Works matching DE "FOCUSED ion beams"

Results: 1328

An Approach to Fabricate Biofibers with Spider Weblike Structures Based on Electrospinning Device.

Published in:

Arabian Journal for Science & Engineering (Springer Science & Business Media B.V. ), 2025, v. 50, n. 13, p. 9821, doi. 10.1007/s13369-024-09862-1

By:

García-Tirado, O. M.;
Pech-Rodríguez, W. J.;
Meléndez-González, P. C.;
Castillo-Robles, J. A.

Publication type:

Article

Detection of a Biomolecule, Allantoin, in Skin Tissue Using Water Gas Cluster Ion Beam Time‐Of‐Flight Secondary Ion Mass Spectrometry.

Published in:

Surface & Interface Analysis: SIA, 2025, v. 57, n. 8, p. 594, doi. 10.1002/sia.7414

By:

Aoyagi, Satoka;
Nakata, Erika;
Sano, Naoko;
Fujita, Miya;
Ueno, Tomikazu

Publication type:

Article

Thermal safety characteristics of nanoscale nitrocellulose/stabilizer composite materials.

Published in:

Cellulose, 2024, v. 31, n. 16, p. 9623, doi. 10.1007/s10570-024-06200-4

By:

Cheng, Xue-Ning;
Xu, Guo-Zhong;
Liu, Hao;
Han, Zhong-Xuan;
Li, Mi;
Jiang, Lin

Publication type:

Article

An Efficient Method for Preparing High-Quality Atom Probe Tomography Samples of Dual-Phase Ti Alloys.

Published in:

Microscopy & Microanalysis, 2025, v. 31, n. 2, p. 1, doi. 10.1093/mam/ozaf009

By:

Lu, Ruiqing;
Theska, Felix;
Lu, Shenglu;
Wang, Hao;
Qian, Ma;
Primig, Sophie;
Ringer, Simon P;
Liao, Xiaozhou

Publication type:

Article

Mass-Thickness Measurements in the Transmission Electron Microscope: A Single-Standard Approach to Quantitative EDS Analysis: Quantitative EDS in the TEM via Mass-Thickness Measurements.

Published in:

Microscopy & Microanalysis, 2025, v. 31, n. 2, p. 1, doi. 10.1093/mam/ozaf005

By:

Zega, Thomas J;
Howe, Jane Y;
Schrader, Devin L;
Sagar, James;
Pinard, Philippe;
Marks, Sam

Publication type:

Article

Quantifying Patterned Features on Material Surfaces Created using Ga Ion Beam in FIB-SEM.

Published in:

Microscopy & Microanalysis, 2025, v. 31, n. 2, p. 1, doi. 10.1093/mam/ozaf001

By:

Ghosh, Supriya;
Mkhoyan, K Andre

Publication type:

Article

In Situ Focused Ion Beam Redeposition Surface Coatings for Site-Specific, Near-Surface Characterization by Atom Probe Tomography.

Published in:

Microscopy & Microanalysis, 2025, v. 31, n. 1, p. 1, doi. 10.1093/mam/ozae126

By:

Guerguis, Bavley;
Cuduvally, Ramya;
Arcuri, Gabriel;
Pourbahari, Bita;
McDermid, Joseph R;
Pawlowicz, Chris;
Langelier, Brian;
Bassim, Nabil

Publication type:

Article

Analysis of Water Ice in Nanoporous Copper Needles Using Cryo Atom Probe Tomography.

Published in:

Microscopy & Microanalysis, 2024, v. 30, n. 6, p. 1195, doi. 10.1093/mam/ozae062

By:

Tegg, Levi;
McCarroll, Ingrid E;
Kim, Se-Ho;
Dubosq, Renelle;
Woods, Eric V;
El-Zoka, Ayman A;
Gault, Baptiste;
Cairney, Julie M

Publication type:

Article

Atom Probe Tomography Investigation of Clustering in Model P2O5-Doped Borosilicate Glasses for Nuclear Waste Vitrification.

Published in:

Microscopy & Microanalysis, 2024, v. 30, n. 6, p. 1083, doi. 10.1093/mam/ozae059

By:

Klupś, Przemyslaw;
Skerratt-Love, Katrina;
Kruger, Albert A;
George, Jaime;
Bell, Anthony Martin Thomas;
Bingham, Paul A;
Moody, Michael P;
Bagot, Paul A J

Publication type:

Article

Facilitating Atom Probe Tomography of 2D MXene Films by In Situ Sputtering.

Published in:

Microscopy & Microanalysis, 2024, v. 30, n. 6, p. 1057, doi. 10.1093/mam/ozae035

By:

Krämer, Mathias;
Favelukis, Bar;
Sokol, Maxim;
Rosen, Brian A;
Eliaz, Noam;
Kim, Se-Ho;
Gault, Baptiste

Publication type:

Article

An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy.

Published in:

Microscopy & Microanalysis, 2024, v. 30, n. 6, p. 1124, doi. 10.1093/mam/ozae015

By:

Uzuhashi, Jun;
Ohkubo, Tadakatsu;
Hono, Kazuhiro

Publication type:

Article

Rubidium and Cesium Ion-Induced Electron and Ion Signals for Scanning Ion Microscopy Applications.

Published in:

Microscopy & Microanalysis, 2024, v. 30, n. 5, p. 817, doi. 10.1093/mam/ozae087

By:

Li, Yang;
Xu, Sheng;
Loeber, Thomas H;
Vredenbregt, Edgar J D

Publication type:

Article

Light Element (C, N, O) Quantification by EDXS: Application to Meteorite Water Content and Organic Composition.

Published in:

Microscopy & Microanalysis, 2024, v. 30, n. 4, p. 660, doi. 10.1093/mam/ozae071

By:

Guillou, Corentin Le;
Zanetta, Pierre-Marie;
Leroux, Hugues;
Blanchenet, Anne-Marie;
Marinova, Maya

Publication type:

Article

Understanding the Effect of Local Grain Boundary Engineering on Solid-State Electrolytes.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.881

By:

Ogunfunmi, Tofunmi;
Peng, Xinxing;
Chu, Hyunwon;
Watt, John;
Rupp, Jennifer;
Scott, M C

Publication type:

Article

Noble Dome: A Novel Air-Free Transfer System for Scanning Electron Microscopy and Focused Ion Beam.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.876

By:

Brogden, Valerie;
Garman, Jeffrey C;
Wiemholt, Stephen;
Langworthy, Kurt A

Publication type:

Article

Damage Free 3D Characterization and TEM Sample Preparation of Beam Sensitive Materials Using Advanced Multiple Ion Source PFIB under Cryogenic Conditions.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.872

By:

Wu, Min

Publication type:

Article

Cryo-STEM and Multiscale Microscopy of Earth-Abundant Cathode Particles.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.870

By:

Jungjohann, Katherine;
King, Madison;
Dutta, Nikita;
Mangum, John;
Walker, Patrick;
Wang, Bingning;
Gannon, Renae;
Liao, Chen

Publication type:

Article

Synthesis of Star-like ZnO Nanostructures on a ZnO Lamella under Electron Beam Irradiation.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.852

By:

Cigarroa-Mayorga, Oscar E;
Hernández-Rodríguez, Y M

Publication type:

Article

Observation of As-Quenched DU-6wt%Nb Microstructure by Transmission Kikuchi Diffraction.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.851

By:

Walters, Christian;
McCabe, Rodney;
Schneider, Matthew;
Savage, Daniel;
Brown, Donald;
Garlea, Elena;
Agnew, Sean

Publication type:

Article

In Situ Ferroelectric Polarization of BaTiO3 at Low Temperatures Measured by Electron Holography.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.833

By:

Mendoza-Ramirez, M Carolina;
Shohan, Rakibul A;
Cantú-Valle, Jesus;
Moreno, Mario;
Ponce, Arturo

Publication type:

Article

Standard Calibrations and Prediction for Thermal Gradients during In Situ Transmission Electron Microscopy Heating Experiments.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.824

By:

Yang, Yi-Chieh;
Vijayan, Sriram;
Yesibolati, Murat Nulati;
Jinschek, Joerg R

Publication type:

Article

In Situ TEM Study and Control of Octahedral Units' Migration in Rutile TiO2.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.799

By:

Guo, Silu;
Ghosh, Supriya;
Nair, Sreejith;
Jalan, Bharat;
Mkhoyan, K Andre

Publication type:

Article

PFIB and STEM EBIC: A Potent Combination for Operando TEM of Electronic Devices.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.785

By:

Hubbard, William A;
Regan, B C

Publication type:

Article

Advancing In-Situ Sample Preparation for MEMS-Based Electrical and Electro-Thermal (S)TEM Characterization.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.784

By:

Srot, Vesna;
Straubinger, Rainer;
Predel, Felicitas;
Aken, Peter A van

Publication type:

Article

Impact of Oxidation Layer in the Resistive Switching Behavior of Nitride-Based Memristor Devices.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.783

By:

Zhang, Di;
Dhall, Rohan;
Song, Chengyu;
Schneider, Matt;
House, Stephen;
Kunwar, Sundar;
Dou, Hongyi;
Cuccienco, Nick;
Ciston, Jim;
Watt, John;
Kuo, Winson;
Pettes, Michael;
Wang, Haiyan;
McCabe, Rodney;
Chen, Aiping

Publication type:

Article

In Situ Switching of van der Waals Ferroelectrics with In-Plane Electric Biasing.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.782

By:

Li, Xinyan;
Shi, Chuqiao;
Mao, Nannan;
Kong, Jing;
Ramesh, Ramamoorthy;
Han, Yimo

Publication type:

Article

Towards Atomic-Scale Investigation of Resistive Switching in Memristive Systems via MEMS-based In Situ Electron Microscopy.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.781

By:

Molina-Luna, Leopoldo

Publication type:

Article

Changing the Atomic and Electronic Structures of Oxide Grain Boundaries with Non-Contacting Electric Fields.

Published in:

2024

By:

Hahn, William;
Lupini, Andrew R;
Benthem, Klaus van

Publication type:

Abstract

EELS-Monitored AC-STEM-Fabrication of Sub-Nanometer Pores and Features in Hexagonal Boron Nitride and Correlated Photoluminescence and Ionic Transport Measurements.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.762

By:

Keneipp, Rachael N;
Lin, Chih-Yuan;
Gusdorff, Jordan A;
Bhatia, Pia;
Shin, Trey T;
Bassett, Lee C;
Drndic, Marija

Publication type:

Article

How Do Bacteria Respond to Nanostructured Features of the Brass Substrate?

Published in:

2024

By:

Budniak, Karolina;
Michalicha, Anna;
Suchecki, Przemysław;
Ciemiorek-Bartkowska, Marta;
Kerber, Michael;
Setman, Daria;
Lewandowska, Malgorzata;
Belcarz, Anna;
Krawczynska, Agnieszka T

Publication type:

Abstract

Tracking Intracellular Proteins of Interest with Cryo-Electron Microscopy.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.387

By:

Grandinetti, Giovanna;
Goetz, Daniel;
Santas, Amy J;
Chinthalapudi, Krishna;
Trout, Amanda

Publication type:

Article

Easy and Efficient Cryo-FIB Workflow for Cryo-TEM Sample Preparation.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.371

By:

Shigeyama, Wataru;
Mizuno, Noriaki;
Matsushima, Hideki;
Hosogi, Naoki

Publication type:

Article

Optimizing a Pipeline for Eukaryotic Ultrastructure.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.362

By:

Pappas, Victoria;
DeCaen, Paul

Publication type:

Article

Improving Transmission Kikuchi Diffraction Workflows.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.334

By:

Larsen, Kim;
Hjelmstad, Michael

Publication type:

Article

TSEM-EDS Study of Nanoprecipitates in Oxide-Dispersion-Strengthened (ODS) 14YWT Ferritic Alloys.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.324

By:

Uz, Tugce Karakulak;
Pigott, Jeffrey S;
Ibrahim, Buhari;
Gordon, Jerard V;
Carter, Jennifer L W

Publication type:

Article

Unified Approach to Standards-Based Absolute Quantification of EDX and EEL Spectra of Nanoscale Materials in STEM and STEM-in-SEM.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.322

By:

Ritchie, Nicholas W M;
Herzing, Andrew A;
Oleshko, Vladimir P

Publication type:

Article

Deployment of Magnetic Sector Secondary Ion Mass Spectrometry Technology on Focused Ion Beam Instruments: From the Initial Concept Idea to the Analytical Add-On System.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.297

By:

Castro, Olivier De;
Hoang, Hung Quang;
Bouton, Olivier;
Barrahma, Rachid;
Coulbary, Chérif;
Wirtz, Tom

Publication type:

Article

Extraction Replication of Inert Particles in Additively Manufactured 800H Builds.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.255

By:

Jin, Qiushi;
Sanchez-Poncela, Manuel;
Hebert, Rainer;
Gatti, M Florencia;
Aindow, Mark

Publication type:

Article

SEM EDX Analysis of Sub-Micron Thin Oxide Scale on 316L Stainless Steel.

Published in:

2024

By:

Michas, Alexander;
Rivera, Felipe;
Jensen, Brian;
Vanfleet, Richard

Publication type:

Abstract

Advancements in Controlled Environment Workflows for Cryo-APT and Correlative Studies.

Published in:

2024

By:

Weiss, C;
Waszkiewicz, Oliver;
Maier, M;
Hofmaenner, T;
El-Zoka, A A;
Maier, U

Publication type:

Editorial

Correlative Microscopy Analysis for Battery Materials.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.247

By:

Trenikhina, Yulia;
Johnson, Nathan;
Kelly, Stephen T

Publication type:

Article

Understanding Ion Implantation Defect Distributions in Silicon Induced by FIB and Other Ion Sources Using Advanced STEM.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.242

By:

Jauregui, Luis J;
Campbell, Deanna M;
Titze, Michael;
Scrymgeour, David;
Lu, Ping

Publication type:

Article

Magnetic Sector SIMS Systems for FIB Platforms: New Developments, Applications, and Prospects.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.236

By:

Wirtz, T;
Castro, O De;
Hoang, H Q;
Biesemeier, A;
Eswara, S;
Audinot, J N

Publication type:

Article

Use of SEM/FIB and Machine Learning to Characterize REBCO Conductors.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.217

By:

Matos-Pimentel, Hannah;
Zha, Carina;
Bishop, Nicole;
Mao, Keyou;
Kvitkovic, Jozef;
Lu, Jun;
Levitan, Jeremy;
Abraimov, Dmytro

Publication type:

Article

Precise Measurements of Spatial Coherence and Brightness for Thermionic and Field-Emission Guns.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.155

By:

Yamasaki, Jun;
Hatanaka, Shuhei

Publication type:

Article

Investigation of Stress Corrosion Cracking in CMSX-4 Turbine Blade Alloys Using Deep Learning Assisted X-ray Microscopy and Correlative Imaging Workflow.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.135

By:

Bale, Hrishikesh;
Pelligra, Concetta;
Mosayebi, Mehdi;
Casagrande, Travis;
Bassim, Nabil;
Phaneuf, Mike;
Gray, Simon

Publication type:

Article

Atomically Resolved Secondary Electron Imaging for Bulk Materials.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.133

By:

Hwang, Sooyeon;
Wu, Lijun;
Kisslinger, Kim;
Yang, Judith;
Egerton, Ray;
Zhu, Yimei

Publication type:

Article

Spatial Mapping of Bulk Elastic Strain in De-alloyed Nanoporous Gold using Four-dimensional Scanning Transmission Electron Microscopy.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.123

By:

Zeitler, Daniel J;
Perovic, Doug D;
Newman, Roger C

Publication type:

Article

Improving Chemical Composition Measurements from Microscale to Atomic Scale with Fused Multi-Modal Microscopy.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.114

By:

Baraissov, Zhaslan;
Sun, Zeming;
Liepe, Matthias;
Muller, David

Publication type:

Article

Before Cool was Cool: Cryogenic Electron Microscopy Techniques for Materials Science.

Published in:

Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.1072

By:

Minor, Andrew M

Publication type:

Article