Works matching DE "FLIP chip technology"
1
- Computers, Materials & Continua, 2025, v. 84, n. 1, p. 537, doi. 10.32604/cmc.2025.065330
- Hu, Ian;
- Hung, Tzu-Chun;
- Zhou, Mu-Heng;
- Lin, Heng-Sheng;
- Chen, Dao-Long
- Article
2
- Micromachines, 2025, v. 16, n. 5, p. 580, doi. 10.3390/mi16050580
- Tso, Kuang-Chih;
- Sunaga, Yoshinori;
- Nakanishi, Yuki;
- Terasawa, Yasuo;
- Haruta, Makito;
- Sasagawa, Kiyotaka;
- Ohta, Jun
- Article
3
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 20, p. 18828, doi. 10.1007/s10854-019-02239-3
- Liu, Zhiyuan;
- Ma, Haoran;
- Shang, Shengyan;
- Wang, Yunpeng;
- Li, Xiaogan;
- Ma, Haitao
- Article
4
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 15, p. 13855, doi. 10.1007/s10854-019-01790-3
- Zhang, Shuye;
- Xu, Xiangyu;
- Lin, Tiesong;
- He, Peng
- Article
5
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 14, p. 12869, doi. 10.1007/s10854-019-01648-8
- Lee, Choong-Jae;
- Jeong, Haksan;
- Jung, Kwang-Ho;
- Min, Kyung Deuk;
- Jung, Seung-Boo
- Article
6
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 2676, doi. 10.1007/s10854-017-8194-6
- Article
7
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 16, p. 12176, doi. 10.1007/s10854-017-7032-1
- El-Khawas, E.;
- El-Hosainy, H.;
- El-Daly, A.
- Article
8
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 3, p. 2206, doi. 10.1007/s10854-015-4012-1
- Li, Bo;
- Long, Quanyin;
- Duan, Dinan
- Article
9
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 9, p. 6853, doi. 10.1007/s10854-015-3301-z
- Lin, Yung-Sen;
- Lai, Jin-Chu;
- Tsai, Tzung-Han
- Article
10
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 10, p. 3925, doi. 10.1007/s10854-013-1340-x
- Zhao, N.;
- Liu, X.;
- Huang, M.;
- Ma, H.
- Article
11
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 1, p. 53, doi. 10.1007/s10854-009-9868-5
- Yamanaka, Kimihiro;
- Ooyoshi, Takafumi;
- Nejime, Takayuki
- Article
12
- Journal of Solid State Electrochemistry, 2014, v. 18, n. 11, p. 3057, doi. 10.1007/s10008-014-2488-x
- Tsyntsaru, N.;
- Kaziukaitis, G.;
- Yang, C.;
- Cesiulis, H.;
- Philipsen, H.;
- Lelis, M.;
- Celis, J.-P.
- Article
13
- Strength of Materials, 2019, v. 51, n. 6, p. 917, doi. 10.1007/s11223-020-00142-5
- Wang, W. J.;
- Long, X.;
- Du, C. Y.;
- Fu, Y. H.;
- Yao, Y.;
- Wu, Y. P.
- Article
14
- Technical Physics Letters, 2023, v. 49, p. S327, doi. 10.1134/S1063785023010200
- Kukushkin, S. A.;
- Markov, L. K.;
- Osipov, A. V.;
- Svyatets, G. V.;
- Chernyakov, A. E.;
- Pavlov, S. I.
- Article
15
- Plants (2223-7747), 2021, v. 10, n. 5, p. 833, doi. 10.3390/plants10050833
- Monaretto, Tatiana;
- Moraes, Tiago Bueno;
- Colnago, Luiz Alberto;
- Rigano, Daniela
- Article
16
- Journal of Industrial Textiles, 2022, v. 52, p. 1, doi. 10.1177/15280837221128312
- Datta, Mallika;
- Nath, Devarun;
- Das, Srijan;
- Malitha, Mainul
- Article
17
- Journal of Strategic Innovation & Sustainability, 2020, v. 15, n. 3, p. 124, doi. 10.33423/jsis.v15i3.2953
- Article
18
- Modern Physics Letters B, 2020, v. 34, n. 36, p. N.PAG, doi. 10.1142/S0217984920504138
- Liu, Yang;
- Chang, Jian;
- Zhou, Min;
- Xue, Yuxiong;
- Zeng, Xianghua;
- Sun, Fenglian
- Article
19
- AAPPS Bulletin, 2024, v. 34, p. 57, doi. 10.1007/s43673-024-00118-6
- Article
20
- Geophysical Research Letters, 2019, v. 46, n. 2, p. 889, doi. 10.1029/2018GL081275
- Tian, Feng;
- Zhang, Rong‐Hua;
- Wang, Xiujun
- Article
21
- Optical & Quantum Electronics, 2022, v. 54, n. 2, p. 1, doi. 10.1007/s11082-021-03466-x
- Zhang, Rongrong;
- Wen, Zuojie;
- Li, Bingqian;
- Liang, Shenghua;
- Yang, Mingde;
- Xia, Zhenghao
- Article
22
- Optical & Quantum Electronics, 2021, v. 53, n. 4, p. 1, doi. 10.1007/s11082-021-02840-z
- Mondal, Ramit Kumar;
- Pandey, Vipul;
- Chatterjee, Vijay;
- Pal, Suchandan
- Article
23
- Optical & Quantum Electronics, 2019, v. 51, n. 9, p. N.PAG, doi. 10.1007/s11082-019-2021-7
- Meng, Qingduan;
- Zhang, Xiaoling;
- Lü, Yanqiu;
- Si, Junjie
- Article
24
- Optical & Quantum Electronics, 2019, v. 51, n. 8, p. N.PAG, doi. 10.1007/s11082-019-1975-9
- Zhang, Liwen;
- Li, Yang;
- Zhang, Jincan;
- Liu, Min;
- Lei, Zhen;
- Meng, Qingduan
- Article
25
- Journal of Electronic Testing, 2019, v. 35, n. 6, p. 779, doi. 10.1007/s10836-019-05840-w
- Palchaudhuri, Ayan;
- Dhar, Anindya Sundar
- Article
26
- International Journal of RF & Microwave Computer-Aided Engineering, 2001, v. 11, n. 4, p. 202, doi. 10.1002/mmce.1025
- Ghouz, Hussein H. M.;
- El-Sharawy, El-Badawy
- Article
27
- International Journal of Advanced Manufacturing Technology, 2022, v. 121, n. 7/8, p. 4325, doi. 10.1007/s00170-022-09724-w
- Lee, Jing Rou;
- Aziz, Mohd Sharizal Abdul;
- Ishak, Mohammad Hafifi Hafiz;
- Khor, Chu Yee
- Article
28
- International Journal of Advanced Manufacturing Technology, 2022, v. 121, n. 3/4, p. 2005, doi. 10.1007/s00170-022-09477-6
- Article
29
- Computational Mechanics, 2005, v. 35, n. 5, p. 332, doi. 10.1007/s00466-004-0620-y
- Article
30
- Communications Physics, 2022, v. 5, n. 1, p. 1, doi. 10.1038/s42005-022-01035-6
- Zellekens, Patrick;
- Deacon, Russell S.;
- Perla, Pujitha;
- Grützmacher, Detlev;
- Lepsa, Mihail Ion;
- Schäpers, Thomas;
- Ishibashi, Koji
- Article
31
- Engineering Optimization, 2002, v. 34, n. 6, p. 591, doi. 10.1080/03052150215718
- Liu, D.S.;
- Ni, C.Y.;
- Tsay, T.C.;
- Kao, C.Y.
- Article
32
- Optics & Spectroscopy, 2024, v. 132, n. 2, p. 200, doi. 10.1134/S0030400X2402019X
- Zakgeim, A. L.;
- Klimov, A. A.;
- Lukhmyrina, T. S.;
- Matveev, B. A.;
- Chernyakov, A. E.
- Article
33
- Intel Technology Journal, 2014, v. 18, n. 3, p. 118
- Meyer, Thorsten;
- Albers, Sven;
- Geissler, Christian;
- Ofner, Gerald;
- Reingruber, Klaus;
- Seidemann, Georg;
- Wolter, Andreas
- Article
34
- Photonics, 2022, v. 9, n. 7, p. N.PAG, doi. 10.3390/photonics9070495
- Zhang, Yujia;
- Wang, Xuanhao;
- Li, Zhengkai;
- Lyu, Weiqiang;
- Lyu, Yanjia;
- Zeng, Cheng;
- Zhang, Zhiyao;
- Zhang, Shangjian;
- Zhang, Yali;
- Li, Heping;
- Xia, Jinsong;
- Liu, Yong
- Article
35
- Photonics, 2021, v. 8, n. 6, p. 196, doi. 10.3390/photonics8060196
- Hsu, Tsung-Chi;
- Teng, Yu-Tsai;
- Yeh, Yen-Wei;
- Fan, Xiaotong;
- Chu, Kuo-Hsiung;
- Lin, Su-Hui;
- Yeh, Kuo-Kuang;
- Lee, Po-Tsung;
- Lin, Yue;
- Chen, Zhong;
- Wu, Tingzhu;
- Kuo, Hao-Chung
- Article
36
- Photonics, 2021, v. 8, n. 4, p. 88, doi. 10.3390/photonics8040088
- Zhang, Xingfei;
- Li, Yan;
- Li, Zhicong;
- Miao, Zhenlin;
- Liang, Meng;
- Zhang, Yiyun;
- Yi, Xiaoyan;
- Wang, Guohong;
- Li, Jinmin
- Article
37
- Photonics, 2018, v. 5, n. 4, p. 41, doi. 10.3390/photonics5040041
- Bulashevich, Kirill A.;
- Konoplev, Sergey S.;
- Karpov, Sergey Yu.
- Article
38
- Scientific Reports, 2022, v. 12, n. 1, p. 1, doi. 10.1038/s41598-022-13776-z
- Wan, Yang;
- Zhou, Longzao;
- Wu, Fengshun
- Article
39
- Scientific Reports, 2022, v. 12, n. 1, p. 1, doi. 10.1038/s41598-022-04876-x
- Khan, M. Ajmal;
- Maeda, Noritoshi;
- Yun, Joosun;
- Jo, Masafumi;
- Yamada, Yoichi;
- Hirayama, Hideki
- Article
40
- Geofluids, 2021, v. 2021, p. 1, doi. 10.1155/2021/6561152
- Bi, Zuoqing;
- Liang, Han;
- Hui, Qianjia
- Article
41
- Nature Communications, 2021, v. 12, n. 1, p. 1, doi. 10.1038/s41467-021-25095-4
- Zhou, Gang;
- Wang, Peifang;
- Li, Hao;
- Hu, Bin;
- Sun, Yan;
- Huang, Rong;
- Liu, Lizhe
- Article
42
- International Journal of Remote Sensing, 2022, v. 43, n. 18, p. 6581, doi. 10.1080/01431161.2022.2132123
- Wang, Ying;
- Deng, Chuanqi;
- Zuo, Fang
- Article
43
- Welding International, 2011, v. 25, n. 11, p. 844, doi. 10.1080/09507116.2011.590654
- Ikeda, Toru;
- Kanno, Toshifumi;
- Shishido, Nobuyuki;
- Miyazaki, Noriyuki;
- Tanaka, Hiroyuki;
- Hatao, Takuya
- Article
44
- Semiconductors, 2019, v. 53, n. 2, p. 139, doi. 10.1134/S1063782619020131
- Karandashev, S. A.;
- Matveev, B. A.;
- Remennyi, M. A.
- Article
45
- Semiconductors, 2017, v. 51, n. 2, p. 260, doi. 10.1134/S1063782617020269
- Zakgeim, A.;
- Il'inskaya, N.;
- Karandashev, S.;
- Lavrov, A.;
- Matveev, B.;
- Remennyy, M.;
- Stus', N.;
- Usikova, A.;
- Cherniakov, A.
- Article
46
- Semiconductors, 2013, v. 47, n. 3, p. 409, doi. 10.1134/S1063782613030160
- Markov, L.;
- Smirnova, I.;
- Pavlyuchenko, A.;
- Kukushkin, M.;
- Vasil'eva, E.;
- Chernyakov, A.;
- Usikov, A.
- Article
47
- Semiconductors, 2006, v. 40, n. 6, p. 697, doi. 10.1134/S1063782606060169
- Zotova, N. V.;
- Il'inskaya, N. D.;
- Karandashev, S. A.;
- Matveev, B. A.;
- Remennyi, M. A.;
- Stus', N. M.
- Article
48
- Journal of Electronic Materials, 2024, v. 53, n. 3, p. 1201, doi. 10.1007/s11664-023-10855-3
- Lee, Jing Rou;
- Abdul Aziz, Mohd Sharizal;
- Khor, Chu Yee;
- Ishak, Mohammad Hafifi Hafiz;
- Kamarudin, Roslan;
- Ani, F. Che
- Article
49
- Journal of Electronic Materials, 2024, v. 53, n. 3, p. 1169, doi. 10.1007/s11664-023-10782-3
- Lee, Jing Rou;
- Chong, Mun Xi;
- Abdul Aziz, Mohd Sharizal;
- Khor, Chu Yee;
- Mohd Salleh, Mohd Arif Anuar;
- Mohd Arif Zainol, Mohd Remy Rozainy;
- Ani, F. Che
- Article
50
- Journal of Electronic Materials, 2023, v. 52, n. 6, p. 3786, doi. 10.1007/s11664-023-10340-x
- Njoku, Jude E.;
- Amalu, Emeka H.;
- Ekere, Ndy;
- Mallik, Sabuj;
- Ekpu, Mathias;
- Ogbodo, Eugene A.
- Article