Works matching DE "GALLIUM arsenide"
1
- Crystal Research & Technology, 2025, v. 60, n. 6, p. 1, doi. 10.1002/crat.202400262
- Cao, Jianguo;
- Yang, Jiashun
- Article
2
- Electronics (2079-9292), 2025, v. 14, n. 11, p. 2300, doi. 10.3390/electronics14112300
- Jeon, Hyeongjin;
- Shin, Jaekyung;
- Choi, Woojin;
- Bae, Sooncheol;
- Bae, Kyungdong;
- Bin, Soohyun;
- Kim, Sangyeop;
- Ju, Yunhyung;
- Ahn, Minseok;
- Mun, Gyuhyeon;
- Hwang, Keum Cheol;
- Lee, Kang-Yoon;
- Yang, Youngoo
- Article
3
- Journal of Applied Spectroscopy, 2025, v. 92, n. 2, p. 271, doi. 10.1007/s10812-025-01907-z
- Kornyshov, G. O.;
- Payusov, A. S.;
- Kharchenko, A. A.;
- Beckman, A. A.;
- Shernyakov, Yu. M.;
- Mintairov, S. A.;
- Kalyuzhny, N. A.;
- Maksimov, M. V.;
- Gordeev, N. Yu.
- Article
4
- Electronics (2079-9292), 2025, v. 14, n. 10, p. 1957, doi. 10.3390/electronics14101957
- Martinez-Gil, Javier;
- Belio-Apaolaza, Iñigo;
- Tebart, Jonas;
- Fernández Estévez, Jose Luis;
- Moro-Melgar, Diego;
- Renaud, Cyril C.;
- Stöhr, Andreas;
- Cojocari, Oleg
- Article
5
- Solid State Technology, 2001, v. 44, n. 8, p. 79
- Golden, Josh H.;
- Olds, Andrew;
- Hannan, William
- Article
6
- Solid State Technology, 1999, v. 42, n. 10, p. 32
- Article
7
- Solid State Technology, 1999, v. 42, n. 6, p. 28
- Article
8
- Journal of Electronic Materials, 2025, v. 54, n. 5, p. 4123, doi. 10.1007/s11664-025-11841-7
- Mezhoud, Leila;
- Sengouga, Nouredine;
- Meftah, Amjad;
- Al Saqri, Noor Alhuda;
- Henini, Mohamed
- Article
9
- Surface Engineering, 2013, v. 29, n. 7, p. 543, doi. 10.1179/1743294413Y.0000000146
- Kumar, T;
- Kumar, M;
- Verma, S;
- Kanjilal, D
- Article
10
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 8, p. 7203, doi. 10.1007/s10854-019-00871-7
- He, Yang;
- Yan, Wei;
- Dai, Pan;
- Yu, Jian;
- Dong, Jianrong
- Article
11
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 14, p. 12436, doi. 10.1007/s10854-018-9360-1
- Balgos, Maria Herminia;
- Jaculbia, Rafael;
- Prieto, Elizabeth Ann;
- Mag-usara, Valynn Katrine;
- Tani, Masahiko;
- Salvador, Arnel;
- Estacio, Elmer;
- Somintac, Armando
- Article
12
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 9, p. 7750, doi. 10.1007/s10854-018-8771-3
- Turgut, G.;
- Kaya, F. S.;
- Duman, S.
- Article
13
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 23, p. 17778, doi. 10.1007/s10854-017-7717-5
- Vega-Macotela, L.;
- Torchynska, T.;
- Polupan, G.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 22, p. 16818, doi. 10.1007/s10854-017-7597-8
- Article
15
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 13, p. 9732, doi. 10.1007/s10854-017-6724-x
- He, Yang;
- Sun, Yurun;
- Zhao, Yongming;
- Yu, Shuzhen;
- Dong, Jianrong
- Article
16
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 10, p. 7429, doi. 10.1007/s10854-017-6432-6
- Xu, Yuan;
- Chang, Benkang;
- Chen, Liang;
- Chen, Xinlong;
- Qian, Yunsheng
- Article
17
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 10, p. 7126, doi. 10.1007/s10854-017-6536-z
- Vega-Macotela, L.;
- Torchynska, T.;
- Polupan, G.
- Article
18
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5415, doi. 10.1007/s10854-016-6202-x
- Machado, Diego;
- Scalvi, Luis;
- Tabata, Américo;
- Silva, José
- Article
19
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 1, p. 845, doi. 10.1007/s10854-016-5599-6
- Chang, Edward;
- Hsiao, Chih-Jen;
- Chang, Sheng-Po;
- Chang, Shoou-Jinn;
- Ha, Minh-Thien-Huu;
- Nguyen, Hong-Quan;
- Yu, Hung-Wei;
- Wong, Yuen-Yee;
- Liu, Chun-Kuan;
- Maa, Jer-Shen
- Article
20
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 4, p. 2210, doi. 10.1007/s10854-015-2670-7
- Pat, Suat;
- Korkmaz, Şadan;
- Özen, Soner;
- Şenay, Volkan
- Article
21
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 1, p. 134, doi. 10.1007/s10854-013-1562-y
- Galiana, B.;
- Silvestre, S.;
- Algora, C.;
- Rey-Stolle, I.
- Article
22
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 7, p. 2513, doi. 10.1007/s10854-013-1126-1
- Dao, Khac;
- Nguyen, Tien;
- Phan, Anh;
- Do, Hung
- Article
23
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 5, p. 1624, doi. 10.1007/s10854-012-0986-0
- Hadi, Walid;
- Shur, Michael;
- O'Leary, Stephen
- Article
24
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 807, doi. 10.1007/s10854-012-0818-2
- Hadi, Walid;
- Cheekoori, Reddiprasad;
- Shur, Michael;
- O'Leary, Stephen
- Article
25
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1799, doi. 10.1007/s10854-012-0665-1
- Riordan, Nathaniel;
- Gogineni, Chaturvedi;
- Johnson, Shane;
- Lu, Xianfeng;
- Tiedje, Tom;
- Ding, Ding;
- Zhang, Yong-Hang;
- Fritz, Rafael;
- Kolata, Kolja;
- Chatterjee, Sangam;
- Volz, Kerstin;
- Koch, Stephan
- Article
26
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 1024, doi. 10.1007/s10854-010-0104-0
- Kang Min Kim;
- Krishnamurthy, Daivasigamani;
- Yuji Sakai;
- Jong-Uk Seo;
- Hasegawa, Shigehiko;
- Asahi, Hajime
- Article
27
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1156, doi. 10.1007/s10854-007-9504-1
- Bergaoui, M. S.;
- Boufaden, T.;
- Guermazi, S.;
- Agnel, S.;
- Toureille, A.;
- El Jani, B.
- Article
28
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 137, doi. 10.1007/s10854-007-9306-5
- Reentilä, O.;
- Lankinen, A.;
- Mattila, M.;
- Säynätjoki, A.;
- Tuomi, T. O.;
- Lipsanen, H.;
- O'Reilly, L.;
- McNally, P. J.
- Article
29
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 5, p. 487, doi. 10.1007/s10854-007-9367-5
- Talbi, N.;
- Khirouni, K.;
- Sun, G. C.;
- Samic, H.;
- Bourgoin, J. C.
- Article
30
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 149, doi. 10.1007/s10854-007-9303-8
- Säynätjoki, A.;
- Lankinen, A.;
- Tuomi, T. O.;
- McNally, P. J.;
- Danilewsky, A.;
- Zhilyaev, Y.;
- Fedorov, L.
- Article
31
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 131, doi. 10.1007/s10854-007-9305-6
- Usui, Hiroyuki;
- Yasuda, Hidehiro;
- Mori, Hirotaro
- Article
32
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 125, doi. 10.1007/s10854-007-9308-3
- Article
33
- Journal of Materials Science Letters, 2003, v. 22, n. 6, p. 467, doi. 10.1023/A:1022976131428
- Kim, Seong-Il;
- Han, Il-Ki;
- Chung, Sang Wook;
- Jagadish, C.
- Article
34
- Experimental Astronomy, 2016, v. 41, n. 1/2, p. 307, doi. 10.1007/s10686-015-9490-x
- Virgilli, E.;
- Frontera, F.;
- Rosati, P.;
- Bonnini, E.;
- Buffagni, E.;
- Ferrari, C.;
- Stephen, J.;
- Caroli, E.;
- Auricchio, N.;
- Basili, A.;
- Silvestri, S.
- Article
35
- Measurement Techniques, 2022, v. 65, n. 1, p. 70, doi. 10.1007/s11018-022-02050-3
- Zenchenko, M. A.;
- Kleopin, A. V.;
- Makarov, V. V.;
- Selin, L. N.
- Article
36
- Measurement Techniques, 2021, v. 64, n. 1, p. 8, doi. 10.1007/s11018-021-01888-3
- Article
37
- Inorganic Materials, 2018, v. 54, n. 11, p. 1099, doi. 10.1134/S0020168518110146
- Tomashpolsky, Yu. Ya.;
- Matyuk, V. M.;
- Sadovskaya, N. V.
- Article
38
- Inorganic Materials, 2017, v. 53, n. 11, p. 1131, doi. 10.1134/S0020168517110176
- Yarzhemsky, V.;
- Murashov, S.;
- Izotov, A.
- Article
39
- Inorganic Materials, 2017, v. 53, n. 11, p. 1170, doi. 10.1134/S0020168517110164
- Vasil'ev, M.;
- Vasil'ev, A.;
- Kostin, Yu.;
- Shelyakin, A.;
- Izotov, A.
- Article
40
- Inorganic Materials, 2017, v. 53, n. 8, p. 781, doi. 10.1134/S0020168517080106
- Levchenko, I.;
- Stratiychuk, I.;
- Tomashyk, V.;
- Malanych, G.;
- Stanetskaya, A.
- Article
41
- Inorganic Materials, 2017, v. 53, n. 5, p. 451, doi. 10.1134/S0020168517050132
- Kostryukov, V.;
- Mittova, I.;
- Dimitrenko, A.
- Article
42
- Inorganic Materials, 2017, v. 53, n. 4, p. 397, doi. 10.1134/S0020168517040173
- Turygin, V.;
- Smirnov, M.;
- Berezkin, M.;
- Sokhadze, L.;
- Stepnova, N.;
- Tomilov, A.;
- Fedorov, V.;
- Potolokov, N.
- Article
43
- Inorganic Materials, 2016, v. 52, n. 10, p. 985, doi. 10.1134/S0020168516100046
- Boldyrevskii, P.;
- Filatov, D.;
- Kazantseva, I.;
- Smotrin, D.;
- Revin, M.
- Article
44
- Inorganic Materials, 2016, v. 52, n. 10, p. 1070, doi. 10.1134/S0020168516100162
- Stognij, A.;
- Novitskii, N.;
- Ketsko, V.;
- Sharko, S.;
- Poddubnaya, N.;
- Laletin, V.;
- Bespalov, A.;
- Golikova, O.;
- Smirnova, M.;
- Fetisov, L.;
- Titova, A.
- Article
45
- Inorganic Materials, 2015, v. 51, n. 5, p. 425, doi. 10.1134/S0020168515040056
- Kostryukov, V.;
- Mittova, I.
- Article
46
- Inorganic Materials, 2015, v. 51, n. 3, p. 197, doi. 10.1134/S0020168515020144
- Pashchenko, A.;
- Chebotarev, S.;
- Lunin, L.
- Article
47
- Inorganic Materials, 2014, v. 50, n. 9, p. 874, doi. 10.1134/S0020168514090088
- Article
48
- Inorganic Materials, 2014, v. 50, n. 9, p. 882, doi. 10.1134/S0020168514090052
- Kostryukov, V.;
- Mittova, I.;
- Shvets, V.;
- Tomina, E.;
- Sladkopevtsev, B.;
- Tret'yakov, N.
- Article
49
- Inorganic Materials, 2014, v. 50, n. 8, p. 757, doi. 10.1134/S0020168514080160
- Tomashpolsky, Yu.;
- Matyuk, V.;
- Sadovskaya, N.
- Article
50
- Inorganic Materials, 2014, v. 50, n. 3, p. 215, doi. 10.1134/S0020168514020174
- Sysoev, I.;
- Lunina, M.;
- Alfimova, D.;
- Blagin, A.;
- Gusev, D.;
- Seredin, B.
- Article