Works matching DE "GALLIUM arsenide transistors"
1
- Journal of Low Temperature Physics, 2025, v. 219, n. 5, p. 242, doi. 10.1007/s10909-024-03256-1
- Feldman, M. M.;
- Fuchs, G.;
- Liu, T.;
- D'Imperio, L. A.;
- Henry, M. D.;
- Shaner, E. A.;
- Lyon, S. A.
- Article
2
- Physica Status Solidi - Rapid Research Letters, 2016, v. 10, n. 9, p. 703, doi. 10.1002/pssr.201600227
- Liu, Li Ning;
- Choi, Hoi Wai;
- Xu, Jing Ping;
- Lai, Pui To
- Article
3
- Instruments & Experimental Techniques, 2018, v. 61, n. 5, p. 665, doi. 10.1134/S0020441218040176
- Chernykh, S. V.;
- Chernykh, A. V.;
- Chubenko, A. P.;
- Pavlyuchenko, L. N.;
- Sveshnikov, Yu. N.;
- Glybin, Yu. N.;
- Konovalov, M. P.;
- Panichkin, A. V.;
- Didenko, S. I.
- Article
4
- Journal of Microwaves, Optoelectronics & Electromagnetic Applications, 2015, v. 14, n. 1, p. AoP14, doi. 10.1590/2179-10742015v14i1423
- Leggieri, Alberto;
- Passi, Davide;
- Gagliesi, Daniele;
- Di Paolo, Franco
- Article
5
- IUP Journal of Electrical & Electronics Engineering, 2023, v. 16, n. 2, p. 25
- A. A., Zhuk;
- N. N., Prokopenko;
- V. E., Chumakov;
- A. V., Kunts
- Article
6
- IUP Journal of Electrical & Electronics Engineering, 2022, v. 15, n. 3, p. 24
- Chumakov V. E.;
- Serebryakov A. I.;
- Titov A. E.;
- Prokopenko N. N.
- Article
7
- Semiconductors, 2019, v. 53, n. 10, p. 1353, doi. 10.1134/S1063782619100178
- Shobolova, T. A.;
- Korotkov, A. V.;
- Petryakova, E. V.;
- Lipatnikov, A. V.;
- Puzanov, A. S.;
- Obolensky, S. V.;
- Kozlov, V. A.
- Article
8
- Semiconductors, 2018, v. 52, n. 12, p. 1547, doi. 10.1134/S1063782618120060
- Baidus, N. V.;
- Aleshkin, V. Ya.;
- Dubinov, A. A.;
- Krasilnik, Z. F.;
- Kudryavtsev, K. E.;
- Nekorkin, S. M.;
- Novikov, A. V.;
- Rykov, A. V.;
- Reunov, D. G.;
- Shaleev, M. V.;
- Yunin, P. A.;
- Yurasov, D. V.
- Article
9
- Semiconductors, 2018, v. 52, n. 4, p. 458, doi. 10.1134/S106378261804019X
- Larionov, A. V.;
- Brichkin, A. S.;
- Höfling, S.;
- Kulakovskii, V. D.
- Article
10
- Semiconductors, 2017, v. 51, n. 11, p. 1420, doi. 10.1134/S1063782617110161
- Article
11
- Semiconductors, 2017, v. 51, n. 11, p. 1395, doi. 10.1134/S1063782617110136
- Gorshkov, A.;
- Volkova, N.;
- Voronin, P.;
- Zdoroveyshchev, A.;
- Istomin, L.;
- Pavlov, D.;
- Usov, Yu.;
- Levichev, S.
- Article
12
- Semiconductors, 2017, v. 51, n. 11, p. 1415, doi. 10.1134/S1063782617110148
- Kalentyeva, I.;
- Vikhrova, O.;
- Danilov, Yu.;
- Zvonkov, B.;
- Kudrin, A.;
- Dorokhin, M.;
- Pavlov, D.;
- Antonov, I.;
- Drozdov, M.;
- Usov, Yu.
- Article
13
- Semiconductors, 2017, v. 51, n. 11, p. 1427, doi. 10.1134/S1063782617110173
- Leshchenko, E.;
- Dubrovskii, V.
- Article
14
- Semiconductors, 2017, v. 51, n. 11, p. 1431, doi. 10.1134/S1063782617110185
- Maleev, N.;
- Belyakov, V.;
- Vasil'ev, A.;
- Bobrov, M.;
- Blokhin, S.;
- Kulagina, M.;
- Kuzmenkov, A.;
- Nevedomskii, V.;
- Guseva, Yu.;
- Maleev, S.;
- Ladenkov, I.;
- Fefelova, E.;
- Fefelov, A.;
- Ustinov, V.
- Article
15
- Semiconductors, 2017, v. 51, n. 11, p. 1435, doi. 10.1134/S1063782617110288
- Zabavichev, I.;
- Obolenskaya, E.;
- Potekhin, A.;
- Puzanov, A.;
- Obolensky, S.;
- Kozlov, V.
- Article
16
- Semiconductors, 2017, v. 51, n. 11, p. 1466, doi. 10.1134/S106378261711029X
- Zabavichev, I.;
- Potekhin, A.;
- Puzanov, A.;
- Obolenskiy, S.;
- Kozlov, V.
- Article
17
- Semiconductors, 2017, v. 51, n. 11, p. 1481, doi. 10.1134/S1063782617110082
- Borisov, V.;
- Kuvshinova, N.;
- Kurochka, S.;
- Sizov, V.;
- Stepushkin, M.;
- Temiryazev, A.
- Article
18
- Semiconductors, 2017, v. 51, n. 11, p. 1513, doi. 10.1134/S1063782617110203
- Nikiforov, V.;
- Abramkin, D.;
- Shamirzaev, T.
- Article
19
- Semiconductors, 2017, v. 51, n. 11, p. 1391, doi. 10.1134/S1063782617110306
- Zvonkov, B.;
- Baidus, N.;
- Nekorkin, S.;
- Vikhrova, O.;
- Zdoroveyshev, A.;
- Kudrin, A.;
- Kotomina, V.
- Article
20
- Semiconductors, 2017, v. 51, n. 11, p. 1527, doi. 10.1134/S1063782617110070
- Baidus, N.;
- Aleshkin, V.;
- Dubinov, A.;
- Kudryavtsev, K.;
- Nekorkin, S.;
- Novikov, A.;
- Pavlov, D.;
- Rykov, A.;
- Sushkov, A.;
- Shaleev, M.;
- Yunin, P.;
- Yurasov, D.;
- Yablonskiy, A.;
- Krasilnik, Z.
- Article
21
- Semiconductors, 2016, v. 50, n. 3, p. 390, doi. 10.1134/S1063782616030131
- Kryzhanovskaya, N.;
- Maximov, M.;
- Blokhin, S.;
- Bobrov, M.;
- Kulagina, M.;
- Troshkov, S.;
- Zadiranov, Yu.;
- Lipovskii, A.;
- Moiseev, E.;
- Kudashova, Yu.;
- Livshits, D.;
- Ustinov, V.;
- Zhukov, A.
- Article
22
- Semiconductors, 2014, v. 48, n. 5, p. 640, doi. 10.1134/S1063782614050078
- Galiev, G.;
- Klimov, E.;
- Klochkov, A.;
- Lavruhin, D.;
- Pushkarev, S.;
- Maltsev, P.
- Article
23
- Semiconductors, 2014, v. 48, n. 5, p. 584, doi. 10.1134/S1063782614050248
- Article
24
- Semiconductors, 2014, v. 48, n. 5, p. 625, doi. 10.1134/S1063782614050029
- Belevskii, P.;
- Vinoslavkii, M.;
- Poroshin, V.;
- Baidus, N.;
- Zvonkov, B.
- Article
25
- Semiconductors, 2013, v. 47, n. 6, p. 804, doi. 10.1134/S1063782613060237
- Article
26
- Journal of Engineering (17264073), 2021, v. 27, n. 2, p. 13, doi. 10.31026/j.eng.2021.02.02
- Ballouk, Abdo;
- Mofdi, Fawaz;
- Ibrahim, Salem
- Article
27
- Superficies y Vacío, 2017, v. 30, n. 4, p. 56, doi. 10.47566/2017_syv30_1-040056
- Sánchez-Trujillo, D. J.;
- Prías-Barragán, J. J.;
- Ariza-Calderón, H.;
- Pulzara-Mora, A. O.;
- López-López, M.
- Article
28
- Optical & Quantum Electronics, 2015, v. 47, n. 2, p. 203, doi. 10.1007/s11082-014-9901-7
- Sapkota, Durga;
- Kayastha, Madhu;
- Wakita, Koichi
- Article
29
- Optical & Quantum Electronics, 2015, v. 47, n. 2, p. 423, doi. 10.1007/s11082-014-9924-0
- Zhang, Peng;
- Jiang, Maohua;
- Men, Yanbin;
- Zhu, Renjiang;
- Liang, Yiping;
- Zhang, Yu
- Article
30
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1186, doi. 10.1049/el.2018.6170
- Lengyel, T.;
- Simpanen, E.;
- Gustavsson, J. S.;
- Larsson, A.;
- Karlsson, M.;
- Andrekson, P. A.;
- Sorin, W. V.;
- Mathai, S.;
- Tan, M. R.;
- Bickham, S.
- Article
31
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1180, doi. 10.1049/el.2018.5856
- Mingxun Li;
- Xin Lv;
- Jinchao Mou;
- Dalu Guo;
- Haidong Qiao;
- Zhaohui Ma;
- Haidong Hao
- Article
32
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 11, p. 695, doi. 10.1049/el.2018.0965
- Pantoli, L.;
- Arena, S.;
- Cavanna, T.
- Article
33
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 11, p. 963, doi. 10.1049/el.2015.3823
- Roh, I. P.;
- Kang, N. S.;
- Shin, S. H.;
- Oh, Y. T.;
- Kim, K. B.;
- Song, J. D.;
- Song, Y. H.
- Article
34
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 4, p. 323, doi. 10.1049/el.2013.3702
- Tohmé, L.;
- Blin, S.;
- Ducournau, G.;
- Nouvel, P.;
- Coquillat, D.;
- Hisatake, S.;
- Nagatsuma, T.;
- Pénarier, A.;
- Varani, L.;
- Knap, W.;
- Lampin, J.-F.
- Article
35
- Scientific Reports, 2015, p. 7860, doi. 10.1038/srep07860
- Nadda, Kanika;
- Kumar, M. Jagadesh
- Article
36
- IETE Journal of Research, 2024, v. 70, n. 6, p. 5905, doi. 10.1080/03772063.2023.2273294
- S., Sundararajan;
- Kottarthil Naduvil, Madhusoodanan;
- Abudhahir, A.;
- Kathiah, Saravanan
- Article
37
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2017, v. 31, n. 8, p. -1, doi. 10.1142/S0217979217500503
- Article
38
- International Journal of RF & Microwave Computer-Aided Engineering, 2020, v. 30, n. 8, p. 1, doi. 10.1002/mmce.22252
- Hookari, Mohsen;
- Roshani, Saeed;
- Roshani, Sobhan
- Article
39
- International Journal of RF & Microwave Computer-Aided Engineering, 2017, v. 27, n. 6, p. n/a, doi. 10.1002/mmce.21106
- Elhamadi, Taj‐eddin;
- Boussouis, Mohamed;
- Touhami, Naima Amar;
- Lamsalli, Mohammed
- Article
40
- Scientific Reports, 2020, v. 10, n. 1, p. 1, doi. 10.1038/s41598-020-67636-9
- Sasaki, Susumu;
- Miura, Takanori;
- Ikeda, Kosuke;
- Sakai, Masahiro;
- Sekikawa, Takuya;
- Saito, Masaki;
- Yuge, Tatsuro;
- Hirayama, Yoshiro
- Article
41
- International Journal of Electrical & Computer Engineering (2088-8708), 2017, v. 7, n. 1, p. 169, doi. 10.11591/ijece.v7i1.pp169-175
- Article
42
- Russian Physics Journal, 2021, v. 64, n. 2, p. 261, doi. 10.1007/s11182-021-02324-3
- Kulinich, I. V.;
- Kazimirov, A. I.;
- Shesterikov, E. I.
- Article
43
- Russian Physics Journal, 2013, v. 56, n. 1, p. 55, doi. 10.1007/s11182-013-9994-7
- Emelyanov, E.;
- Kokhanenko, A.;
- Pchelyakov, O.;
- Loshkarev, I.;
- Seleznev, V.;
- Putyato, M.;
- Semyagin, B.;
- Preobrazhenskii, V.;
- Niu, Zhicuan;
- Ni, Haiqiao
- Article
44
- Heat Transfer, 2025, v. 54, n. 3, p. 2377, doi. 10.1002/htj.23294
- Iype, Preethi Elizabeth;
- Suresh Babu, V.;
- Paul, Geenu
- Article
45
- Progress in Photovoltaics, 2015, v. 23, n. 9, p. 1080, doi. 10.1002/pip.2517
- Mathews, Ian;
- O'Mahony, Donagh;
- Thomas, Kevin;
- Pelucchi, Emanuele;
- Corbett, Brian;
- Morrison, Alan P.
- Article
46
- Crystallography Reports, 2017, v. 62, n. 6, p. 947, doi. 10.1134/S1063774517060104
- Galiev, G.;
- Trunkin, I.;
- Klimov, E.;
- Klochkov, A.;
- Vasiliev, A.;
- Imamov, R.;
- Pushkarev, S.;
- Maltsev, P.
- Article
47
- Crystallography Reports, 2013, v. 58, n. 6, p. 914, doi. 10.1134/S1063774513060114
- Galiev, G. B.;
- Klimov, E. A.;
- Klochkov, A. N.;
- Maltsev, P. P.;
- Pushkarev, S. S.;
- Zhigalina, O. M.;
- Imamov, R. M.;
- Kuskova, A. N.;
- Khmelenin, D. N.
- Article
48
- International Journal of Microwave & Optical Technology, 2020, v. 15, n. 4, p. 289
- Rachakh, Amine;
- El Abdellaoui, Larbi;
- Zbitou, Jamal;
- Errkik, Ahmed;
- Tajmouati, Abdelali;
- Latrach, Mohamed
- Article
49
- International Journal of Microwave & Optical Technology, 2013, v. 8, n. 1, p. 6
- Meloui, M.;
- Akhchaf, I.;
- Srifi, M. Nabil;
- Essaaidi, M.
- Article
50
- International Journal of Microwave & Wireless Technologies, 2024, v. 16, n. 9, p. 1, doi. 10.1017/S1759078724000916
- Article