Works matching DE "FIELD evaporation"
Results: 12
Ab-Initio Simulation of Field Evaporation in Atom Probe Tomography: Enhanced Zone Lines and Mixed-Layer Reconstructed Structures.
- Published in:
- 2023
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- Publication type:
- Abstract
Beyond Atom Mapping in Atom Probe Tomography Using Field Evaporation Energy Loss Spectroscopy.
- Published in:
- 2023
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- Publication type:
- Abstract
FIELD EVAPORATION OF GROUNDED ARSENIC DOPED SILICON CLUSTERS.
- Published in:
- Surface Review & Letters, 2015, v. 22, n. 6, p. -1, doi. 10.1142/S0218625X15500699
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- Article
Correlating spatial, temporal and chemical information in atom probe data: new insights from multiple evaporation in microalloyed steels.
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- Philosophical Magazine Letters, 2013, v. 93, n. 5, p. 299, doi. 10.1080/09500839.2013.771823
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- Article
A quantitative model of preferential evaporation and retention for atom probe tomography.
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- Surface & Interface Analysis: SIA, 2014, v. 46, n. 8, p. 535, doi. 10.1002/sia.5555
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- Article
Track-membrane-based interface for field evaporation of ions from polar solutions in the diffusion-drift regime.
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- Technical Physics, 2013, v. 58, n. 11, p. 1675, doi. 10.1134/S1063784213110042
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- Article
High-temperature field evaporation and its connection with surface ionization.
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- Technical Physics, 2013, v. 58, n. 6, p. 787, doi. 10.1134/S1063784213060133
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- Article
Field evaporation and atom probe tomography of pure water tips.
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- Scientific Reports, 2020, v. 10, n. 1, p. 1, doi. 10.1038/s41598-020-77130-x
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- Article
Possible observation of the isotope effect during field evaporation.
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- Technical Physics Letters, 2016, v. 42, n. 1, p. 108, doi. 10.1134/S1063785016010235
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- Article
Alternate field evaporation by changing laser pulsing and voltage pulsing dynamically for atom probe analysis.
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- Surface & Interface Analysis: SIA, 2019, v. 51, n. 1, p. 105, doi. 10.1002/sia.6559
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- Publication type:
- Article
Observation of DC field‐evaporated ion species extracted from transition metal nitride thin film deposited on tungsten‐tip.
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- Surface & Interface Analysis: SIA, 2019, v. 51, n. 1, p. 61, doi. 10.1002/sia.6548
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- Article
Atomic level analysis of carbon fibers by the scanning atom probe.
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- Surface & Interface Analysis: SIA, 2014, v. 46, n. 12/13, p. 1231, doi. 10.1002/sia.5695
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- Publication type:
- Article