Works matching DE "FIELD programmable gate arrays testing"
1
- Journal of Electronic Testing, 2016, v. 32, n. 6, p. 749, doi. 10.1007/s10836-016-5622-0
- Ruan, Aiwu;
- Huang, Haiyang;
- Wang, Jingwu;
- Zhao, Yifan
- Article
2
- Journal of Electronic Testing, 2015, v. 31, n. 2, p. 207, doi. 10.1007/s10836-015-5515-7
- Pereira, Igor;
- Dias, Leonardo;
- Souza, Cleonilson
- Article
3
- Journal of Electronic Testing, 2014, v. 30, n. 6, p. 739, doi. 10.1007/s10836-014-5489-x
- Omidi Gosheblagh, Reza;
- Mohammadi, Karim
- Article
4
- Multimedia Tools & Applications, 2018, v. 77, n. 10, p. 11669, doi. 10.1007/s11042-017-4811-x
- Ramalingam, Balakrishnan;
- Ravichandran, Dhivya;
- Annadurai, Arun Adhithiya;
- Rengarajan, Amirtharajan;
- Rayappan, John Bosco Balaguru
- Article
5
- Security & Communication Networks, 2018, p. 1, doi. 10.1155/2018/5650205
- Fu, Wenwen;
- Li, Tao;
- Sun, Zhigang
- Article
