Works matching DE "HEAT treatment of semiconductors"
1
- Solid State Technology, 1998, v. 41, n. 5, p. 89
- Gu, Youfan;
- Hauschulz, Dana
- Article
2
- Macromolecular Chemistry & Physics, 2014, v. 215, n. 5, p. 405, doi. 10.1002/macp.201300666
- Yang, Hua;
- Wang, Lei;
- Zhang, Jidong;
- Yu, Xinhong;
- Geng, Yanhou;
- Han, Yanchun
- Article
3
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 9, p. 3933, doi. 10.1007/s10854-014-2109-6
- Chitroub, M.;
- Bouhafs, C.;
- Daimellah, A.;
- Scherrer, H.
- Article
4
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 7, p. 1279, doi. 10.1007/s10854-012-0786-6
- Zhang, Lei;
- Shen, Honglie;
- You, Jiayi;
- Jiang, Feng;
- Wu, Tianru;
- Tang, Zhengxia
- Article
5
- High Temperatures - High Pressures, 2014, v. 43, n. 2/3, p. 129
- SEMENOV, ALEXANDER A.;
- BELYAVSKIY, PAVEL YU.;
- NIKITIN, ANDREY A.;
- DEDYK, ANTONINA I.;
- PAVLOVA, YULIJA V.;
- MYLNIKOV, IVAN L.;
- ESKOV, ANDREY V.;
- PAKHOMOV, OLEG V.;
- BARANOV, IGOR V.;
- SOCHINSKII, ARKADII V.
- Article
6
- Canadian Journal of Physics, 2002, v. 80, n. 12, p. 1601, doi. 10.1139/P02-057
- Article
7
- Advances in Applied Ceramics: Structural, Functional & Bioceramics, 2010, v. 109, n. 2, p. 123, doi. 10.1179/174367509X12503626841631
- Miyazaki, H.;
- Kato, J.-I.;
- Sakamoto, N.;
- Wakiya, N.;
- Ota, T.;
- Suzuki, H.
- Article
8
- Journal of Materials Science, 2004, v. 39, n. 23, p. 7115, doi. 10.1023/B:JMSC.0000047562.80341.2b
- Lee, H. S.;
- Lee, K. H.;
- Kim, J. S.;
- Park, H. L.;
- Kim, T. W.
- Article
9
- Applied Physics A: Materials Science & Processing, 2017, v. 123, n. 5, p. 1, doi. 10.1007/s00339-017-0911-8
- Manikanthababu, N.;
- Chan, T.;
- Vajandar, S.;
- Saikiran, V.;
- Pathak, A.;
- Osipowicz, T.;
- Rao, S.
- Article
10
- Applied Physics A: Materials Science & Processing, 2009, v. 94, n. 3, p. 667, doi. 10.1007/s00339-008-4955-7
- Stanowski, R.;
- Dubowski, J.
- Article
13
- Molecular Crystals & Liquid Crystals, 2009, v. 510, n. 1, p. 116, doi. 10.1080/15421400903058718
- Ozaki, Ryotaro;
- Shinpo, Toshikazu;
- Moritake, Hiroshi
- Article
14
- Analytical & Bioanalytical Chemistry, 2004, v. 379, n. 4, p. 554, doi. 10.1007/s00216-004-2612-3
- Berendes, A.;
- Brunkahl, O.;
- Angelkort, C.;
- Bock, W.;
- Hofer, F.;
- Warbichler, P.;
- Kolbesen, B. O.
- Article
15
- Integrated Ferroelectrics, 2003, v. 52, n. 1, p. 187, doi. 10.1080/10584580390254529
- Park, Byung-Eun;
- Ishiwara, Hiroshi
- Article
16
- Acta Physica Polonica: A, 2012, v. 121, n. 1, p. 16, doi. 10.12693/APhysPolA.121.16
- Rahim, A. F. Abd;
- Hashim, M. R.;
- Rusop, M.;
- Jumadali, M. M.
- Article
17
- Electrical Engineering in Japan, 1989, v. 109, n. 2, p. 33, doi. 10.1002/eej.4391090205
- Shibata, Masaaki;
- Kaneko, Futao;
- Aketagawa, Masatoshi;
- Kobayashi, Satoshi
- Article
18
- Surface Review & Letters, 2012, v. 19, n. 4, p. 1250043-1, doi. 10.1142/S0218625X12500436
- SHIH-WEI TAN;
- SHIH-WEN LAI
- Article
19
- Surface Review & Letters, 2007, v. 14, n. 1, p. 141, doi. 10.1142/S0218625X07009153
- ZHANG, Q. Y.;
- JIANG, S. W.;
- LI, Y. R.
- Article
20
- Surface Review & Letters, 2005, v. 12, n. 4, p. 515, doi. 10.1142/S0218625X05007359
- ISMAIL, RAID A.;
- ABDULRAZAQ, OMAR A.;
- YAHYA, KHALID Z.
- Article
21
- Surface Review & Letters, 2005, v. 12, n. 2, p. 299, doi. 10.1142/S0218625X05007074
- Ismail, Raid A.;
- Yahya, Khalid Z.;
- Abdulrazaq, Omar A.
- Article
22
- Semiconductors, 2011, v. 45, n. 5, p. 587, doi. 10.1134/S1063782611050289
- Vlasenko, N.;
- Oleksenko, P.;
- Denisova, Z.;
- Sopinskii, N.;
- Veligura, L.;
- Gule, E.;
- Litvin, O.;
- Mukhlyo, M.
- Article
23
- Semiconductors, 2008, v. 42, n. 8, p. 914, doi. 10.1134/S106378260808006X
- Article
24
- Semiconductors, 2008, v. 42, n. 6, p. 689, doi. 10.1134/S1063782608060092
- Belyaev, A. E.;
- Boltovets, N. S.;
- Ivanov, V. N.;
- Klad'ko, V. P.;
- Konakova, R. V.;
- Kudrik, Ya. Ya.;
- Kuchuk, A. V.;
- Milenin, V. V.;
- Sveshnikov, Yu. N.;
- Sheremet, V. N.
- Article
25
- Semiconductors, 2008, v. 42, n. 6, p. 662, doi. 10.1134/S1063782608060067
- Stamov, I. G.;
- Tkachenko, D. V.
- Article
26
- Semiconductors, 2006, v. 40, n. 12, p. 1436, doi. 10.1134/S1063782606120128
- Balyuba, V. I.;
- Gritsyk, V. Yu.;
- Davydova, T. A.;
- Kalygina, V. M.;
- Nazarov, S. S.;
- Panin, A. V.;
- Khludkova, L. S.
- Article
27
- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2010, v. 13, n. 2, p. 202, doi. 10.15407/spqeo13.02.202
- Article
28
- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2010, v. 13, n. 2, p. 161, doi. 10.15407/spqeo13.02.161
- Article
29
- Journal of Electronic Materials, 2019, v. 48, n. 1, p. 152, doi. 10.1007/s11664-018-6803-7
- Zhao, Xuewei;
- Ma, Limin;
- Wang, Yishu;
- Guo, Fu
- Article
30
- Journal of Electronic Materials, 2011, v. 40, n. 10, p. 2139, doi. 10.1007/s11664-011-1721-y
- Fu, Shuang;
- Qian, Ke-Jia;
- Ding, Shi-Jin;
- Zhang, David
- Article
31
- Journal of Electronic Materials, 2011, v. 40, n. 4, p. 419, doi. 10.1007/s11664-010-1396-9
- Scott, Robin;
- Leedy, Kevin;
- Bayraktaroglu, Burhan;
- Look, David;
- Smith, David;
- Ding, Ding;
- Lu, Xianfeng;
- Zhang, Yong-Hang
- Article
32
- Journal of Electronic Materials, 2011, v. 40, n. 4, p. 433, doi. 10.1007/s11664-010-1411-1
- Catalfamo, Frank;
- Yen, Tingfang;
- Yun, Juhyung;
- Anderson, Wayne
- Article
33
- Journal of Electronic Materials, 2010, v. 39, n. 9, p. 1782, doi. 10.1007/s11664-010-1136-1
- Article
34
- Russian Physics Journal, 2006, v. 49, n. 2, p. 183, doi. 10.1007/s11182-006-0085-x
- Karimov, M.;
- Kurbanov, A.;
- Zainabidinov, S.;
- Karakhodzhaev, A.
- Article
35
- Asian Journal of Control, 2012, v. 14, n. 3, p. 756, doi. 10.1002/asjc.435
- Jeng, Jyh-Cheng;
- Li, Bo-Chi
- Article