Works about GERMANIUM
1
- Physica Status Solidi. A: Applications & Materials Science, 2025, v. 222, n. 13, p. 1, doi. 10.1002/pssa.202500071
- Alahmadi, M.;
- Kebede, Mesfin A.;
- Hassan, Moukhtar A.;
- Gamal, Rania;
- Hanafy, Taha. A.;
- Hameed, Talaat A.;
- Yahia, Ibrahim S.;
- Gao, Hongcai;
- Sheha, Eslam
- Article
2
- Journal of Synchrotron Radiation, 2025, v. 32, n. 4, p. 961, doi. 10.1107/S1600577525003431
- Chumakov, Andrei;
- Rubeck, Jan J.;
- Schwartzkopf, Matthias
- Article
3
- Journal of Optical Communications, 2025, v. 46, n. 3, p. 645, doi. 10.1515/joc-2024-0130
- Gopalan, Anitha;
- Thillaigovindan, Annalakshmi;
- Patnala, Pattabhirama Mohan;
- Lesley, Hubert Mary;
- Sundaram, Murugeswari;
- Srinivasan, Vimala;
- Anwer, Karem Tarek
- Article
4
- New Phytologist, 2025, v. 247, n. 3, p. 1280, doi. 10.1111/nph.70110
- Huang, Sheng;
- Yamaji, Naoki;
- Konishi, Noriyuki;
- Mitani‐Ueno, Namiki;
- Ma, Jian Feng
- Article
5
- Nature Communications, 2025, v. 16, n. 1, p. 1, doi. 10.1038/s41467-025-60351-x
- Unseld, Florian K.;
- Undseth, Brennan;
- Raymenants, Eline;
- Matsumoto, Yuta;
- de Snoo, Sander L.;
- Karwal, Saurabh;
- Pietx-Casas, Oriol;
- Ivlev, Alexander S.;
- Meyer, Marcel;
- Sammak, Amir;
- Veldhorst, Menno;
- Scappucci, Giordano;
- Vandersypen, Lieven M. K.
- Article
6
- University of Thi-Qar Journal of Science, 2023, v. 10, n. 2, p. 137, doi. 10.32792/utq/utjsci/v10i2.1119
- Naser, Shahad Riyadh;
- Mohammad, Mohammed Salman;
- Naser, Noorulhuda Riyadh
- Article
7
- Mineral Resources of Ukraine / Mìneral'nì Resursi Ukraïni, 2025, n. 2, p. 6, doi. 10.31996/mru.2025.2.6-14
- БІЛОУС, О. І.;
- БУРЛУЦЬКИЙ, М. С.
- Article
8
- International Journal of Nanoscience, 2013, v. 12, n. 6, p. -1, doi. 10.1142/S0219581X13500439
- SURANA, NEELAM;
- GHOSH, BAHNIMAN;
- TRIPATHY, BALL MUKUND MANI;
- SALIMATH, AKSHAY KUMAR
- Article
9
- International Journal of Nanoscience, 2010, v. 9, n. 4, p. 341, doi. 10.1142/S0219581X10006922
- TAN, L. S.;
- TAN, J. Y.;
- BEGUM, A.;
- HONG, M. H.;
- DU, A. Y.;
- BHAT, M.;
- WANG, X. C.
- Article
10
- International Journal of Nanoscience, 2010, v. 9, n. 1/2, p. 75, doi. 10.1142/S0219581X10006533
- PEI, L. Z.;
- ZHAO, H. S.;
- YU, H. Y.;
- HU, J. L.
- Article
11
- International Journal of Nanoscience, 2009, v. 8, n. 6, p. 595, doi. 10.1142/S0219581X09006444
- SHIGETA, YUKICHI;
- NEGISHI, RYOTA;
- SUZUKI, MASAHIKO
- Article
12
- International Journal of Nanoscience, 2007, v. 6, n. 6, p. 467, doi. 10.1142/S0219581X0700505X
- DAS, K.;
- CHAKRABORTY, A. K.;
- GOSWAMI, M. L. N.;
- SINGHA, R. K.;
- DHAR, A.;
- COLEMAN, K. S.;
- RAY, S. K.
- Article
13
- International Journal of Nanoscience, 2007, v. 6, n. 5, p. 353, doi. 10.1142/S0219581X07004511
- YAKIMOV, A. I.;
- DVURECHENSKII, A. V.;
- NIKIFOROV, A. I.;
- BLOSHKIN, A. A.
- Article
14
- International Journal of Nanoscience, 2007, v. 6, n. 3/4, p. 245, doi. 10.1142/S0219581X07004778
- FONSECA, A.;
- ALVES, E.;
- LEITÃO, J. P.;
- SOBOLEV, N. A.;
- CARMO, M. C.;
- NIKIFOROV, A.
- Article
15
- International Journal of Nanoscience, 2004, v. 3, n. 1/2, p. 171, doi. 10.1142/S0219581X0400195X
- Kolodzey, J.;
- Adam, T. N.;
- Troeger, R. T.;
- LV, P.-C.;
- Ray, S. K.;
- Yassievich, I.;
- Odnoblyudov, M.;
- Kagan, M.
- Article
16
- Particle & Particle Systems Characterization, 2021, v. 38, n. 12, p. 1, doi. 10.1002/ppsc.202100154
- Camara, Osmane;
- Mir, Anamul H.;
- Dzieciol, Krzysztof;
- Greaves, Graeme;
- Basak, Shibabrata;
- Kungl, Hans;
- Bosi, Matteo;
- Seravalli, Luca;
- Donnelly, Steve E.;
- Eichel, Rüdiger A.;
- Hinks, Jonathan A.
- Article
17
- Particle & Particle Systems Characterization, 2019, v. 36, n. 9, p. N.PAG, doi. 10.1002/ppsc.201900248
- Hao, Jian;
- Wang, Yanxia;
- Guo, Qingjie;
- Zhao, Jiupeng;
- Li, Yao
- Article
18
- Particle & Particle Systems Characterization, 2017, v. 34, n. 3, p. n/a, doi. 10.1002/ppsc.201600115
- Li, Qun;
- Zhang, Zhiwei;
- Dong, Shihua;
- Li, Caixia;
- Ge, Xiaoli;
- Li, Zhaoqiang;
- Ma, Jingyun;
- Yin, Longwei
- Article
19
- Journal of Separation Science, 2014, v. 37, n. 12, p. 1456, doi. 10.1002/jssc.201301255
- Shu‐jiang, Liu;
- Zhan‐ying, Chen;
- Shi‐lian, Wang;
- Yin‐zhong, Chang;
- Qi, Li;
- Yuan‐qing, Fan;
- Yun‐gang, Zhao;
- Huai‐mao, Jia;
- Xin‐jun, Zhang;
- Jun, Wang
- Article
20
- Annalen der Physik, 2023, v. 535, n. 9, p. 1, doi. 10.1002/andp.202300122
- Suzuki, Seiya;
- Nemoto, Yoshihiro;
- Shiiki, Natsumi;
- Nakayama, Yoshiko;
- Takeguchi, Masaki
- Article
21
- Annalen der Physik, 2023, v. 535, n. 1, p. 1, doi. 10.1002/andp.202200425
- Zhu, Di‐Di;
- Lv, You;
- Li, Si‐Ying;
- Zhang, Hai‐Feng
- Article
22
- Advanced Functional Materials, 2016, v. 26, n. 7, p. 1104, doi. 10.1002/adfm.201504589
- Wang, Xiaoyan;
- Fan, Ling;
- Gong, Decai;
- Zhu, Jian;
- Zhang, Qingfeng;
- Lu, Bingan
- Article
23
- Advanced Functional Materials, 2015, v. 25, n. 12, p. 1805, doi. 10.1002/adfm.201404031
- Zheng, Xiaohu;
- Zhang, Miao;
- Shi, Xiaohua;
- Wang, Gang;
- Zheng, Li;
- Yu, Yuehui;
- Huang, Anping;
- Chu, Paul K.;
- Gao, Heng;
- Ren, Wei;
- Di, Zengfeng;
- Wang, Xi
- Article
24
- Journal of Thermal Analysis & Calorimetry, 2007, v. 87, n. 2, p. 557, doi. 10.1007/s10973-006-7740-x
- Gospodinov, G.;
- Atanasova, L.
- Article
25
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 294, doi. 10.1007/s10854-007-9514-z
- Article
26
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 24, doi. 10.1007/s10854-008-9579-3
- Vanhellemont, J.;
- Steenbergen, J. Van;
- Holsteyns, F.;
- Roussel, P.;
- Meuris, M.;
- Młynarczyk, K.;
- Śpiewak, P.;
- Geens, W.;
- Romandic, I..
- Article
27
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 6, p. 569, doi. 10.1007/s10854-007-9391-5
- Hasanuzzaman, Mohammad;
- Haddara, Yaser M.
- Article
28
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 167, doi. 10.1007/s10854-007-9329-y
- Takakura, K.;
- Kudou, T.;
- Hayama, K.;
- Shigaki, K.;
- Ohyama, H.;
- Kayamoto, K.;
- Shibuya, M.
- Article
29
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 179, doi. 10.1007/s10854-007-9299-0
- Iamraksa, P.;
- Lloyd, N. S.;
- Bagnall, D. M.
- Article
30
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 119, doi. 10.1007/s10854-007-9337-y
- McNeill, D. W.;
- Bhattacharya, S.;
- Wadsworth, H.;
- Ruddell, F. H.;
- Mitchell, S. J. N.;
- Armstrong, B. M.;
- Gamble, H. S.
- Article
31
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 155, doi. 10.1007/s10854-007-9304-7
- Prieto, A. C.;
- Torres, A.;
- Jiménez, J.;
- Rodríguez, A.;
- Sangrador, J.;
- Rodríguez, T.
- Article
32
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 81, doi. 10.1007/s10854-007-9165-0
- Furuse, H.;
- Mori, N.;
- Kubo, H.;
- Momose, H.;
- Kondow, M.
- Article
33
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 7, p. 775, doi. 10.1007/s10854-006-9071-x
- Janke, C.;
- Jones, R.;
- Öberg, S.;
- Briddon, P.
- Article
34
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 7, p. 769, doi. 10.1007/s10854-006-9069-4
- Coutinho, José;
- Torres, Vitor;
- Öberg, Sven;
- Carvalho, Alexandra;
- Janke, Colin;
- Jones, Robert;
- Briddon, Patrick
- Article
35
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 7, p. 781, doi. 10.1007/s10854-006-9083-6
- Carvalho, A.;
- Jones, R.;
- Torres, V.;
- Coutinho, J.;
- Markevich, V.;
- Öberg, S.;
- Briddon, P.
- Article
36
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 7, p. 793, doi. 10.1007/s10854-006-9096-1
- Lauwaert, J.;
- Baerdemaeker, J.;
- Dauwe, C.;
- Clauws, P.
- Article
37
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 7, p. 787, doi. 10.1007/s10854-006-9102-7
- Simoen, Eddy;
- Bargallo Gonzalez, Mireia;
- Eneman, Geert;
- Verheyen, Peter;
- Benedetti, Aldo;
- Bender, Hugo;
- Loo, Roger;
- Claeys, Cor
- Article
38
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 7, p. 799, doi. 10.1007/s10854-006-9110-7
- Simoen, E.;
- Claeys, C.;
- Sioncke, S.;
- Steenbergen, J.;
- Meuris, M.;
- Forment, S.;
- Vanhellemont, J.;
- Clauws, P.;
- Theuwis, A.
- Article
39
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 7, p. 763, doi. 10.1007/s10854-006-9073-8
- Chroneos, A.;
- Grimes, R.;
- Tsamis, C.
- Article
40
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 7, p. 759, doi. 10.1007/s10854-006-9104-5
- Kruszewski, P.;
- Mesli, A.;
- Dobaczewski, L.;
- Abrosimov, N.;
- Markevich, V.;
- Peaker, A.
- Article
41
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 7, p. 747, doi. 10.1007/s10854-007-9121-z
- Ghandi, R.;
- Kolahdouz, M.;
- Hållstedt, J.;
- Lu, Jun;
- Wise, R.;
- Wejtmans, H.;
- Östling, M.;
- Radamson, H.
- Article
42
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 6, p. 621, doi. 10.1007/s10854-007-9122-y
- Macháč, Petr;
- Sajdl, Petr;
- Machovič, Vladimír
- Article
43
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 5, p. 475, doi. 10.1007/s10854-006-9066-7
- Chiung-Wei Lin;
- Pao-An Chang;
- Yeong-Shyang Lee
- Article
44
- Journal of Materials Science Letters, 2003, v. 22, n. 21, p. 1467, doi. 10.1023/A:1026174310568
- Sutherland, J. T.;
- Poling, S. A.;
- Nelson, C. R.;
- Martin, S. W.
- Article
45
- Foundations of Chemistry, 2022, v. 24, n. 2, p. 285, doi. 10.1007/s10698-022-09434-x
- Article
46
- Microscopy & Microanalysis, 2023, v. 29, n. 5, p. 1579, doi. 10.1093/micmic/ozad090
- Radić, Dražen;
- Peterlechner, Martin;
- Spangenberg, Katharina;
- Posselt, Matthias;
- Bracht, Hartmut
- Article
47
- Microscopy & Microanalysis, 2023, v. 29, n. 1, p. 189, doi. 10.1093/micmic/ozac020
- Radić, Dražen;
- Peterlechner, Martin;
- Posselt, Matthias;
- Bracht, Hartmut
- Article
48
- Microscopy & Microanalysis, 2019, p. 1602, doi. 10.1017/S1431927618008498
- Yoon, Yohan;
- Yoo, Jinkyoung;
- Magginetti, David;
- Cheng, Xueling;
- Yoon, Heayoung
- Article
49
- 2012
- Vystavel, T.;
- Novák, L.;
- Wandrol, P.;
- Kolíbal, M.;
- Mach, J.;
- Šikola, T.
- Abstract
50
- 2011
- LaGrange, T;
- Nikolova, L;
- Wall, M;
- Reed, B;
- Campbell, G;
- Siwick, B;
- Rosei, F
- Abstract
