Works matching DE "HELIUM ions"

Results: 445

In Situ Study of Nanostructure and Electrical Resistance of Nanocluster Films Irradiated with Ion Beams.

Published in:

Advanced Functional Materials, 2014, v. 24, n. 39, p. 6210, doi. 10.1002/adfm.201400553

By:

Jiang, Weilin;
Sundararajan, Jennifer A.;
Varga, Tamas;
Bowden, Mark E.;
Qiang, You;
McCloy, John S.;
Henager, Charles. H.;
Montgomery, Robert O.

Publication type:

Article

Thermal behaviour of advanced composite materials based on SiC fibres.

Published in:

Journal of Thermal Analysis & Calorimetry, 2003, v. 72, n. 1, p. 119, doi. 10.1023/A:1023911517968

By:

Balek, V.;
Mitsuhashi, T.;
Scaron;ubrt, J.;
Bakardjieva, S.;
Málek, Z.

Publication type:

Article

Study of nanopipes formed in silicon wafers using helium implantation by SEM, RBS and SIMS methods.

Published in:

Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 239, doi. 10.1007/s10854-008-9654-9

By:

Frantskevich, A. V.;
Saad, A. M.;
Mazanik, A. V.;
Frantskevich, N. V.;
Fedotov, A. K.;
Kulinkauskas, V. S.;
Patryn, A. A.

Publication type:

Article

Secondary Electron Imaging, Variable Pressure (ESEM), Helium Ion Microscopy and Kangaroos - My Perspective of David Joy!

Published in:

2023

By:

Griffin, Brendan J

Publication type:

Abstract

Mapping Nanoscale Thermal Gradients in MoS<sub>2</sub> using Plasmon Energy Shifts.

Published in:

Microscopy & Microanalysis, 2019, p. 1870, doi. 10.1017/S1431927618009832

By:

Mecklenburg, Matthew;
Shen, Lang;
Aloni, Shaul;
Cronin, Steve

Publication type:

Article

Secondary Ion Mass Spectrometry on the Helium Ion Microscope: methodologies for analysis of nanomaterials.

Published in:

2019

By:

Audinot, Jean-Nicolas;
Vollnhals, Florian;
Gratia, Paul;
Eswara, Santhana;
Philipp, Patrick;
Wirtz, Tom

Publication type:

Abstract

Time of Flight Backscatter and Secondary Ion Spectrometry in a Helium Ion Microscope.

Published in:

2019

By:

Klingner, Nico;
Hlawacek, Gregor;
Heller, Rene;
von Borany, Johannes;
Facsko, Stefan

Publication type:

Abstract

3D Nanostructures Grown via Focused Helium Ion Beam Induced Deposition.

Published in:

Microscopy & Microanalysis, 2019, p. 332, doi. 10.1017/S1431927618002155

By:

Burch, Matthew J.;
Ievlev, Anton;
Kim, Songkil;
Belianinov, Alex;
Ovchinnikova, Olga S.;
Stanford, Michael G.;
Mahady, Kyle;
Lewis, Brett B.;
Fowlkes, Jason D.;
Rack, Philip D.

Publication type:

Article

Liquid Cell Crystallization and In-situ Imaging of Thiamethoxam by Helium Ion Microscopy.

Published in:

Microscopy & Microanalysis, 2019, p. 330, doi. 10.1017/S1431927618002143

By:

Pawlicki, Alison;
Bruch, Matt;
Ievlev, Anton;
Fowler, Jeff;
Ovchinnikova, Olga;
Belianinov, Alex

Publication type:

Article

In Situ Thickness Assessment During Ion Milling of a Free-Standing Membrane Using Transmission Helium Ion Microscopy.

Published in:

Microscopy & Microanalysis, 2013, v. 19, n. 3, p. 740, doi. 10.1017/S1431927613000500

By:

Hall, Adam R.

Publication type:

Article

Ionoluminescence in the Helium Ion Microscope.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. 6, p. 1253, doi. 10.1017/S1431927612013463

By:

Boden, Stuart A.;
Franklin, Thomas M.W.;
Scipioni, Larry;
Bagnall, Darren M.;
Rutt, Harvey N.

Publication type:

Article

Helium-Ion Microscopy Of Carbon Nanomembranes.

Published in:

2012

By:

Beyer, A.;
Gölzhäuser, A.

Publication type:

Abstract

Secondary Electrons Energy Distribution In Helium Ion Microscope And Contrast Manipulation.

Published in:

2012

By:

Petrov, Y.;
Vyvenko, O.

Publication type:

Abstract

Nano-structuring and modification with a focused helium ion beam.

Published in:

2012

By:

Fox, D.;
Chen, Y.;
Faulkner, C.;
Zhang, H.

Publication type:

Abstract

High Resolution Imaging Of The Rat Kidney Epithelium By Helium Ion Microscopy.

Published in:

2012

By:

Rice, W.L.;
Van Hoek, A.;
Brown, D.;
Huynh, C.;
Scipioni, L.

Publication type:

Abstract

Nanopatterning with the Helium Ion Microscope.

Published in:

2012

By:

Pickard, D.S.;
Viswanathan, V.;
Fang, C.;
Ai, Z.;
Hao, H.;
Wang, Y.;
Bosman, M.;
Dorfmüller, J.;
Giessen, H.

Publication type:

Abstract

Formation of markers by a helium ion microscope for TEM tomography.

Published in:

2012

By:

Hayashida, M.;
Iijima, T.;
Tsukahara, M.;
Fujimoto, T.;
Ogawa, S.

Publication type:

Abstract

Luminescence imaging and spectroscopy of rare earth doped lanthanum nanoparticles in a helium ion microscope.

Published in:

2012

By:

Franklin, T.M.;
Boden, S.A.;
Bagnall, D.M.;
Rutt, H.N.;
Scipioni, L.

Publication type:

Abstract

Towards Secondary Ion Mass Spectrometry On The Helium Ion Microscope.

Published in:

2012

By:

Wirtz, T.;
Pillatsch, L.;
Vanhove, N.;
Dowsett, D.;
Sijbrandij, S.;
Notte, J.

Publication type:

Abstract

Channeling Contrast in Helium Ion Microscopy.

Published in:

2012

By:

Bell, D.C.

Publication type:

Abstract

A Study of Helium Ion Beam Substrate Interaction Volume on Nanomachining Profiles in Bulk Substrates and Thin Film Membranes.

Published in:

2012

By:

Livengood, R.;
Tan, S.;
Greenzweig, Y.;
Hallstein, R.;
Shima, D.;
Klein, K.;
Vladar, A.E.

Publication type:

Abstract

Site specific He ion irradiation damage studies in nanolayered thin films by cross-coupling Helium Ion Microscopy with TEM and APT.

Published in:

2012

By:

Vaithaiyalingam, S.;
Devaraj, A.;
Venkata Rama Shesha R, V.;
Wang, C.;
Varga, T.;
Thevuthasan, S.;
Henager, C.H.

Publication type:

Abstract

Increasing Ion-current Density by Modifying the Radius of Curvature at the Apex of an Ion-emitter Tip.

Published in:

2012

By:

Matsubara, S.;
Shichi, H.;
Hashizume, T.

Publication type:

Abstract

Helium ions for nano-engineering.

Published in:

2012

By:

van Veldhoven, E.;
Maas, D.

Publication type:

Abstract

Channeling in Scanning Transmission Helium-Ion Microscopy.

Published in:

2012

By:

Allen, L.J.;
D'Alfonso, A.J.

Publication type:

Abstract

Is Microanalysis Possible in the Helium Ion Microscope?

Published in:

Microscopy & Microanalysis, 2011, v. 17, n. 4, p. 643, doi. 10.1017/S1431927611000596

By:

Joy, David C.;
Griffin, Brendan J.

Publication type:

Article

Resolution Limits of Secondary Electron Dopant Contrast in Helium Ion and Scanning Electron Microscopy.

Published in:

Microscopy & Microanalysis, 2011, v. 17, n. 4, p. 637, doi. 10.1017/S1431927611000365

By:

Jepson, Mark;
Liu, Xiong;
Bell, David;
Ferranti, David;
Inkson, Beverley;
Rodenburg, Cornelia

Publication type:

Article

Helium Ion Microscope Analysis of Used JLab Photocathode Samples.

Published in:

2011

By:

Shutthanandan, V;
Zhu, Z;
Nandasri, M;
Kuchibhatla, S;
Thevuthasan, S;
Hess, W;
Hernandez-Garcia, C

Publication type:

Abstract

Helium Ion Microscopy to Study Bulk Hetero Junction Polymer Solar Cell Materials.

Published in:

2011

By:

Rodenburg, C;
Pearson, A;
Lidzey, D;
Boden, S;
Bagnall, D

Publication type:

Abstract

MeV Helium Ion Imaging of Gold Nanoparticles in Whole Cells.

Published in:

2011

By:

Xiao, C;
Minqin, R;
Ce-Belle, C;
Udalagama, C;
Bettiol, A;
Ee, F;
Yue, L;
Watt, F

Publication type:

Abstract

Contrast Performance: Low Voltage Electrons vs. Helium Ions.

Published in:

2011

By:

Bell, D

Publication type:

Abstract

Nanofabrication with a High Resolution Helium Ion Beam.

Published in:

2010

By:

Van Veldhoven, Emile;
Sidorkin, Vadim;
Ping Chen;
Alkemade, Paul;
Van der Drift, Emile;
Salemink, Huub;
Zandbergen, Henny;
Maas, Diederik

Publication type:

Abstract

Helium Ion Microscopy for the Characterization of Complex 3D Structures in a C/CrC Nanocomposite.

Published in:

2010

By:

Zhou, Z.;
Jepson, M. A. E.;
Liu, X.;
Rainforth, W. M.;
Rodenburg, C.

Publication type:

Abstract

Characterization of Helium Ion Implantation Damage in Metallic Multilayers.

Published in:

2010

By:

Misra, A.;
Bhattacharyya, D.;
Wei, Q.;
Nastasi, M.

Publication type:

Abstract

Contrast Mechanisms and Image Formation in Helium Ion Microscopy.

Published in:

Microscopy & Microanalysis, 2009, v. 15, n. 2, p. 147, doi. 10.1017/S1431927609090138

By:

Bell, David C.

Publication type:

Article

Helium: Sources, Applications, Supply, and Demand.

Published in:

2023

By:

Serra Leal, Juan Sebastian;
Incer-Valverde, Jimena;
Morosuk, Tatiana

Publication type:

Editorial

Helium Abundance Decrease in ICMEs in 23–24 Solar Cycles.

Published in:

Universe (2218-1997), 2022, v. 8, n. 11, p. 557, doi. 10.3390/universe8110557

By:

Khokhlachev, Alexander A.;
Yermolaev, Yuri I.;
Lodkina, Irina G.;
Riazantseva, Maria O.;
Rakhmanova, Liudmila S.

Publication type:

Article

Dynamics of He ++ Ions at Interplanetary and Earth's Bow Shocks.

Published in:

Universe (2218-1997), 2022, v. 8, n. 10, p. N.PAG, doi. 10.3390/universe8100516

By:

Sapunova, Olga V.;
Borodkova, Natalia L.;
Zastenker, Georgii N.;
Yermolaev, Yuri I.

Publication type:

Article

Special Considerations for Helium-Filled Ion Chambers.

Published in:

Instruments (2410-390X), 2025, v. 9, n. 1, p. 5, doi. 10.3390/instruments9010005

By:

Heald, Steve M.

Publication type:

Article

Hadron-therapy: use of Monte Carlo FLUKA method to investigate the dose deposition profile of carbon and helium ions in a water phantom.

Published in:

Annals of the University of Craiova, Physics, 2022, v. 32, p. 9

By:

ESSAKPA, BAKOLIA TOMFEY;
SEBIHI, RAJAA;
DIDI, ABDESSAMAD;
KOKOU, ADAMBOUNOU;
MAZAMAESSO, TCHAOU

Publication type:

Article

Helium ion therapy compared to protons therapy using MCNP Monte-Carlo code.

Published in:

Annals of the University of Craiova, Physics, 2020, v. 30, n. 1, p. 16

By:

DIDI, ABDESSAMAD;
DEKHISSI, HASSANE;
MOHAMED, YJOU;
SEBIHI, RAJAA

Publication type:

Article

Helium ion therapy compared to protons therapy using MCNP Monte-Carlo code.

Published in:

Annals of the University of Craiova, Physics, 2019, v. 29, p. 77

By:

DIDI, ABDESSAMAD;
DEKHISSI, HASSANE;
MOHAMED, YJOU;
SEBIHI, RAJAA

Publication type:

Article

Визначення тиску в бульбашках гелію та поверхневої енергії нікелю методом феромагнетного резонансу

Published in:

Metallophysics & Advanced Technologies / Metallofizika i Novejsie Tehnologii, 2021, v. 43, n. 6, p. 843, doi. 10.15407/mfint.43.06.0843

By:

Спольнік, О. І.;
Гайдусь, А. Ю.;
Каліберда, Л. М.

Publication type:

Article

Distributions of the ion temperature, ion pressure, and electron density over the current sheet surface.

Published in:

Plasma Physics Reports, 2016, v. 42, n. 6, p. 549, doi. 10.1134/S1063780X16060040

By:

Kyrie, N.;
Markov, V.;
Frank, A.;
Vasilkov, D.;
Voronova, E.

Publication type:

Article

Determination of the parameters of the hot plasma formed during the implosion of wire arrays from time-resolved X-ray spectra of H- and He-like ions.

Published in:

Plasma Physics Reports, 2014, v. 40, n. 2, p. 89, doi. 10.1134/S1063780X14020020

By:

Anan'ev, S.;
Dan'ko, S.;
Kalinin, Yu.

Publication type:

Article

Model of fuzz formation on a tungsten surface.

Published in:

Plasma Physics Reports, 2012, v. 38, n. 12, p. 996, doi. 10.1134/S1063780X12110074

By:

Martynenko, Yu.;
Nagel', M.

Publication type:

Article

Helium and Proton Particle-Induced X-Ray Emission (PIXE) for Characterization of PM<sub>2.5</sub> from Surabaya, Indonesia.

Published in:

Analytical Letters, 2024, v. 57, n. 8, p. 1342, doi. 10.1080/00032719.2023.2248307

By:

Lestiani, Diah Dwiana;
Kijin, Sung;
Santoso, Muhayatun;
Takagi, Ikuji

Publication type:

Article

Effect of Carbon Concentration on the Sputtering of Carbon-Rich SiC Bombarded by Helium Ions.

Published in:

Computation, 2018, v. 6, n. 1, p. 19, doi. 10.3390/computation6010019

By:

Liang, Xinghao;
Li, Yang;
Zhao, Qiang;
Zhang, Zheng;
Ouyang, Xiaoping

Publication type:

Article

High throughput secondary electron imaging of organic residues on a graphene surface.

Published in:

Scientific Reports, 2014, p. 1, doi. 10.1038/srep07032

By:

Yangbo Zhou;
O'Connell, Robert;
Maguire, Pierce;
Hongzhou Zhang

Publication type:

Article

Helium Ion Microscopy (HIM) for the imaging of biological samples at sub-nanometer resolution.

Published in:

Scientific Reports, 2013, p. 1, doi. 10.1038/srep03514

By:

Joens, Matthew S.;
Huynh, Chuong;
Kasuboski, James M.;
Ferranti, David;
Sigal, Yury J.;
Zeitvogel, Fabian;
Obst, Martin;
Burkhardt, Claus J.;
Curran, Kevin P.;
Chalasani, Sreekanth H.;
Stern, Lewis A.;
Goetze, Bernhard;
Fitzpatrick, James A. J.

Publication type:

Article