Works matching DE "FIELD ion microscopes"
1
- Instrumentation Science & Technology, 2006, v. 34, n. 5, p. 547, doi. 10.1080/10739140600809702
- He, Yulin;
- Zhang, Dongxian;
- Zhang, Haijun
- Article
2
- Philosophical Magazine Letters, 2018, v. 98, n. 7, p. 310, doi. 10.1080/09500839.2018.1542171
- Mazilova, T. I.;
- Sadanov, E. V.;
- Mikhailovskij, I. M.
- Article
3
- Journal of Metamorphic Geology, 2017, v. 35, n. 2, p. 231, doi. 10.1111/jmg.12230
- Quinn, R. J.;
- Kitajima, K.;
- Nakashima, D.;
- Spicuzza, M. J.;
- Valley, J. W.
- Article
4
- Analytical & Bioanalytical Chemistry, 2012, v. 404, n. 1, p. 277, doi. 10.1007/s00216-012-6110-8
- Lo Giudice, Alessandro;
- Re, Alessandro;
- Angelici, Debora;
- Calusi, Silvia;
- Gelli, Nicla;
- Giuntini, Lorenzo;
- Massi, Mirko;
- Pratesi, Giovanni
- Article
5
- Metallurgical & Materials Transactions. Part A, 2004, v. 35, n. 4, p. 1263, doi. 10.1007/s11661-004-0300-8
- Zhang, C.;
- Enomoto, M.;
- Yamashita, T.;
- Sano, N.
- Article
6
- Doklady Earth Sciences, 2010, v. 430, n. 1, p. 15, doi. 10.1134/S1028334X10010034
- Smirnov, V. N.;
- Ivanov, K. S.
- Article
7
- Technical Physics Letters, 2012, v. 38, n. 2, p. 132, doi. 10.1134/S1063785012020095
- Kotrechko, S.;
- Mazilov, A.;
- Mazilova, T.;
- Sadanov, E.;
- Mikhailovskij, I.
- Article
8
- Technical Physics Letters, 2007, v. 33, n. 7, p. 567, doi. 10.1134/S1063785007070085
- Shakirova, S. A.;
- Bayo, I.
- Article
9
- American Mineralogist, 2011, v. 96, n. 7, p. 1039, doi. 10.2138/am.2011.3669
- WITHERS, A. C.;
- HIRSCHMANN, M. M.;
- TENNER, T. J.
- Article
10
- Advanced Materials & Processes, 2009, v. 167, n. 5, p. 22
- Article
11
- Advanced Materials & Processes, 2007, v. 165, n. 10, p. 12
- Article
12
- History of Science, 2009, v. 47, n. 2, p. 117, doi. 10.1177/007327530904700201
- Article
13
- Canadian Journal of Earth Sciences, 2011, v. 48, n. 2, p. 389
- Tucker, R. D.;
- Roig, J.-Y.;
- Delor, C.;
- Amelin, Y.;
- Goncalves, P.;
- Rabarimanana, M. H.;
- Ralison, A. V.;
- Belcher, R. W.
- Article
14
- Canadian Journal of Earth Sciences, 2002, v. 39, n. 6, p. 999, doi. 10.1139/e02-016
- Schneider, D A;
- Bickford, M E;
- Cannon, W F;
- Schulz, K J;
- Hamilton, M A
- Article
15
- Technometrics, 1974, v. 16, n. 4, p. 483, doi. 10.1080/00401706.1974.10489229
- Johnson, Charles A.;
- Klotz, Jerome H.
- Article
16
- 2012
- Pickard, D.S.;
- Viswanathan, V.;
- Fang, C.;
- Ai, Z.;
- Hao, H.;
- Wang, Y.;
- Bosman, M.;
- Dorfmüller, J.;
- Giessen, H.
- Abstract
17
- Microscopy & Microanalysis, 2012, v. 18, n. 2, p. 359, doi. 10.1017/S1431927611012530
- Felfer, Peter J.;
- Gault, Baptiste;
- Sha, Gang;
- Stephenson, Leigh;
- Ringer, Simon P.;
- Cairney, Julie M.
- Article
18
- 2010
- Smentkowski, Vincent S.;
- Potyrailo, Radislav A.;
- Scipioni, Larry;
- Ferranti, David
- Abstract
19
- Contributions to Mineralogy & Petrology, 2000, v. 139, n. 3, p. 298, doi. 10.1007/s004100000133
- Article
20
- Surface Review & Letters, 2008, v. 15, n. 5, p. 557, doi. 10.1142/S0218625X08011767
- AZHAZHA, V. M.;
- NEKLYUDOV, I. M.;
- KSENOFONTOV, V. A.;
- MAZILOVA, T. I.;
- MIKHAILOVSKIJ, I. M.;
- SADANOV, E. V.;
- MAZILOV, A. A.
- Article
21
- Journal of Microscopy, 1999, v. 196, n. 2, p. 146, doi. 10.1046/j.1365-2818.1999.00631.x
- Article