025-5
- Khoze, V. A.;
- Martin, A. D.;
- Ryskin, M. G.
- Article
21
- Journal of Electromagnetic Waves & Applications, 2014, v. 28, n. 15, p. 1869, doi. 10.1080/09205071.2014.945664
- Article
22
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2009, v. 23, n. 23, p. 4817, doi. 10.1142/S0217979209053813
- ATUCHIN, V. V.;
- KHASANOV, T.;
- KOCHUBEY, V. A.;
- POKROVSKY, L. D.;
- GAVRILOVA, T. A.
- Article
23
- Technical Physics, 1997, v. 42, n. 8, p. 956, doi. 10.1134/1.1258761
- Gur’yanov, G. M.;
- Demidov, V. N.;
- Korneeva, N. P.;
- Petrov, V. N.;
- Samsonenko, Yu. B.;
- Tsyrlin, G. É.
- Article
24
- Geomagnetism & Aeronomy, 2018, v. 58, n. 8, p. 1144, doi. 10.1134/S0016793218080212
- Zaitsev, V. V.;
- Stepanov, A. V.
- Article
25
- Laser & Particle Beams, 2013, v. 31, n. 1, p. 23, doi. 10.1017/S0263034612000961
- Korobkin, V.V.;
- Romanovskiy, M.Yu.;
- Trofimov, V.A.;
- Shiryaev, O.B.
- Article
26
- Scientific Reports, 2015, p. 10634, doi. 10.1038/srep10634
- Liang, Yan;
- Li, Wentao;
- Zhang, Shuyuan;
- Lin, Chaojing;
- Li, Chao;
- Yao, Yuan;
- Li, Yongqing;
- Yang, Hao;
- Guo, Jiandong
- Article
27
- Surface Review & Letters, 1999, v. 6, n. 5, p. 781, doi. 10.1142/S0218625X99000792
- Kim, Y. W.;
- White, G. A.;
- Reibel, R.;
- Smith, R. J.
- Article
28
- Microscopy & Microanalysis, 2009, v. 15, n. 4, p. 323, doi. 10.1017/S1431927609090709
- Ruan, Chong-Yu;
- Murooka, Yoshie;
- Raman, Ramani K.;
- Murdick, Ryan A.;
- Worhatch, Richard J.;
- Pell, Aric
- Article
29
- Microscopy & Microanalysis, 2009, v. 15, n. 4, p. 290, doi. 10.1017/S1431927609090412
- Musumeci, P.;
- Faillace, L.;
- Fukasawa, A.;
- Moody, J. T.;
- O'Shea, B.;
- Rosenzweig, J. B.;
- Scoby, C. M.
- Article
30
- Technical Physics Letters, 2011, v. 37, n. 6, p. 582, doi. 10.1134/S1063785011060277
- Oreshkin, E.;
- Barengol'ts, S.;
- Oginov, A.;
- Oreshkin, V.;
- Chaikovskii, S.;
- Shpakov, K.
- Article
31
- Technical Physics Letters, 2007, v. 33, n. 6, p. 517, doi. 10.1134/S1063785007060211
- Ashurbekov, N.;
- Iminov, K.;
- Kobzeva, V.;
- Kobzev, O.
- Article
32
- Technical Physics Letters, 2004, v. 30, n. 9, p. 744, doi. 10.1134/1.1804583
- Kukin, V. N.;
- Borgardt, N. I.;
- Agafonov, A. V.;
- Kuznetsov, V. O.
- Article
33
- Technical Physics Letters, 1999, v. 25, n. 9, p. 749, doi. 10.1134/1.1262621
- Vasilyak, L. M.;
- Vetchinin, S. P.;
- Polyakov, D. N.
- Article
34
- Iranian Journal of Physics Research, 2011, v. 11, n. 3, p. 25
- Article
35
- Journal of the American Ceramic Society, 2010, v. 93, n. 9, p. 2884, doi. 10.1111/j.1551-2916.2010.03774.x
- Chatzichristodoulou, Christodoulos;
- Ming Chen;
- Bowen, Jacob R.;
- Yi-Lin Liu
- Article
36
- Physics of Atomic Nuclei, 2005, v. 68, n. 12, p. 1988, doi. 10.1134/1.2149079
- Pasitchny, A. A.;
- Prygodjuk, O. A.
- Article
37
- Crystallography Reports, 2010, v. 55, n. 5, p. 743, doi. 10.1134/S1063774510050044
- Article
38
- Crystallography Reports, 2010, v. 55, n. 4, p. 551, doi. 10.1134/S1063774510040036
- Karakhanyan, R. K.;
- Karakhanyan, K. R.
- Article
39
- Earth, Planets & Space, 2018, v. 70, n. 1, p. 1, doi. 10.1186/s40623-017-0771-7
- Katoh, Yuto;
- Kojima, Hirotsugu;
- Hikishima, Mitsuru;
- Takashima, Takeshi;
- Asamura, Kazushi;
- Miyoshi, Yoshizumi;
- Kasahara, Yoshiya;
- Kasahara, Satoshi;
- Mitani, Takefumi;
- Higashio, Nana;
- Matsuoka, Ayako;
- Ozaki, Mitsunori;
- Yagitani, Satoshi;
- Yokota, Shoichiro;
- Matsuda, Shoya;
- Kitahara, Masahiro;
- Shinohara, Iku
- Article
40
- Materials (1996-1944), 2015, v. 8, n. 4, p. 1924, doi. 10.3390/ma8041924
- Kazuhisa Sato;
- Satoshi Semboshi;
- Konno, Toyohiko J.
- Article
41
- International Journal of Modern Physics A: Particles & Fields; Gravitation; Cosmology; Nuclear Physics, 2010, v. 25, n. 18/19, p. 3733, doi. 10.1142/S0217751X10049748
- SINEGOVSKY, S. I.;
- KOCHANOV, A. A.;
- SINEGOVSKAYA, T. S.;
- MISAKI, A.;
- TAKAHASHI, N.
- Article
42
- Journal of Applied Crystallography, 2015, v. 48, n. 6, p. 1927, doi. 10.1107/S1600576715020415
- Mitura, Zbigniew;
- Dudarev, Sergei L.
- Article
43
- Journal of Applied Crystallography, 2014, v. 47, n. 3, p. 1032, doi. 10.1107/S1600576714009200
- Samuha, Shmuel;
- Krimer, Yaakov;
- Meshi, Louisa
- Article
44
- Journal of Materials Science, 2007, v. 42, n. 16, p. 6956, doi. 10.1007/s10853-006-1290-2
- Liu, B. T.;
- Li, F.;
- Cheng, C. S.;
- Wu, D. Q.;
- Yan, X. B.;
- Bian, F.;
- Yan, Z.;
- Zhao, Q. X.;
- Zhang, X. Y.
- Article
45
- Journal of Materials Science, 2006, v. 41, n. 22, p. 7562, doi. 10.1007/s10853-006-0841-x
- Bahadur, Harish;
- Samanta, S. B.;
- Srivastava, A. K.;
- Sood, K. N.;
- Kishore, R.;
- Sharma, R. K.;
- Basu, A.;
- Rashmi;
- Kar, M.;
- Pal, Prem;
- Bhatt, Vivekanand;
- Chandra, Sudhir
- Article
46
- Journal of Materials Science, 2004, v. 39, n. 7, p. 2637, doi. 10.1023/B:JMSC.0000020047.61719.50
- Cai, L.C.;
- Chen, H.;
- Bao, C.L.;
- Huang, Q.;
- Zhou, J.M.
- Article
47
- Surfaces (2571-9637), 2022, v. 5, n. 2, p. 321, doi. 10.3390/surfaces5020024
- Ekstrum, Craig A.;
- Venkatesan, Ragavendran;
- Kendrick, Chito;
- Einav, Moshe;
- Sivaprakash, Paramasivam;
- Mayandi, Jeyanthinath;
- Arumugam, Sonachalam;
- Pearce, Joshua M.
- Article
48
- Acta Physica Polonica: A, 2016, v. 130, n. 4, p. 1134, doi. 10.12693/APhysPolA.130.1134
- Article
49
- Physics of Atomic Nuclei, 2016, v. 79, n. 2, p. 228, doi. 10.1134/S1063778816020216
- Article
50
- Metallurgical & Materials Transactions. Part A, 2017, v. 48, n. 1, p. 354, doi. 10.1007/s11661-016-3831-x
- Demkowicz, Michael;
- Bagri, Akbar;
- Gradečak, Silvija;
- Hanson, John;
- Lind, Jonathan;
- Suter, Robert;
- Kenesei, Peter
- Article