Works matching DE "FLIP-flop circuits"
1
- Electronics (2079-9292), 2022, v. 11, n. 19, p. 3237, doi. 10.3390/electronics11193237
- Nafees, Naira;
- Ahmed, Suhaib;
- Kakkar, Vipan;
- Bahar, Ali Newaz;
- Wahid, Khan A.;
- Otsuki, Akira
- Article
2
- i-Manager's Journal on Electronics Engineering, 2017, v. 7, n. 4, p. 28, doi. 10.26634/jele.7.4.13686
- KUMAR, SANDEEP;
- DESHMUKH, KHEMRAJ
- Article
3
- i-Manager's Journal on Electronics Engineering, 2014, v. 5, n. 2, p. 34
- YELLAPPA, PALAGANI;
- BHARATHKUMAR, MAREDDI;
- AZMI, SHAIK SHABANA
- Article
4
- Nature Communications, 2024, v. 15, n. 1, p. 1, doi. 10.1038/s41467-024-55142-9
- Peng, Yalin;
- Cui, Chenyang;
- Li, Lu;
- Wang, Yuchen;
- Wang, Qinqin;
- Tian, Jinpeng;
- Huang, Zhiheng;
- Huang, Biying;
- Zhang, Yangkun;
- Li, Xiuzhen;
- Tang, Jian;
- Chu, Yanbang;
- Yang, Wei;
- Shi, Dongxia;
- Du, Luojun;
- Li, Na;
- Zhang, Guangyu
- Article
5
- Cogent Engineering, 2017, v. 4, n. 1, p. 1, doi. 10.1080/23311916.2017.1349539
- Abdullah-Al-Shafi, Md.;
- Bahar, Ali Newaz;
- Ahmad, Firdous;
- Ahmed, Kawsar
- Article
6
- IETE Journal of Research, 2024, v. 70, n. 10, p. 7889, doi. 10.1080/03772063.2024.2354522
- Rajesh Krishna, G.;
- Lorenzo, Rohit
- Article
7
- Journal of Active & Passive Electronic Devices, 2018, v. 13, n. 4, p. 287
- GUPTA, SUVIGYA;
- SAXENA, NIKHIL
- Article
8
- Electronics & Electrical Engineering, 2013, v. 19, n. 6, p. 87, doi. 10.5755/j01.eee.19.6.4570
- Jurgo, M.;
- Kiela, K.;
- Navickas, R.
- Article
9
- International Journal of Fuzzy Systems, 2018, v. 20, n. 4, p. 1130, doi. 10.1007/s40815-017-0399-6
- Surdej, Łukasz;
- Gniewek, Lesław
- Article
10
- Nonlinear Dynamics, 2018, v. 92, n. 2, p. 443, doi. 10.1007/s11071-018-4067-7
- Donghai Qiu;
- Tao Li;
- Seguy, Sébastien;
- Paredes, Manuel
- Article
11
- Journal of Electronic Testing, 2024, v. 40, n. 3, p. 291, doi. 10.1007/s10836-024-06119-5
- Goudet, Esther;
- Sureau, Fabio;
- Breuil, Paul;
- Peña Treviño, Luis;
- Naviner, Lirida;
- Daveau, Jean-Marc;
- Roche, Philippe
- Article
12
- Journal of Electronic Testing, 2013, v. 29, n. 2, p. 241, doi. 10.1007/s10836-013-5363-2
- Chakraborty, Kanad;
- Kelly, James;
- Evans, Brian
- Article
13
- Journal of Electronic Testing, 2013, v. 29, n. 1, p. 103, doi. 10.1007/s10836-013-5352-5
- Sinanoglu, Ozgur;
- Agrawal, Vishwani
- Article
14
- IET Optoelectronics (Wiley-Blackwell), 2017, v. 11, n. 4, p. 148, doi. 10.1049/iet-opt.2016.0101
- Shaik, Enaul haq;
- Rangaswamy, Nakkeeran
- Article
15
- IET Optoelectronics (Wiley-Blackwell), 2017, v. 11, n. 1, p. 8, doi. 10.1049/iet-opt.2015.0106
- Singh, Simranjit;
- Kaur, Simarpreet;
- Kaur, Ramandeep;
- Kaler, Rajinder Singh
- Article
16
- Journal of Circuits, Systems & Computers, 2016, v. 25, n. 12, p. -1, doi. 10.1142/S0218126616501632
- Xia, Bingbing;
- Wu, Jun;
- Liu, Hongjin;
- Zhou, Kai;
- Miao, Zhifu
- Article
17
- Journal of Circuits, Systems & Computers, 2015, v. 24, n. 7, p. -1, doi. 10.1142/S0218126615500942
- Shen, Jizhong;
- Geng, Liang;
- Wu, Xuexiang
- Article
18
- Journal of Circuits, Systems & Computers, 2012, v. 21, n. 6, p. -1, doi. 10.1142/S0218126612400130
- KUNITAKE, YUJI;
- SATO, TOSHINORI;
- YASUURA, HIROTO;
- HAYASHIDA, TAKANORI
- Article
19
- Journal of Superconductivity & Novel Magnetism, 2013, v. 26, n. 5, p. 1595, doi. 10.1007/s10948-012-1854-0
- Article
20
- Circuits, Systems & Signal Processing, 2021, v. 40, n. 7, p. 3456, doi. 10.1007/s00034-020-01632-2
- Ghamkhari, Seyedeh Fatemeh;
- Ghaznavi-Ghoushchi, Mohammad Bagher
- Article
21
- International Journal of Structural Stability & Dynamics, 2013, v. 13, n. 6, p. -1, doi. 10.1142/S0219455413500296
- ZHANG, ZHENG;
- WU, HELONG;
- WU, HUAPING;
- HE, XIAOQIAO;
- BAO, YUMEI;
- CHAI, GUOZHONG
- Article
22
- Discrete & Continuous Dynamical Systems: Series A, 2019, v. 39, n. 6, p. 2977, doi. 10.3934/dcds.2019124
- Article
23
- Few-Body Systems, 2013, v. 54, n. 7-10, p. 1015, doi. 10.1007/s00601-012-0539-3
- Vijande, J.;
- Valcarce, A.;
- Richard, J.
- Article
24
- Journal of Multiple-Valued Logic & Soft Computing, 2013, v. 20, n. 1-2, p. 1
- BAI, XU;
- OKADA, NOBUAKI;
- KAMEYAMA, MICHITAKA
- Article
25
- Photonic Sensors, 2016, v. 6, n. 4, p. 366, doi. 10.1007/s13320-016-0353-5
- Wang, Lina;
- Wang, Yongjun;
- Wu, Chen;
- Wang, Fu
- Article
26
- International Review on Computers & Software, 2012, v. 7, n. 1, p. 246
- Jianhui Lin;
- Jindan Chen;
- Jianping Hu
- Article
27
- Optical & Quantum Electronics, 2022, v. 54, n. 6, p. 1, doi. 10.1007/s11082-022-03666-z
- Singh, Lokendra;
- Agrawal, Niteshkumar;
- Gola, Kamal Kumar;
- Saha, Chinmoy;
- Pareek, Prakash
- Article
28
- Optical & Quantum Electronics, 2015, v. 47, n. 8, p. 2843, doi. 10.1007/s11082-015-0173-7
- Article
29
- Integrated Ferroelectrics, 2012, v. 132, n. 1, p. 82, doi. 10.1080/10584587.2012.660822
- Mitchell, Cody;
- Laws, Crystal;
- MacLeod, Todd C.;
- Ho, Fat D.
- Article
30
- Integrated Ferroelectrics, 2012, v. 132, n. 1, p. 76, doi. 10.1080/10584587.2012.660821
- John, Caroline S.;
- MacLeod, Todd C.;
- Evans, Joe;
- Ho, Fat D.
- Article
31
- Active & Passive Electronic Components, 2016, p. 1, doi. 10.1155/2016/7201760
- Pham, Huyen Thanh;
- Nguyen, Thang Vu;
- Pham-Nguyen, Loan;
- Sakai, Heisuke;
- Dao, Toan Thanh
- Article
32
- 2012
- Chwastek, K.;
- Szczygłowski, J.;
- Wilczyński, W.
- Proceeding
33
- International Journal of Electronics & Telecommunications, 2017, v. 63, n. 3, p. 241, doi. 10.1515/eletel-2017-0032
- Panahifar, Ehsan;
- Hassanzadeh, Alireza
- Article
34
- International Journal of Electronics Letters, 2020, v. 8, n. 3, p. 256, doi. 10.1080/21681724.2019.1600725
- Pol, Praveen V.;
- Patil, Sanjaykumar L.
- Article
35
- Pramana: Journal of Physics, 2011, v. 77, n. 5, p. 987, doi. 10.1007/s12043-011-0199-8
- Article
36
- International Journal of Wavelets, Multiresolution & Information Processing, 2020, v. 18, n. 1, p. N.PAG, doi. 10.1142/S0219691319410091
- Nagarajan, P.;
- Kumar, N. Ashok;
- Ramana, P. Venkat
- Article
37
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 198, doi. 10.1049/el.2017.4168
- Wong, C. -H.;
- Li, Y.;
- Du, J.;
- Wang, X.;
- Chang, M. -C. F.
- Article
38
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 4, p. 200, doi. 10.1049/el.2017.4113
- Winterstein, A.;
- Nossek, J. A.
- Article
39
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 18, p. 1236, doi. 10.1049/el.2017.2415
- Jizhong Shen;
- Liang Geng;
- Fan Zhang
- Article
40
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 21, p. 1799, doi. 10.1049/el.2016.0091
- Ziyi Hao;
- Xiaoyan Xiang;
- Chen Chen;
- Jianyi Meng;
- Xiaolang Yan
- Article
41
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 14, p. 1238, doi. 10.1049/el.2015.4114
- Pyle, S. D.;
- Li, H.;
- DeMara, R. F.
- Article
42
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 12, p. 1007, doi. 10.1049/el.2016.0672
- Article
43
- Electronics Letters (Wiley-Blackwell), 2015, p. 1059, doi. 10.1049/el.2015.0653
- Article
44
- Electronics Letters (Wiley-Blackwell), 2015, v. 51, n. 1, p. 20, doi. 10.1049/el.2014.3922
- Jin-Fa Lin;
- Yin-Tsung Hwang;
- Chen-Syuan Wong;
- Ming-Hwa Sheu
- Article
45
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1557, doi. 10.1049/el.2014.3604
- Article
46
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 22, p. 1620, doi. 10.1049/el.2014.3002
- Ippolito, C. E.;
- Paranjpe, T.;
- Permeneva, D.;
- Maywar, D. N.
- Article
47
- Electronics Letters (Wiley-Blackwell), 2013, v. 49, n. 12, p. 1, doi. 10.1049/el.2012.4126
- Article
48
- Metallurgical & Mining Industry, 2015, n. 9, p. 959
- Dongmei Li;
- Jianping Hu;
- Yuejie Zhang
- Article
49
- Journal of Electrical & Computer Engineering, 2016, p. 1, doi. 10.1155/2016/8268917
- Hwang, Myeong-Eun;
- Kwon, Sungoh
- Article
50
- International Journal of Bifurcation & Chaos in Applied Sciences & Engineering, 2012, v. 22, n. 1, p. 1250011-1, doi. 10.1142/S0218127412500113
- CAMPOS-CANTÓN, E.;
- FEMAT, R.;
- BARAJAS-RAMÍREZ, J. G.;
- CAMPOS-CANTÓN, I.
- Article