Silicon Nanofabrication by Atomic Force Microscopy-Based Mechanical Processing.
- Published in:
- Journal of Nanotechnology, 2014, p. 1, doi. 10.1155/2014/102404
- By:
- Publication type:
- Article
Works matching DE "FOCUSED ion beam etching"
Results: 6
1
2
Surface morphology and dislocation characteristics near the surface of 4H-SiC wafer using multi-directional scanning transmission electron microscopy.
- Published in:
- Microscopy, 2017, v. 66, n. 5, p. 337, doi. 10.1093/jmicro/dfx022
- By:
- Publication type:
- Article
3
Photonic crystals in lithium niobate by combining focussed ion beam writing and ion-beam enhanced etching.
- Published in:
- Physica Status Solidi. A: Applications & Materials Science, 2014, v. 211, n. 10, p. 2421, doi. 10.1002/pssa.201431328
- By:
- Publication type:
- Article
4
Concentric Hexagonal GaN Structures for Nanophotonics, Fabricated by Selective Vapor-Phase Epitaxy with Ion-Beam Etching.
- Published in:
- Semiconductors, 2018, v. 52, n. 7, p. 954, doi. 10.1134/S1063782618070151
- By:
- Publication type:
- Article
5
3-D ANALYSIS OF A COPPER FLIP-CHIP INTERCONNECTION USING FIB-SEM SLICE AND VIEW.
- Published in:
- Electronic Device Failure Analysis, 2016, v. 18, n. 1, p. 14, doi. 10.31399/asm.edfa.2016-1.p014
- By:
- Publication type:
- Article
6
Unique FIB Application for Mechanical Cross Sectioning.
- Published in:
- Electronic Device Failure Analysis, 2014, v. 16, n. 4, p. 44, doi. 10.31399/asm.edfa.2014-4.p044
- By:
- Publication type:
- Article