Works matching DE "FIELD emission cathodes"
1
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 12, p. 1281, doi. 10.1007/s10854-010-0063-5
- Zhixian Lin;
- Yun Ye;
- Yongai Zhang;
- Tailiang Guo
- Article
2
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 134, doi. 10.1007/s10854-007-9466-3
- Poelman, Dirk;
- Van Haecke, Jo E.;
- Smet, Philippe F.
- Article
3
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 1, p. 17, doi. 10.1007/s10854-007-9265-x
- Darsono, Nono;
- Sung-Wook Kwon;
- Dang-Hyok Yoon;
- Jaemyung Kim;
- Moon, Heesung;
- Park, Seoung-Uk
- Article
4
- Journal of Solid State Electrochemistry, 2017, v. 21, n. 11, p. 3189, doi. 10.1007/s10008-017-3662-8
- Zhang, Jun;
- Luo, Shaohua;
- Wang, Qing;
- Wang, Zhiyuan;
- Zhang, Yahui;
- Hao, Aimin;
- Liu, Yanguo;
- Xu, Qian;
- Zhai, Yuchun
- Article
5
- SID Symposium Digest of Technical Papers, 2012, v. 43, n. 1, p. 1333, doi. 10.1002/j.2168-0159.2012.tb06049.x
- Khorami, Alireza;
- Ghanbari, Shirin;
- Mohajerzadeh, Shamsedin
- Article
6
- Optica Applicata, 2011, v. 41, n. 2, p. 289
- CZERWOSZ, ELŻBIETA;
- KOWALSKA, EWA;
- KOZŁOWSKI, MIROSŁAW;
- RYMARCZYK, JOANNA
- Article
7
- e-Polymers, 2017, v. 17, n. 3, p. 243, doi. 10.1515/epoly-2016-0088
- Weidong Han;
- Bin Ding;
- Mira Park;
- Fuhai Cui;
- Su-Hyeong Chae;
- Hak-Yong Kim
- Article
8
- Instruments & Experimental Techniques, 2016, v. 59, n. 5, p. 703, doi. 10.1134/S0020441216040138
- Sokolov, A.;
- Konovalov, P.
- Article
9
- Instruments & Experimental Techniques, 2012, v. 55, n. 6, p. 629, doi. 10.1134/S0020441212060048
- Chudakov, A.;
- Lubsandorzhiev, B.;
- Poleshchuk, V.
- Article
10
- Applied Physics A: Materials Science & Processing, 2005, v. 80, n. 7, p. 1573, doi. 10.1007/s00339-004-2957-7
- Chen, D.H.;
- Li, Z.Y.;
- Wei, A.X.
- Article
11
- Applied Physics A: Materials Science & Processing, 2001, v. 73, n. 4, p. 409, doi. 10.1007/s003390100923
- Sveningsson, M.;
- Morjan, R.-E.;
- Nerushev, O.A.;
- Sato, Y.;
- Bäckström, J.;
- Campbell, E.E.B.;
- Rohmund, F.
- Article
12
- Semiconductors, 2015, v. 49, n. 13, p. 1731, doi. 10.1134/S1063782615130072
- Galperin, V.;
- Kitsyuk, E.;
- Pavlov, A.;
- Shamanaev, A.
- Article
13
- Semiconductors, 2015, v. 49, n. 9, p. 1242, doi. 10.1134/S1063782615090146
- Konakova, R.;
- Okhrimenko, O.;
- Svetlichnyi, A.;
- Ageev, O.;
- Volkov, E.;
- Kolomiytsev, A.;
- Jityaev, I.;
- Spiridonov, O.
- Article
14
- Semiconductors, 2012, v. 46, n. 13, p. 1553, doi. 10.1134/S1063782612130118
- Korneev, V.;
- Popkov, A.;
- Demin, G.;
- Mazurkin, N.;
- Chinenkov, M.
- Article
15
- Semiconductors, 2012, v. 46, n. 13, p. 1598, doi. 10.1134/S1063782612130088
- Dmitriev, A.;
- Cherednichenko, D.
- Article
16
- Semiconductors, 2009, v. 43, n. 4, p. 463, doi. 10.1134/S1063782609040101
- Gerchikov, L. G.;
- Mamaev, Yu. A.;
- Yashin, Yu. P.;
- Vasiliev, D. A.;
- Kuz'michev, V. V.;
- Ustinov, V. M.;
- Zhukov, A. E.;
- Vasiliev, A. P.;
- Mikhrin, V. S.
- Article
17
- Chemistry - A European Journal, 2014, v. 20, n. 35, p. 11029, doi. 10.1002/chem.201402585
- Kothe, Tim;
- Pöller, Sascha;
- Zhao, Fangyuan;
- Fortgang, Philippe;
- Rögner, Matthias;
- Schuhmann, Wolfgang;
- Plumeré, Nicolas
- Article
18
- Technical Physics, 2018, v. 63, n. 3, p. 452, doi. 10.1134/S1063784218030040
- Burtsev, A. A.;
- Grigor’ev, Yu. A.;
- Danilushkin, A. V.;
- Navrotskii, I. A.;
- Pavlov, A. A.;
- Shumikhin, K. V.
- Article
19
- Technical Physics, 2016, v. 61, n. 11, p. 1747, doi. 10.1134/S1063784216110189
- Pleshkova, L.;
- Shesterkin, V.
- Article
20
- Technical Physics, 2016, v. 61, n. 2, p. 290, doi. 10.1134/S1063784216020080
- Bushuev, N.;
- Glukhova, O.;
- Grigor'ev, Yu.;
- Ivanov, D.;
- Kolesnikova, A.;
- Nikolaev, A.;
- Shalaev, P.;
- Shesterkin, V.
- Article
21
- Technical Physics, 2016, v. 61, n. 1, p. 149, doi. 10.1134/S1063784216010114
- Glukhova, O.;
- Kolesnikova, A.;
- Slepchenkov, M.
- Article
22
- Technical Physics, 2013, v. 58, n. 10, p. 1512, doi. 10.1134/S1063784213100058
- Bocharov, G.;
- Eletskii, A.
- Article
23
- Technical Physics, 2013, v. 58, n. 9, p. 1358, doi. 10.1134/S1063784213090065
- Barengolts, Yu.;
- Beril, S.
- Article
24
- Technical Physics, 2012, v. 57, n. 7, p. 1008, doi. 10.1134/S1063784212070055
- Bocharov, G.;
- Eletskii, A.
- Article
25
- Technical Physics, 2012, v. 57, n. 2, p. 251, doi. 10.1134/S1063784212020168
- Lyashenko, S.;
- Volkov, A.;
- Obraztsov, A.
- Article
26
- Technical Physics, 2011, v. 56, n. 4, p. 540, doi. 10.1134/S1063784211040086
- Bocharov, G.;
- Eletskii, A.;
- Sommerer, T.
- Article
27
- Technical Physics, 2007, v. 52, n. 5, p. 621, doi. 10.1134/S1063784207050143
- Furman, É.;
- Stepanov, A.;
- Furman, N.
- Article
28
- Technical Physics, 2005, v. 50, n. 10, p. 1360, doi. 10.1134/1.2103286
- Dzbanovskiı, N. N.;
- Minakov, P. V.;
- Pilevskiı, A. A.;
- Rakhimov, A. T.;
- Seleznev, B. V.;
- Suetin, N. V.;
- Yur'ev, A. Yu.
- Article
29
- Technical Physics, 2004, v. 49, n. 5, p. 623, doi. 10.1134/1.1758340
- Pshenichnyuk, S. A.;
- Yumaguzin, Yu. M.
- Article
30
- Technical Physics, 2002, v. 47, n. 12, p. 1580, doi. 10.1134/1.1529951
- Dovbnya, A. N.;
- Zakutin, V. V.;
- Reshetnyak, N. G.;
- Romas’ko, V. P.;
- Volkolupov, Yu. Ya.;
- Krasnogolovets, M. A.
- Article
31
- Technical Physics, 2001, v. 46, n. 6, p. 736, doi. 10.1134/1.1379644
- Bobkov, A. F.;
- Davydov, E. V.;
- Zaıtsev, S. V.;
- Karpov, A. V.;
- Kozodaev, M. A.;
- Nikolaeva, I. N.;
- Popov, M. O.;
- Skorokhodov, E. N.;
- Suvorov, A. L.;
- Cheblukov, Yu. N.
- Article
32
- Applied Physics A: Materials Science & Processing, 2013, v. 110, n. 1, p. 99, doi. 10.1007/s00339-012-7376-6
- Sanborn, Graham;
- Turano, Stephan;
- Collins, Peter;
- Ready, W.
- Article
33
- Applied Physics A: Materials Science & Processing, 2012, v. 108, n. 4, p. 943, doi. 10.1007/s00339-012-7003-6
- Zhang, Qiuhong;
- Wang, Jing
- Article
34
- BioScience, 1980, v. 30, n. 9, p. 586, doi. 10.2307/1308108
- Reynolds, G. T.;
- Taylor, D. L.
- Article
35
- Critical Reviews in Solid State & Materials Science, 2006, v. 31, n. 3, p. 55, doi. 10.1080/10408430600930438
- Randolph, S. J.;
- Fowlkes, J. D.;
- Rack, P. D.
- Article
36
- Laser & Particle Beams, 2013, v. 31, n. 1, p. 45, doi. 10.1017/S026303461200095X
- Roy, Amitava;
- Menon, R.;
- Sharma, Vishnu;
- Patel, Ankur;
- Sharma, Archana;
- Chakravarthy, D.P.
- Article
37
- Laser & Particle Beams, 2003, v. 21, n. 4, p. 561, doi. 10.1017/s0263034603214142
- S.YA. BELOMYTTSEV;
- A.A. GRISHKOV;
- S.D. KOROVIN
- Article
38
- Electronics & Communications in Japan, 2010, v. 93, n. 6, p. 41, doi. 10.1002/ecj.10201
- Article
39
- Surface Review & Letters, 2007, v. 14, n. 5, p. 969, doi. 10.1142/S0218625X07010391
- CHEN, T.;
- SUN, Z.;
- WANG, L. L.;
- CHEN, Y. W.;
- GUO, P. S.;
- QUE, W. X.
- Article
40
- Nature Photonics, 2008, v. 2, n. 9, p. 555, doi. 10.1038/nphoton.2008.134
- Shintake, Tsumoru;
- Tanaka, Hitoshi;
- Hara, Toru;
- Tanaka, Takashi;
- Togawa, Kazuaki;
- Yabashi, Makina;
- Otake, Yuji;
- Asano, Yoshihiro;
- Bizen, Teruhiko;
- Fukui, Toru;
- Goto, Shunji;
- Higashiya, Atsushi;
- Hirono, Toko;
- Hosoda, Naoyasu;
- Inagaki, Takahiro;
- Inoue, Shinobu;
- Ishii, Miho;
- Kim, Yujong;
- Kimura, Hiroaki;
- Kitamura, Masanobu
- Article
41
- Nature Photonics, 2007, v. 1, n. 5, p. 273, doi. 10.1038/nphoton.2007.64
- Article
42
- Microscopy & Microanalysis, 2012, v. 18, n. S5, p. 105, doi. 10.1017/S1431927612013189
- Santos, N. F.;
- Rodrigues, J.;
- Nico, C.;
- Fernandes, A. J. S.;
- Costa, F. M.;
- Monteiro, T.
- Article
43
- 2011
- Wade, T;
- Wittig, J;
- Davidson, J;
- Kang, W;
- Tolk, N;
- Allard, L
- Abstract
44
- Technical Physics Letters, 2016, v. 42, n. 5, p. 509, doi. 10.1134/S1063785016050175
- Aban'shin, N.;
- Avetisyan, Yu.;
- Akchurin, G.;
- Loginov, A.;
- Morev, S.;
- Mosiyash, D.;
- Yakunin, A.
- Article
45
- Technical Physics Letters, 2010, v. 36, n. 1, p. 19, doi. 10.1134/S1063785010010074
- Il'ichev, É. A.;
- Kuleshov, A. E.;
- Poltoratskiĭ, É. A.;
- Rychkov, G. S.
- Article
46
- Technical Physics Letters, 2010, v. 36, n. 1, p. 23, doi. 10.1134/S1063785010010086
- Krivchenko, V. A.;
- Pilevskii, A. A.;
- Rakhimov, A. T.;
- Suetin, N. V.;
- Timofeev, M. A.
- Article
47
- Technical Physics Letters, 2006, v. 32, n. 1, p. 18, doi. 10.1134/S1063785006010068
- Mesyats, G.;
- Korovin, S.;
- Sharypov, K.;
- Shpak, V.;
- Shunailov, S.;
- Yalandin, M.
- Article
48
- Journal of Plasma Physics, 2015, v. 81, n. 3, p. N.PAG, doi. 10.1017/S0022377815000252
- Kurkin, S. A.;
- Koronovskii, A. A.;
- Hramov, A. E.
- Article
49
- Journal of Plasma Physics, 2009, v. 75, n. 5, p. 581, doi. 10.1017/S0022377809990080
- Shukla, P. K.;
- Morfill, G. E.
- Article
50
- European Physical Journal - Applied Physics, 2013, v. 62, n. 2, p. 00, doi. 10.1051/epjap/2013120298
- Article