Works matching DE "GUNN effect"
1
- Physica Status Solidi (B), 2017, v. 254, n. 3, p. n/a, doi. 10.1002/pssb.201600701
- Wagner, Timo;
- Bayer, Johannes C.;
- Rugeramigabo, Eddy P.;
- Haug, Rolf J.
- Article
2
- Progress in Electromagnetics Research B, 2011, v. 32, p. 149, doi. 10.2528/pierb11052201
- Sarkar, B. C.;
- Sarkar, D.;
- Sarkar, S.;
- Chakraborty, J.
- Article
3
- Microwave & Optical Technology Letters, 1996, v. 13, n. 1, p. 18, doi. 10.1002/(SICI)1098-2760(199609)13:1<18::AID-MOP6>3.0.CO;2-Q
- Shi, W. M.;
- Tsang, K. F.;
- Zhang, W. X.
- Article
4
- Microwave & Optical Technology Letters, 1992, v. 5, n. 14, p. 748, doi. 10.1002/mop.4650051414
- Magerko, Mark A.;
- Chang, Kai
- Article
5
- Microwave & Optical Technology Letters, 1992, v. 5, n. 4, p. 168, doi. 10.1002/mop.4650050407
- Yang-Han Lee;
- Ching-Chih Kuo;
- Hen-Wai Tsao
- Article
6
- Solar Today, 2011, v. 25, n. 4, p. 83
- Article
7
- IETE Journal of Research, 2009, v. 55, n. 3, p. 106, doi. 10.4103/0377-2063.54894
- Chakravorty, J.;
- Banerjee, T.;
- Ghatak, R.;
- Bose, A.;
- Sarkar, B. C.
- Article
8
- Lithuanian Journal of Physics, 2014, v. 54, n. 1, p. 7, doi. 10.3952/lithjphys.54102
- Gružinskis, V.;
- Starikov, E.;
- Shiktorov, P.
- Article
9
- Applied Physics A: Materials Science & Processing, 2007, v. 87, n. 3, p. 545, doi. 10.1007/s00339-007-3872-5
- Förster, A.;
- Lepsa, M. I.;
- Freundt, D.;
- Stock, J.;
- Montanari, S.
- Article
10
- Microwave & Optical Technology Letters, 2008, v. 50, n. 10, p. 2525, doi. 10.1002/mop.23710
- Cuilin Zhong;
- Jun Xu;
- Zhiyuan Yu;
- Junhong Li
- Article
11
- Acta Physica Polonica: A, 2018, v. 134, n. 4, p. 978, doi. 10.12693/APhysPolA.134.978
- YAVORSKIY, D.;
- KARPIERZ, K.;
- ŚNIEŻEK, D.;
- NOWICKI, P.;
- WRÓBEL, J.;
- UMANSKY, V.;
- ŁUSAKOWSKI, J.
- Article
13
- Acta Physica Polonica: A, 2011, v. 119, n. 2, p. 111
- PÉREZ¤, S.;
- MATEOS, J.;
- GONZÁLEZ, T.
- Article
14
- Semiconductors, 2018, v. 52, n. 4, p. 489, doi. 10.1134/S1063782618040231
- Mozharov, A. M.;
- Vasiliev, A. A.;
- Bolshakov, A. D.;
- Sapunov, G. A.;
- Fedorov, V. V.;
- Cirlin, G. E.;
- Mukhin, I. S.
- Article
15
- Semiconductors, 2011, v. 45, n. 6, p. 761, doi. 10.1134/S1063782611060212
- Požela, J.;
- Požela, K.;
- Raguotis, R.;
- Jucienė, V.
- Article
16
- Semiconductors, 2001, v. 35, n. 11, p. 1300, doi. 10.1134/1.1418075
- Biryulin, P. I.;
- Gorbatsevich, A. A.;
- Kapaev, V. V.;
- Kopaev, Yu. V.;
- Trofimov, V. T.
- Article
17
- Journal of Forensic Identification, 2018, v. 68, n. 3, p. 421
- Jabbal, Randeep S.;
- Boseley, Rhiannon E.;
- Lewis, Simon W.
- Article
18
- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2006, v. 9, n. 1, p. 93, doi. 10.15407/spqeo9.01.093
- Gorley, P. M.;
- Horley, P. P.;
- Chupyra, S. M.
- Article
19
- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005, v. 8, n. 4, p. 65
- Belyaev, A. E.;
- Bobyl, A. V.;
- Boltovets, N. S.;
- Ivanov, V. N.;
- Konakova, R. V.;
- Konnikov, S. G.;
- Kudryk, Ya. Ya.;
- Markovskiy, E. P.;
- Milenin, V. V.;
- Rudenko, E. M.;
- Tereschenko, G. F.;
- Ulin, V. P.;
- Ustinov, V. M.;
- Tsirlin, G. E.;
- Shpak, A. P.
- Article
20
- Instruments & Experimental Techniques, 2011, v. 54, n. 6, p. 781, doi. 10.1134/S0020441211050216
- Konev, V.;
- Gubanov, V.;
- Klimov, A.;
- Koval'chuk, O.;
- Rostov, V.;
- Sharypov, K.;
- Yalandin, M.
- Article
21
- Instruments & Experimental Techniques, 2011, v. 54, n. 5, p. 705, doi. 10.1134/S0020441211050162
- Titov, A.;
- Pushkarev, V.;
- Pelyavin, D.;
- Shukhlov, I.
- Article
22
- Instruments & Experimental Techniques, 2007, v. 50, n. 2, p. 241, doi. 10.1134/S0020441207020133
- Article